CGD65B130SH2 vs CGD65B130S2 Vergleich
Detaillierter Direktvergleich von CGD65B130SH2 von Cambridge GaN Devices und CGD65B130S2 von Cambridge GaN Devices. Vergleichen Sie die wichtigsten Spezifikationen, elektrischen Parameter, Gehäuse, Lebenszyklusstatus, Preise und Verfügbarkeit, um das beste Bauteil für Ihre Designanforderungen zu ermitteln.
Spezifikationsvergleich
| Parameter | CGD65B130SH2 | CGD65B130S2 |
|---|---|---|
| Marke | Cambridge GaN Devices | Cambridge GaN Devices |
| Kategorie | MOSFETs | MOSFETs |
| Lebenszyklusstatus | Aktiv | Aktiv |
| Lagerstatus | In Stock | In Stock |
| Stückpreis (USD) | $1,74 | $2,10 |
| Manufacturer | Cambridge GaN Devices | Cambridge GaN Devices |
| Part Number | CGD65B130SH2 | — |
| Transistortyp | N-Channel GaN HEMT (Enhancement Mode) | GaN HEMT (enhancement mode, N-channel) |
| Drain-Source Voltage (VDS) | 650 V | 650 V |
| Continuous Drain Current (ID) at 25°C | 12 A | — |
| On-Resistance RDS(on) (typical, per product page) | 55 mΩ | — |
| On-Resistance RDS(on) (max at 900 mA / 12 V) | 182 mΩ | — |
| On-Resistance Range (datasheet) | 130 to 350 mΩ | — |
| Gate Threshold Voltage VGS(th) | 2.2 V to 4.2 V | — |
| Total Gate Charge Qg | 1.9 nC | — |
| Technology | GaN-on-silicon (ICeGaN®) | — |
| Integrated Features | ICeGaN® gate, Current Sense, NL³ protection circuit | — |
| Gehäuse | 8-DFN (5x6 mm), Surface Mount | 8-DFN 5x6 mm with exposed thermal pad |
| Montageart | Surface Mount | Surface Mount |
| Operating Mode | Enhancement-mode (normally-off) | — |
| Compliance / RoHS | Compliant (per DigiKey listing) | — |
| On-Resistance (RDS(on)) | — | 130 mΩ (typical) |
| Continuous Drain Current (ID) | — | 12 A |
| Gate Technology | — | ICeGaN™ (standard-driver compatible) |
| Reverse Recovery Charge (Qrr) | — | 0 nC (zero) |
| Betriebstemperatur | — | -55 °C to +150 °C (junction) |
| Gate Charge (Qg) | — | [DATA_NEEDED: Qg total gate charge at VGS=10V] |
| Input Capacitance (Ciss) | — | [DATA_NEEDED: input capacitance] |
| Output Capacitance (Coss) | — | [DATA_NEEDED: output capacitance] |
| Rise Time / Fall Time | — | Sub-nanosecond (per datasheet typical application) |
| MSL-Level | — | MSL 1 (per JEDEC J-STD-020) |
| RoHS-Status | — | Compliant |
| Substrate Technology | — | GaN-on-silicon |