EP20K400GC655-3 vs EP20K400GC655-1 तुलना
विस्तृत दोनों ओर की तुलना EP20K400GC655-3 द्वारा Intel और EP20K400GC655-1 द्वारा Intel. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Intel
EP20K400GC655-1 - 400K Gate APEX 20K FPGA, 655-pin CPGA | Intel/Altera
EP20K400GC655-1 Obsoleteविशेषता तुलना
| पैरामीटर | EP20K400GC655-3 | EP20K400GC655-1 |
|---|---|---|
| ब्रांड | Intel | Intel |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | अंतिम बार खरीदें | Obsolete |
| Series | APEX-20KC | EP20K400 |
| Family | APEX 20K | APEX 20K |
| Manufacturer | Intel (formerly Altera) | — |
| Logic Elements | 16640 | 16,640 |
| Total RAM Bits | 212992 | 212,992 |
| Number of Gates | 400000 | — |
| Supply Voltage - Core | 1.71 V to 1.89 V (1.8 V nominal) | — |
| I/O Voltage Tolerance | MultiVolt I/O: 1.8 V / 2.5 V / 3.3 V / 5 V | — |
| ऑपरेटिंग तापमान | -40C to +85C (industrial) | 0 °C to +85 °C (commercial) |
| Maximum Frequency | 167 MHz (per FPGAkey) | — |
| Process Technology | 0.22 um CMOS | 0.22 µm CMOS |
| पैकेज / केस | 655-BCPGA | — |
| Supplier Device Package | 655-CPGA (62.48 x 62.48 mm) | — |
| Speed Grade | -3 (slowest grade in family) | — |
| Propagation Delay (tPD) | 3.6 ns (per Microchip USA listing) | — |
| JTAG Support | IEEE 1149.1 Boundary-Scan | — |
| Configuration Modes | Passive Serial, Passive Parallel Sync/Async, Active Serial | Passive Serial, Passive Parallel Async, Passive Parallel Sync |
| RoHS स्थिति | [DATA_NEEDED: rohs status] | Non-compliant (contains lead in ceramic package) |
| Maximum Gates | — | 1,052,000 |
| Typical Gates | — | 400,000 |
| Embedded System Blocks (ESBs) | — | 4 |
| Maximum User I/O | — | 502 |
| Dedicated Inputs | — | 6 |
| Core Supply Voltage | — | 2.5 V |
| I/O Supply Voltage | — | 3.3 V |
| Maximum Internal Frequency | — | 250 MHz |
| Propagation Delay | — | 2.5 ns |
| पैकेज | — | 655-pin CPGA (Ceramic Pin Grid Array) |
| पिन काउंट | — | 655 |
| माउंटिंग प्रकार | — | Through-Hole |
| Boundary Scan | — | IEEE 1149.1 (JTAG) |