EP1K100FC484-3N vs EP1K100FI484-2N Comparaison
Comparaison détaillée côte à côte de EP1K100FC484-3N par Intel et EP1K100FI484-2N par Intel. Comparez les spécifications clés, les paramètres électriques, le conditionnement, le statut de cycle de vie, les prix et la disponibilité pour déterminer le meilleur composant pour vos exigences de conception.
Comparaison des spécifications
| Paramètre | EP1K100FC484-3N | EP1K100FI484-2N |
|---|---|---|
| Marque | Intel | Intel |
| Catégorie | FPGA & CPLD | FPGA & CPLD |
| Statut du cycle de vie | Dernier achat | Obsolete |
| Statut du stock | In Stock | In Stock |
| Prix unitaire (USD) | $65,10 | $65,00 |
| Family | ACEX 1K | — |
| Logic Elements | 4,992 | — |
| Typical Gate Count | 100,000 gates | — |
| Logic Array Blocks (LABs) | 624 | — |
| Embedded Array Blocks (EABs) | 12 | — |
| Total RAM Bits | 49,152 | 49,152 |
| User I/Os | 333 | — |
| Operating Voltage (VCCINT) | 2.5 V | — |
| Process Technology | 0.22 µm CMOS | — |
| Internal Operating Frequency | up to 200 MHz | — |
| Speed Grade | -3 | -2 |
| Boîtier | 484-ball FBGA | — |
| Type de montage | Surface Mount | Surface Mount |
| Configuration Method | Passive Serial, JTAG, PPA | SRAM - Serial / JTAG |
| I/O Standards Supported | LVTTL, LVCMOS, PCI, 2.5V/3.3V/5V multiVolt I/O | — |
| Operating Temperature (Commercial) | 0 °C to +70 °C | — |
| Boundary-Scan Test | IEEE 1149.1 (JTAG) | — |
| Statut RoHS | [DATA_NEEDED: RoHS status] | non_compliant (contains lead, BGA) |
| Series | — | ACEX-1K |
| Manufacturer | — | Intel (formerly Altera) |
| Logic Elements / Cells | — | 4,992 |
| Number of Gates | — | 257,000 (typical 100,000) |
| Number of Logic Array Blocks (LABs) | — | 624 |
| Number of I/O | — | 333 |
| Number of Embedded Array Blocks (EABs) | — | 12 |
| Supply Voltage - Core (VCCINT) | — | 2.375 V to 2.625 V (2.5 V nominal) |
| Température de fonctionnement | — | -40C to +85C (Industrial) |
| Boîtier / Format | — | 484-FBGA (FineLine BGA, 23 mm x 23 mm) |
| Supplier Device Package | — | 484-FBGA |