RTAX4000SL-1CQ352EV vs RTAX4000SL-CQ352B مقایسه
مقایسه دقیق کنار به کنار RTAX4000SL-1CQ352EV توسط Microchip Technology و RTAX4000SL-CQ352B توسط Microchip Technology. مشخصات کلیدی، پارامترهای الکتریکی، بسته‌بندی، وضعیت چرخه عمر، قیمت‌گذاری و موجودی را مقایسه کنید تا بهترین قطعه را برای نیازهای طراحی خود تعیین کنید.
Microchip Technology
RTAX4000SL-1CQ352EV - 4M Gate Rad-Tolerant FPGA 352-Pin CQFP | Microchip
RTAX4000SL-1CQ352EV ✓ فعالMicrochip Technology
RTAX4000SL-CQ352B - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-CQ352B ✓ فعالمقایسه مشخصات
| پارامتر | RTAX4000SL-1CQ352EV | RTAX4000SL-CQ352B |
|---|---|---|
| برند | Microchip Technology | Microchip Technology |
| دسته‌بندی | FPGA & CPLD | FPGA & CPLD |
| وضعیت چرخه عمر | فعال | فعال |
| Family | RTAX-SL (Radiation-Tolerant FPGA) | RTAX-SL (Radiation-Tolerant FPGAs) |
| Equivalent System Gates | 4000000 | 4,000,000 |
| Logic Cells | 40320 | 40,320 |
| Core Supply Voltage | 1.5 V | — |
| Process Technology | 0.15 um CMOS | 0.15 um |
| Speed Grade | 1 | — |
| بسته‌بندی | 352-pin Ceramic CQFP (CQ352) | 352-Pin CQFP |
| JESD-30 Package Code | S-CQFP-F352 | — |
| Configuration Technology | Antifuse (live at power-up, single chip) | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Clock Resources | Segmentable clock conditioning circuits | Segmentable clocks, chip-wide highway routing |
| نوع نصب | Surface Mount | Surface Mount |
| Application Domain | Space-flight systems (radiation tolerant) | — |
| محدوده دمای کاری | [DATA_NEEDED: operating temperature range] | — |
| I/O Count | [DATA_NEEDED: usable I/O count for CQ352] | — |
| وضعیت RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS Status] |
| Core Voltage | — | 1.5 V |
| Packaging / Shipping | — | Box |
| Programmable Type | — | FPGA |
| Radiation Tolerance | — | Radiation-tolerant (space flight qualified family) |
| Arithmetic Support | — | Carry logic |
| دمای کاری | — | [DATA_NEEDED: Operating Temperature] |
| I/O Voltage | — | [DATA_NEEDED: I/O Voltage] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID Rating] |
| Single Event Latch-up Threshold | — | [DATA_NEEDED: SEL LET Threshold] |