AD677JN vs AD677AD Vergleich
Detaillierter Direktvergleich von AD677JN von Analog Devices und AD677AD von Analog Devices. Vergleichen Sie die wichtigsten Spezifikationen, elektrischen Parameter, Gehäuse, Lebenszyklusstatus, Preise und Verfügbarkeit, um das beste Bauteil für Ihre Designanforderungen zu ermitteln.
Analog Devices
AD677JN - 16-Bit 100 kSPS Serial ADC | Analog Devices
AD677JN ⚠ Letzte BestellmöglichkeitAnalog Devices
AD677AD - 16-Bit 100 kSPS Serial ADC | Analog Devices
AD677AD ⚠ Letzte BestellmöglichkeitSpezifikationsvergleich
| Parameter | AD677JN | AD677AD |
|---|---|---|
| Marke | Analog Devices | Analog Devices |
| Kategorie | ADC/DAC | ADC/DAC |
| Lebenszyklusstatus | Letzte Kaufgelegenheit | Letzte Kaufgelegenheit |
| Auflösung | 16 bit | 16 bit |
| Conversion Rate | 100 kSPS | — |
| Total Conversion Time | 10 µs | 10 us |
| Ausgangstyp | Serial output | Serial |
| Architecture | Switched-capacitor / charge-redistribution ADC | — |
| Sample-and-Hold | On-chip sample-and-hold function | — |
| Missing Codes | No missing codes | — |
| Full-Power Bandwidth | 1 MHz | — |
| Total Harmonic Distortion | -99 dB | — |
| Signal-to-Noise Plus Distortion | 92 dB | — |
| Analog Supply | +5 V and +12 V | — |
| Digital Supply | VDD supply; exact operating value [DATA_NEEDED: VDD operating voltage range] | — |
| Typical Power Consumption, 10 V Reference | 450 mW during conversion | — |
| Typical Power Consumption, 5 V Reference | 360 mW during conversion | — |
| Ground Sensing | Remote analog-ground sense | — |
| Autocalibration | On-chip autocalibration | — |
| Gehäuse | 16-pin narrow plastic DIP | 16-lead ceramic DIP (CDIP) |
| Montageart | Through-hole | Through-hole |
| Betriebstemperaturbereich | [DATA_NEEDED: operating temperature range] | [DATA_NEEDED: Operating temperature range] |
| RoHS-Status | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| REACH Status | [DATA_NEEDED: REACH status] | [DATA_NEEDED: REACH status] |
| Abtastrate | — | 100 kSPS |
| Input Count | — | 1 analog input |
| ADC Architecture | — | Successive-approximation-register (SAR) |
| Internal Architecture | — | Switched-capacitor charge redistribution |
| Calibration | — | On-chip autocalibration with digital nonlinearity correction |
| Eingangsspannungsbereich | — | [DATA_NEEDED: Input voltage range] |
| Referenzspannung | — | [DATA_NEEDED: External reference voltage] |
| Analog Input Type | — | [DATA_NEEDED: Unipolar or bipolar input configuration] |
| Integral Nonlinearity | — | [DATA_NEEDED: Integral nonlinearity] |
| SNR | — | [DATA_NEEDED: Signal-to-noise ratio] |
| Effective Number of Bits | — | [DATA_NEEDED: Effective number of bits] |
| Input Impedance | — | [DATA_NEEDED: Input impedance] |
| Input Sampling Capacitance | — | [DATA_NEEDED: Input sampling capacitance] |
| Digital Interface Levels | — | [DATA_NEEDED: Digital logic input and output levels] |
| Serial Clock Frequency | — | [DATA_NEEDED: Maximum serial clock frequency] |
| Supply Voltage Range | — | [DATA_NEEDED: Supply voltage range] |
| Power Consumption | — | [DATA_NEEDED: Typical and maximum power consumption] |
| Package Dimensions | — | [DATA_NEEDED: Ceramic DIP package dimensions] |
| Lead-Free Status | — | [DATA_NEEDED: Lead-free status] |
| AEC-Q100 Qualification | — | [DATA_NEEDED: AEC-Q100 qualification] |