EP910ILC-15N vs EP910ILI-25 Comparaison
Comparaison détaillée côte à côte de EP910ILC-15N par Altera et EP910ILI-25 par Altera. Comparez les spécifications clés, les paramètres électriques, le conditionnement, le statut de cycle de vie, les prix et la disponibilité pour déterminer le meilleur composant pour vos exigences de conception.
Altera
EP910ILC-15N - 450 Gate 24-Macrocell Classic CPLD, 15ns, 5V, 44-PLCC | Altera
EP910ILC-15N ObsoleteComparaison des spécifications
| Paramètre | EP910ILC-15N | EP910ILI-25 |
|---|---|---|
| Marque | Altera | Altera |
| Catégorie | FPGA & CPLD | FPGA & CPLD |
| Statut du cycle de vie | Obsolete | Obsolete |
| Statut du stock | In Stock | In Stock |
| Prix unitaire (USD) | $9,85 | $7,25 |
| Family | Classic | — |
| Product Type | CPLD (Complex Programmable Logic Device) | EPLD (Erasable Programmable Logic Device) |
| Logic Gates | 450 | — |
| Macro Cells | 24 | — |
| Maximum Propagation Delay (tPD) | 15 ns | — |
| Maximum Operating Frequency | 66.6 MHz | — |
| Supply Voltage (VCC) | 4.75 V to 5.25 V (5 V nominal) | — |
| User I/O Pins | 36 | — |
| Dedicated Input Pins | 16 | — |
| Boîtier | PLCC-44 (J-lead, surface mount) | PLCC-44 (windowed ceramic, J-lead) |
| Type de montage | Surface Mount | — |
| Température de fonctionnement | 0 C to +70 C (commercial) | -40C to +85C (Industrial) |
| Process Technology | CMOS EPROM (one-time programmable) | — |
| JTAG Support | IEEE 1149.1 boundary-scan | — |
| Statut RoHS | Compliant | Non-compliant (windowed ceramic package) |
| Programming | EPROM / JTAG (Classic EP-series) | — |
| Series | — | EP910 (Classic EPLD) |
| Macrocells | — | 24 |
| Dedicated Inputs | — | 12 |
| I/O Pins | — | 24 |
| Product Terms | — | 240 (maximum) |
| Propagation Delay (tPD) | — | 25 ns |
| Technology | — | CMOS, EPROM |
| Architecture | — | PAL-type with global interconnect bus |
| Operating Voltage | — | 5 V (4.75 V to 5.25 V) |
| Programming Method | — | UV-erasable (windowed), MAX+PLUS II programmer |
| Logic Test Circuitry | — | On-board JTAG-compatible test |