RTAX4000D-1CQ352B vs RTAX4000SL-CQ352B مقارنة
مقارنة تفصيلية جنبًا إلى جنب لـ RTAX4000D-1CQ352B بواسطة Microchip Technology و RTAX4000SL-CQ352B بواسطة Microchip Technology. قارن المواصفات الرئيسية والمعلمات الكهربائية والتغليف وحالة دورة الحياة والأسعار والتوافر لتحديد أفضل مكوّن لمتطلبات تصميمك.
Microchip Technology
RTAX4000D-1CQ352B - 4M-Gate Rad-Tolerant FPGA 1.5V | Microchip
RTAX4000D-1CQ352B ✓ نشطMicrochip Technology
RTAX4000SL-CQ352B - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-CQ352B ✓ نشطمقارنة المواصفات
| المعامل | RTAX4000D-1CQ352B | RTAX4000SL-CQ352B |
|---|---|---|
| العلامة التجارية | Microchip Technology | Microchip Technology |
| الفئة | FPGA & CPLD | FPGA & CPLD |
| حالة دورة الحياة | نشط | نشط |
| Family | RTAX-DSP Radiation-Tolerant FPGA | RTAX-SL (Radiation-Tolerant FPGAs) |
| Equivalent System Gates | 4000000 gates | 4,000,000 |
| Logic Cells | 55440 cells | 40,320 |
| Configurable Logic Blocks (CLBs) | 36960 CLBs | — |
| Core Supply Voltage (Nominal) | 1.5 V | — |
| Core Supply Voltage Range | 1.425 V to 1.575 V | — |
| Combinatorial CLB Delay (Max) | 0.99 ns | — |
| Process Technology | 0.15 um CMOS | 0.15 um |
| Programmability Type | Antifuse (OTP), live at power-up | — |
| Speed Grade | -1 | — |
| العلبة | 352-pin Ceramic CQFP (CQ352) | 352-Pin CQFP |
| نوع التركيب | Surface Mount | Surface Mount |
| Technology | CMOS, Digital | — |
| Radiation Tolerance | Radiation-tolerant (space flight) | Radiation-tolerant (space flight qualified family) |
| Embedded SRAM | Yes (with built-in FIFO control logic) | — |
| Operating Temperature Bin | B | — |
| حالة RoHS | unknown | [DATA_NEEDED: RoHS Status] |
| Core Voltage | — | 1.5 V |
| Packaging / Shipping | — | Box |
| Programmable Type | — | FPGA |
| Embedded Memory | — | Embedded SRAM with built-in FIFO control logic |
| Clock Resources | — | Segmentable clocks, chip-wide highway routing |
| Arithmetic Support | — | Carry logic |
| درجة حرارة التشغيل | — | [DATA_NEEDED: Operating Temperature] |
| I/O Voltage | — | [DATA_NEEDED: I/O Voltage] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID Rating] |
| Single Event Latch-up Threshold | — | [DATA_NEEDED: SEL LET Threshold] |