RTAX250SL-1LG624V vs RTAX250SL-1CG624E तुलना
विस्तृत दोनों ओर की तुलना RTAX250SL-1LG624V द्वारा Microchip Technology और RTAX250SL-1CG624E द्वारा Microchip Technology. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Microchip Technology
RTAX250SL-1LG624V - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250SL-1LG624V ✓ सक्रियMicrochip Technology
RTAX250SL-1CG624E - 250K Gate Rad-Tolerant FPGA, CCGA-624 | Microchip
RTAX250SL-1CG624E ✓ सक्रियविशेषता तुलना
| पैरामीटर | RTAX250SL-1LG624V | RTAX250SL-1CG624E |
|---|---|---|
| ब्रांड | Microchip Technology | Microchip Technology |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Equivalent System Gates | 250,000 gates | 250,000 gates |
| Logic Cells | 4224 | 4224 |
| Configurable Logic Blocks (CLBs) | 2816 | 2816 |
| Architecture | CMOS antifuse (Axcelerator-derived) | — |
| Family | RTAX-S/SL Radiation-Tolerant FPGA | — |
| Core Supply Voltage | 1.5 V nominal | 1.5 V (1.425 V to 1.575 V) |
| Speed Grade | -1 | — |
| पैकेज | 624-terminal ceramic CGA (LG624), 1.270 mm terminal pitch | 624-ball Ceramic Column Grid Array (CCGA-624) |
| माउंटिंग प्रकार | Surface Mount | Surface Mount (ceramic column grid array) |
| ऑपरेटिंग तापमान | -55C to +125C | -55C to +125C |
| Configuration Type | One-Time Programmable (antifuse) | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Clock Resources | Segmentable clocks, chip-wide highway routing | — |
| Arithmetic Support | Dedicated carry logic | — |
| Application Domain | Space-flight systems | — |
| RoHS स्थिति | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| Total Ionizing Dose Tolerance | [DATA_NEEDED: TID level] | — |
| User I/O | — | 248 inputs / 248 outputs |
| Maximum Combinatorial Delay (CLB) | — | 0.93 ns |
| Maximum System Frequency | — | 649 MHz |
| Process Technology | — | 0.15 um CMOS |
| Logic Family | — | CMOS |
| Radiation Tolerance | — | SEU-immune to specified LET threshold; SEU rate < 10-10 errors/bit-day |
| SEU Mitigation | — | SEU-hardened registers (no external TMR required) |
| Configuration | — | Live-at-power-up, true single-chip operation |
| I/O Supply Voltage | — | [DATA_NEEDED: I/O bank voltage] |