EPM9560RC240-15C vs EPM9560RC240-15N Comparison
Detailed side-by-side comparison of EPM9560RC240-15C by Intel and EPM9560RC240-15N by Altera. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Specification Comparison
| Parameter | EPM9560RC240-15C | EPM9560RC240-15N |
|---|---|---|
| Brand | Intel | Altera |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Obsolete | Nrnd |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $0.00 | $27.85 |
| Family | MAX 9000 | MAX 9000 (third-generation Multiple Array MatriX) |
| Device Type | EEPROM-based CPLD | β |
| Usable Gates | 12,000 | 12,000 |
| Macrocells | 560 | 560 |
| Logic Array Blocks | 20 | β |
| User I/O Pins | 187 | β |
| Maximum Internal Frequency | 117.6 MHz | β |
| Propagation Delay (tPD) | 15 ns | β |
| Supply Voltage | 5.0 V | 5.0 V |
| Operating Voltage Range | 3.3 V or 5 V | β |
| Package | 240-pin RQFP (PowerQuad II) | RQFP-240 (240-pin Plastic Quad Flat Pack) |
| Terminal Pitch | 0.5 mm | β |
| Mounting Type | Surface Mount | Surface Mount |
| Operating Temperature | 0C to +70C (Commercial) | 0C to +70C (Commercial) |
| Configuration Technology | EEPROM (non-volatile) | β |
| In-System Programmability | Yes (ISP via JTAG) | β |
| JTAG Interface | IEEE 1149.1 boundary-scan | β |
| Process Technology | CMOS | β |
| RoHS Status | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS compliance - older Altera RQFP part] |
| MSL Level | [DATA_NEEDED: MSL level] | β |
| Series | β | MAX 9000 |
| Logic Array Blocks (LABs) | β | 35 |
| Maximum User I/O Pins | β | 216 |
| Pin-to-Pin Propagation Delay (tPD) | β | 15 ns |
| Internal Counter Frequency (fCNT) | β | 145 MHz |
| Global Setup Time (tFSU) | β | [DATA_NEEDED: tFSU for -15 grade] |
| Clock-to-Output Time (tFCO) | β | [DATA_NEEDED: tFCO for -15 grade] |
| Logic Family | β | CMOS (EEPROM-based) |
| Programmability | β | In-system programmable (IEEE 1532/JTAG) |
| Boundary-Scan Test | β | JTAG (IEEE 1149.1) |