RTAX4000D-1CQ352B vs RTAX4000SL-CQ352B तुलना
विस्तृत दोनों ओर की तुलना RTAX4000D-1CQ352B द्वारा Microchip Technology और RTAX4000SL-CQ352B द्वारा Microchip Technology. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Microchip Technology
RTAX4000D-1CQ352B - 4M-Gate Rad-Tolerant FPGA 1.5V | Microchip
RTAX4000D-1CQ352B ✓ सक्रियMicrochip Technology
RTAX4000SL-CQ352B - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-CQ352B ✓ सक्रियविशेषता तुलना
| पैरामीटर | RTAX4000D-1CQ352B | RTAX4000SL-CQ352B |
|---|---|---|
| ब्रांड | Microchip Technology | Microchip Technology |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Family | RTAX-DSP Radiation-Tolerant FPGA | RTAX-SL (Radiation-Tolerant FPGAs) |
| Equivalent System Gates | 4000000 gates | 4,000,000 |
| Logic Cells | 55440 cells | 40,320 |
| Configurable Logic Blocks (CLBs) | 36960 CLBs | — |
| Core Supply Voltage (Nominal) | 1.5 V | — |
| Core Supply Voltage Range | 1.425 V to 1.575 V | — |
| Combinatorial CLB Delay (Max) | 0.99 ns | — |
| Process Technology | 0.15 um CMOS | 0.15 um |
| Programmability Type | Antifuse (OTP), live at power-up | — |
| Speed Grade | -1 | — |
| पैकेज | 352-pin Ceramic CQFP (CQ352) | 352-Pin CQFP |
| माउंटिंग प्रकार | Surface Mount | Surface Mount |
| Technology | CMOS, Digital | — |
| Radiation Tolerance | Radiation-tolerant (space flight) | Radiation-tolerant (space flight qualified family) |
| Embedded SRAM | Yes (with built-in FIFO control logic) | — |
| Operating Temperature Bin | B | — |
| RoHS स्थिति | unknown | [DATA_NEEDED: RoHS Status] |
| Core Voltage | — | 1.5 V |
| Packaging / Shipping | — | Box |
| Programmable Type | — | FPGA |
| Embedded Memory | — | Embedded SRAM with built-in FIFO control logic |
| Clock Resources | — | Segmentable clocks, chip-wide highway routing |
| Arithmetic Support | — | Carry logic |
| ऑपरेटिंग तापमान | — | [DATA_NEEDED: Operating Temperature] |
| I/O Voltage | — | [DATA_NEEDED: I/O Voltage] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID Rating] |
| Single Event Latch-up Threshold | — | [DATA_NEEDED: SEL LET Threshold] |