EPM3064ATC44-10NAF vs EPM3064ATC44-7N Comparison

Detailed side-by-side comparison of EPM3064ATC44-10NAF by Altera and EPM3064ATC44-7N by Altera. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.

Altera
EPM3064ATC44-10NAF

EPM3064ATC44-10NAF - 64-Macrocell MAX 3000A CPLD, 10ns TQFP-44 | Intel

EPM3064ATC44-10NAF Nrnd
Altera
EPM3064ATC44-7N

EPM3064ATC44-7N - MAX 3000A CPLD, 64 Macro, 34 I/O, 7.5ns | Altera

EPM3064ATC44-7N Obsolete

Specification Comparison

Parameter EPM3064ATC44-10NAF EPM3064ATC44-7N
Brand Altera Altera
Category FPGA & CPLD FPGA & CPLD
Lifecycle Status Nrnd Obsolete
Stock Status In Stock In Stock
Unit Price (USD) $5.05 $2.30
Series MAX 3000A β€”
Device Type CPLD (Complex Programmable Logic Device) CPLD (Complex Programmable Logic Device)
Macro Cells 64 64
Logic Elements / LABs 4 LABs (16 macrocells per LAB) β€”
Usable Gates 1250 1,250
Number of I/O Pins 34 β€”
Propagation Delay (tPD, max) 10 ns β€”
Supply Voltage (VCCINT) 3.0 V to 3.6 V β€”
I/O Voltage Tolerance Multi-voltage (3.3 V / 2.5 V / 1.8 V capable) β€”
Programmable Technology EEPROM (non-volatile) β€”
In-System Programmable Yes (IEEE Std. 1532 compliant) β€”
Boundary-Scan Test Yes (IEEE Std. 1149.1 JTAG) β€”
Pin-Locking Yes β€”
Package TQFP-44 (10x10 mm) 44-pin TQFP
Mounting Type Surface Mount Surface Mount
Operating Temperature [DATA_NEEDED: industrial/commercial grade] 0Β°C to +85Β°C (commercial)
Lead Finish Lead-free (NiPdAu, AF suffix) β€”
RoHS Status Compliant Compliant
Configuration Memory Cycles 100 erase/program cycles β€”
Family β€” MAX 3000A
Logic Array Blocks β€” 2
User I/O Pins β€” 34
Number of Pins β€” 44
Speed Grade β€” -7 (7.5 ns pin-to-pin delay)
Pin-to-Pin Delay (tPD) β€” 7.5 ns
Maximum Counter Frequency β€” 192.3 MHz (-7 grade)
Supply Voltage (VCC) β€” 3.3 V
MultiVolt I/O β€” 1.8 V / 2.5 V / 3.3 V
Programmability β€” EEPROM, in-system programmable (ISP)
JTAG Interface β€” IEEE Std. 1149.1 compliant
ISP Standard β€” IEEE Std. 1532 compliant
Boundary-Scan Test (BST) β€” Built-in, JTAG-driven

Datasheets & Resources

Browse All Products Create BOM Request Quote