EPM9560GC280-20 vs EPM9560R1208-20 Comparaison
Comparaison détaillée côte à côte de EPM9560GC280-20 par Altera et EPM9560R1208-20 par Altera. Comparez les spécifications clés, les paramètres électriques, le conditionnement, le statut de cycle de vie, les prix et la disponibilité pour déterminer le meilleur composant pour vos exigences de conception.
Comparaison des spécifications
| Paramètre | EPM9560GC280-20 | EPM9560R1208-20 |
|---|---|---|
| Marque | Altera | Altera |
| Catégorie | FPGA & CPLD | FPGA & CPLD |
| Statut du cycle de vie | Obsolete | Obsolete |
| Statut du stock | In Stock | In Stock |
| Prix unitaire (USD) | $360,00 | $22,40 |
| Family | MAX 9000 | MAX 9000 |
| Device Type | CPLD (Complex Programmable Logic Device) | CPLD (Complex Programmable Logic Device) |
| Usable Gates | 12,000 | 6,000 |
| Macrocells | 560 | 560 |
| Maximum User I/O | 212 | 212 |
| Pin-to-Pin Delay | 20 ns (speed grade -20) | — |
| Counter Frequency (max) | 100 MHz | — |
| Supply Voltage (VCCINT) | 4.75 V to 5.25 V (5.0 V nominal) | — |
| I/O Voltage | 3.3 V or 5.0 V configurable | — |
| Process Technology | CMOS EEPROM | CMOS EEPROM, third-generation MAX architecture |
| Boîtier | 280-pin CPGA (Ceramic Pin Grid Array) | R-1208 (BGA-style fine-pitch) |
| Température de fonctionnement | [DATA_NEEDED: commercial/industrial/military grade] | 0C to +70C (commercial) |
| In-System Programming | Yes, via IEEE 1149.1 JTAG | — |
| Type de montage | Through-Hole (CPGA socket) | Surface Mount |
| Statut RoHS | [DATA_NEEDED: CPGA package historically contains Pb; likely non-compliant] | [DATA_NEEDED: confirm via current distributor data] |
| Logic Array Blocks | — | 52 (typical for 560 macrocells) |
| Propagation Delay (tPD) | — | 20 ns |
| Maximum Frequency (fMAX) | — | 125 MHz |
| Supply Voltage (VCCINT/VCCIO) | — | 5.0 V |
| Technology | — | CMOS EEPROM |
| In-System Programmability | — | Yes (IEEE 1149.1 JTAG) |
| Architecture | — | Multiple Array MatriX (MAX) with Logic Array Blocks (LABs) and Programmable Interconnect Array (PIA) |
| Boundary-Scan Test | — | JTAG IEEE Std. 1149.1 |
| Configuration Memory | — | On-chip EEPROM (non-volatile) |