RTAX2000S-1CQ352V vs RTAX1000SL-CQ352V موازنہ
تفصیلی ساتھ ساتھ موازنہ از RTAX2000S-1CQ352V بذریعہ Microchip Technology اور RTAX1000SL-CQ352V بذریعہ Microchip Technology. اہم خصوصیات، برقی پیرامیٹرز، پیکیجنگ، لائف سائیکل اسٹیٹس، قیمتوں اور دستیابی کا موازنہ کریں تاکہ آپ کی ڈیزائن ضروریات کے لیے بہترین کمپوننٹ کا تعین ہو سکے۔
Microchip Technology
RTAX2000S-1CQ352V - 2M-Gate Rad-Tolerant FPGA | Microchip
RTAX2000S-1CQ352V ✓ فعالMicrochip Technology
RTAX1000SL-CQ352V - 1M-Gate Rad-Tolerant FPGA | Microchip
RTAX1000SL-CQ352V ✓ فعالخصوصیات کا موازنہ
| پیرامیٹر | RTAX2000S-1CQ352V | RTAX1000SL-CQ352V |
|---|---|---|
| برانڈ | Microchip Technology | Microchip Technology |
| زمرہ | FPGA & CPLD | FPGA & CPLD |
| لائف سائیکل کی حالت | فعال | فعال |
| Equivalent System Gates | 2,000,000 gates | 1,000,000 |
| Logic Cells | 32,256 cells | 18,144 |
| Configurable Logic Blocks (CLBs) | 21,504 CLBs | — |
| Process Technology | Digital CMOS | 0.15 um CMOS |
| Speed Grade | -1 | — |
| Family | RTAX-S/SL Radiation-Tolerant FPGAs | RTAX-SL (RTAX-S/SL Radiation-Tolerant FPGAs) |
| پیکیج | CQ352 ceramic QFP, 352 pins | 352-pin Ceramic CQFP (CQ352V) |
| ماؤنٹنگ ٹائپ | Surface Mount | Surface Mount |
| Configuration | Live at power-up, single-chip | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Core Voltage | [DATA_NEEDED: core voltage] | 1.5 V |
| I/O Voltage | [DATA_NEEDED: I/O voltage] | [DATA_NEEDED: I/O bank voltage range] |
| آپریٹنگ درجہ حرارت | [DATA_NEEDED: operating temperature range] | [DATA_NEEDED: operating temperature range] |
| Radiation Tolerance (TID) | [DATA_NEEDED: TID rating] | — |
| MSL لیول | [DATA_NEEDED: moisture sensitivity level] | [DATA_NEEDED: moisture sensitivity level] |
| RoHS اسٹیٹس | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS compliance status] |
| CLBs (Logic Modules) | — | 12,096 |
| Maximum Toggle Frequency | — | 581 MHz |
| Programming Technology | — | Antifuse (one-time programmable) |
| Radiation Tolerance | — | Radiation-tolerant, space-flight qualified family |
| Power-Up Behavior | — | Live at power-up (non-volatile) |
| Configuration Upset Immunity | — | No SEU in configuration memory (antifuse) |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID rating in krad (Si)] |
| Estimated Equivalent Gates per CLB | — | [DATA_NEEDED: gates-per-CLB ratio] |