EPM9560RI208-20 vs EPM9560R1208-20 Comparación
Comparación detallada lado a lado de EPM9560RI208-20 por Intel y EPM9560R1208-20 por Altera. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.
Comparación de especificaciones
| Parámetro | EPM9560RI208-20 | EPM9560R1208-20 |
|---|---|---|
| Marca | Intel | Altera |
| Categoría | FPGA & CPLD | FPGA & CPLD |
| Estado del ciclo de vida | NRND | Obsolete |
| Estado del stock | In Stock | In Stock |
| Precio unitario (USD) | $21,10 | $22,40 |
| Family | MAX 9000 | MAX 9000 |
| Device Type | CPLD (Complex Programmable Logic Device) | CPLD (Complex Programmable Logic Device) |
| Architecture | Multiple Array MatriX (MAX) - third generation | Multiple Array MatriX (MAX) with Logic Array Blocks (LABs) and Programmable Interconnect Array (PIA) |
| Usable Gates | 12,000 | 6,000 |
| Macro Cells | 560 | — |
| Logic Array Blocks (LABs) | 16 | — |
| Maximum User I/O Pins | 212 | — |
| Pin-to-Pin Propagation Delay (tPD) | 20 ns | — |
| Counter Frequency (fCNT) | 100 MHz | — |
| Supply Voltage (VCC) | 5.0 V | — |
| Process Technology | CMOS EEPROM | CMOS EEPROM, third-generation MAX architecture |
| In-System Programmability | Yes (IEEE Std. 1149.1 JTAG) | Yes (IEEE 1149.1 JTAG) |
| Encapsulado | 208-pin RQFP (Power-Quad Flat Pack) 28x28 mm | R-1208 (BGA-style fine-pitch) |
| Temperatura de funcionamiento | [DATA_NEEDED: operating temperature range grade] | 0C to +70C (commercial) |
| Estado RoHS | [DATA_NEEDED: RoHS compliance status] | [DATA_NEEDED: confirm via current distributor data] |
| Tipo de montaje | Surface Mount | Surface Mount |
| Macrocells | — | 560 |
| Logic Array Blocks | — | 52 (typical for 560 macrocells) |
| Maximum User I/O | — | 212 |
| Propagation Delay (tPD) | — | 20 ns |
| Maximum Frequency (fMAX) | — | 125 MHz |
| Supply Voltage (VCCINT/VCCIO) | — | 5.0 V |
| Technology | — | CMOS EEPROM |
| Boundary-Scan Test | — | JTAG IEEE Std. 1149.1 |
| Configuration Memory | — | On-chip EEPROM (non-volatile) |