EP1K100FC484-3N vs EP1K100FI484-2N 对比
详细并排对比 EP1K100FC484-3N 出自 Intel 和 EP1K100FI484-2N 出自 Intel。对比关键规格、电气参数、封装、生命周期状态、价格和供货情况，以确定最适合您设计需求的元器件。
规格对比
| 参数 | EP1K100FC484-3N | EP1K100FI484-2N |
|---|---|---|
| 品牌 | Intel | Intel |
| 分类 | FPGA & CPLD | FPGA & CPLD |
| 生命周期状态 | 最后采购期 | Obsolete |
| 库存状态 | 有库存 | 有库存 |
| 单价（USD） | $65.10 | $65.00 |
| Family | ACEX 1K | — |
| Logic Elements | 4,992 | — |
| Typical Gate Count | 100,000 gates | — |
| Logic Array Blocks (LABs) | 624 | — |
| Embedded Array Blocks (EABs) | 12 | — |
| Total RAM Bits | 49,152 | 49,152 |
| User I/Os | 333 | — |
| Operating Voltage (VCCINT) | 2.5 V | — |
| Process Technology | 0.22 µm CMOS | — |
| Internal Operating Frequency | up to 200 MHz | — |
| Speed Grade | -3 | -2 |
| 封装 | 484-ball FBGA | — |
| 安装类型 | Surface Mount | Surface Mount |
| Configuration Method | Passive Serial, JTAG, PPA | SRAM - Serial / JTAG |
| I/O Standards Supported | LVTTL, LVCMOS, PCI, 2.5V/3.3V/5V multiVolt I/O | — |
| Operating Temperature (Commercial) | 0 °C to +70 °C | — |
| Boundary-Scan Test | IEEE 1149.1 (JTAG) | — |
| RoHS 状态 | [DATA_NEEDED: RoHS status] | non_compliant (contains lead, BGA) |
| Series | — | ACEX-1K |
| Manufacturer | — | Intel (formerly Altera) |
| Logic Elements / Cells | — | 4,992 |
| Number of Gates | — | 257,000 (typical 100,000) |
| Number of Logic Array Blocks (LABs) | — | 624 |
| Number of I/O | — | 333 |
| Number of Embedded Array Blocks (EABs) | — | 12 |
| Supply Voltage - Core (VCCINT) | — | 2.375 V to 2.625 V (2.5 V nominal) |
| 工作温度 | — | -40C to +85C (Industrial) |
| 封装 / 外壳 | — | 484-FBGA (FineLine BGA, 23 mm x 23 mm) |
| Supplier Device Package | — | 484-FBGA |