EP1K30QC208-1 vs EP1K30QC208-3 तुलना
विस्तृत दोनों ओर की तुलना EP1K30QC208-1 द्वारा Intel और EP1K30QC208-3 द्वारा Intel. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
विशेषता तुलना
| पैरामीटर | EP1K30QC208-1 | EP1K30QC208-3 |
|---|---|---|
| ब्रांड | Intel | Intel |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | Obsolete | अंतिम बार खरीदें |
| Device Family | ACEX-1K | — |
| Logic Elements (LEs) | 1,728 | — |
| Equivalent Gates | 30,000 | — |
| Logic Array Blocks (LABs) | 216 | — |
| Embedded Memory (EAB) | 24,576 bits | — |
| Maximum User I/O | 147 | 147 |
| Core Supply Voltage (VCCINT) | 2.5 V (2.375 V to 2.625 V) | — |
| पैकेज | 208-BFQFP (Plastic Quad Flat Pack, PQFP208) | 208-pin PQFP (Plastic Quad Flat Pack) |
| Terminal Pitch | 0.500 mm | — |
| माउंटिंग प्रकार | Surface Mount (gull-wing leads) | Surface Mount |
| ऑपरेटिंग तापमान | 0 °C to +70 °C (commercial) | 0C to +70C (commercial) |
| Maximum Operating Frequency | up to 250 MHz (family typical) | — |
| Process Technology | 2.5 V CMOS | SRAM-based LUT, 0.18 um |
| Configuration Method | SRAM, in-system reconfigurable (volatile) | — |
| Boundary-Scan Test | JTAG IEEE 1149.1 | — |
| I/O Voltage Support | 2.5 V / 3.3 V (multi-volt I/O) | — |
| Configuration Device Support | EPC2, EPC4, EPC8 Enhanced Configuration Devices | — |
| RoHS स्थिति | Compliant (lead-free) | [DATA_NEEDED: RoHS compliance status] |
| Family | — | ACEX-1K |
| Logic Elements | — | 1,728 |
| Typical Gates | — | 30,000 |
| Maximum System Gates | — | 119,000 |
| Embedded Array Blocks (EABs) | — | 6 |
| Total RAM Bits | — | 24,576 |
| Core Voltage | — | 2.5 V |
| Speed Grade | — | -3 |
| I/O Standards Supported | — | LVTTL, LVCMOS, PCI |
| Programming Interface | — | IEEE 1149.1 JTAG, ByteBlaster |
| Lead-Free | — | [DATA_NEEDED: lead-free status] |