RTAX4000SL-1CQ352EV vs RTAX4000SL-CQ352B तुलना
विस्तृत दोनों ओर की तुलना RTAX4000SL-1CQ352EV द्वारा Microchip Technology और RTAX4000SL-CQ352B द्वारा Microchip Technology. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Microchip Technology
RTAX4000SL-1CQ352EV - 4M Gate Rad-Tolerant FPGA 352-Pin CQFP | Microchip
RTAX4000SL-1CQ352EV ✓ सक्रियMicrochip Technology
RTAX4000SL-CQ352B - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-CQ352B ✓ सक्रियविशेषता तुलना
| पैरामीटर | RTAX4000SL-1CQ352EV | RTAX4000SL-CQ352B |
|---|---|---|
| ब्रांड | Microchip Technology | Microchip Technology |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Family | RTAX-SL (Radiation-Tolerant FPGA) | RTAX-SL (Radiation-Tolerant FPGAs) |
| Equivalent System Gates | 4000000 | 4,000,000 |
| Logic Cells | 40320 | 40,320 |
| Core Supply Voltage | 1.5 V | — |
| Process Technology | 0.15 um CMOS | 0.15 um |
| Speed Grade | 1 | — |
| पैकेज | 352-pin Ceramic CQFP (CQ352) | 352-Pin CQFP |
| JESD-30 Package Code | S-CQFP-F352 | — |
| Configuration Technology | Antifuse (live at power-up, single chip) | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Clock Resources | Segmentable clock conditioning circuits | Segmentable clocks, chip-wide highway routing |
| माउंटिंग प्रकार | Surface Mount | Surface Mount |
| Application Domain | Space-flight systems (radiation tolerant) | — |
| ऑपरेटिंग तापमान रेंज | [DATA_NEEDED: operating temperature range] | — |
| I/O Count | [DATA_NEEDED: usable I/O count for CQ352] | — |
| RoHS स्थिति | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS Status] |
| Core Voltage | — | 1.5 V |
| Packaging / Shipping | — | Box |
| Programmable Type | — | FPGA |
| Radiation Tolerance | — | Radiation-tolerant (space flight qualified family) |
| Arithmetic Support | — | Carry logic |
| ऑपरेटिंग तापमान | — | [DATA_NEEDED: Operating Temperature] |
| I/O Voltage | — | [DATA_NEEDED: I/O Voltage] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID Rating] |
| Single Event Latch-up Threshold | — | [DATA_NEEDED: SEL LET Threshold] |