EP1K30QC208-1 vs EP1K30QC208-3 비교
다음의 상세 나란히 비교: EP1K30QC208-1 제조: Intel 및 EP1K30QC208-3 제조: Intel. 주요 사양, 전기적 파라미터, 패키징, 수명 주기 상태, 가격 및 재고를 비교하여 설계 요구 사항에 가장 적합한 부품을 결정하십시오.
사양 비교
| 파라미터 | EP1K30QC208-1 | EP1K30QC208-3 |
|---|---|---|
| 브랜드 | Intel | Intel |
| 카테고리 | FPGA & CPLD | FPGA & CPLD |
| 수명 주기 상태 | Obsolete | 최종 구매 |
| 재고 상태 | In Stock | In Stock |
| 단가 (USD) | $10.85 | $9.75 |
| Device Family | ACEX-1K | — |
| Logic Elements (LEs) | 1,728 | — |
| Equivalent Gates | 30,000 | — |
| Logic Array Blocks (LABs) | 216 | — |
| Embedded Memory (EAB) | 24,576 bits | — |
| Maximum User I/O | 147 | 147 |
| Core Supply Voltage (VCCINT) | 2.5 V (2.375 V to 2.625 V) | — |
| 패키지 | 208-BFQFP (Plastic Quad Flat Pack, PQFP208) | 208-pin PQFP (Plastic Quad Flat Pack) |
| Terminal Pitch | 0.500 mm | — |
| 실장 유형 | Surface Mount (gull-wing leads) | Surface Mount |
| 동작 온도 | 0 °C to +70 °C (commercial) | 0C to +70C (commercial) |
| Maximum Operating Frequency | up to 250 MHz (family typical) | — |
| Process Technology | 2.5 V CMOS | SRAM-based LUT, 0.18 um |
| Configuration Method | SRAM, in-system reconfigurable (volatile) | — |
| Boundary-Scan Test | JTAG IEEE 1149.1 | — |
| I/O Voltage Support | 2.5 V / 3.3 V (multi-volt I/O) | — |
| Configuration Device Support | EPC2, EPC4, EPC8 Enhanced Configuration Devices | — |
| RoHS 상태 | Compliant (lead-free) | [DATA_NEEDED: RoHS compliance status] |
| Family | — | ACEX-1K |
| Logic Elements | — | 1,728 |
| Typical Gates | — | 30,000 |
| Maximum System Gates | — | 119,000 |
| Embedded Array Blocks (EABs) | — | 6 |
| Total RAM Bits | — | 24,576 |
| Core Voltage | — | 2.5 V |
| Speed Grade | — | -3 |
| I/O Standards Supported | — | LVTTL, LVCMOS, PCI |
| Programming Interface | — | IEEE 1149.1 JTAG, ByteBlaster |
| Lead-Free | — | [DATA_NEEDED: lead-free status] |