EPM3256AFC256-7 vs EPM3256ATC144-7 Comparación
Comparación detallada lado a lado de EPM3256AFC256-7 por Altera y EPM3256ATC144-7 por Altera. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.
Comparación de especificaciones
| Parámetro | EPM3256AFC256-7 | EPM3256ATC144-7 |
|---|---|---|
| Marca | Altera | Altera |
| Categoría | FPGA & CPLD | FPGA & CPLD |
| Estado del ciclo de vida | Obsolete | Obsolete |
| Estado del stock | In Stock | In Stock |
| Precio unitario (USD) | $12,10 | $17,06 |
| Family | MAX 3000A | MAX 3000A |
| Device Type | CPLD (Complex Programmable Logic Device) | — |
| Macro Cells | 256 | — |
| Logic Array Blocks (LABs) | 16 | — |
| Usable Gates | 10,000 | — |
| User I/Os | 161 | 116 |
| Pin-to-Pin Logic Delay | 4.5 ns (max) | — |
| Counter Frequency | 227.3 MHz (max) | — |
| Propagation Delay (tpd) | 10 ns | — |
| Core Voltage | 3.3 V | — |
| I/O Compatibility | 5.0 V / 3.3 V / 2.5 V (MultiVolt I/O) | — |
| Process Technology | CMOS EEPROM, 0.30 µm | — |
| In-System Programmability | IEEE Std. 1532-compliant 3.3-V ISP | — |
| Boundary-Scan Test | JTAG (IEEE 1149.1) | — |
| Encapsulado | FBGA-256 (FineLine BGA), 256 balls | TQFP-144 (LFQFP, gull-wing) |
| Temperatura de funcionamiento | 0 °C to 70 °C (Commercial) | 0C to +70C (Commercial) |
| Speed Grade | -7 | -7 |
| Estado RoHS | [DATA_NEEDED: RoHS compliance status] | — |
| Macrocells | — | 256 |
| Logic Elements / Gates | — | 600 to 10,000 usable gates |
| Propagation Delay (tPD) | — | 7.5 ns |
| Counter Frequency (fCNT) | — | 227.3 MHz |
| Supply Voltage - Core (VCCINT) | — | 3.3 V |
| Supply Voltage - I/O (VCCIO) | — | 2.5 V / 3.3 V / 5.0 V |
| In-System Programming | — | IEEE Std. 1532 compliant, 3.3 V ISP |
| Recuento de pines | — | 144 |
| Tipo de montaje | — | Surface Mount |
| PCI Compliance | — | PCI Local Bus Specification Revision 2.2 (speed grades -4 to -10) |
| JTAG Support | — | IEEE Std. 1149.1 boundary-scan |