NAFE13388-EVB - Evaluation Board for 24-bit 8-ch AFE | NXP
部品番号: NAFE13388-EVB ✓ 生産中| 数量 | 単価 | 小計 |
|---|---|---|
| 1 | $0 | $0.00 |
| 10 | $0 | $0.00 |
| 100 | $0 | $0.00 |
| 500 | $0 | $0.00 |
| 1,000 | $0 | $0.00 |
NAFE13388-EVB 概要
An evaluation board (EVB) is a printed-circuit platform that lets engineers assess an integrated circuit without designing custom hardware. In the data-conversion hierarchy, it belongs to development tools supporting analog front-end ICs: the AFE chip, then the ADC signal chain, then the complete measurement system. EVBs typically expose all signal pins, jumpers for configuration, and connectors to a host controller.
The NAFE13388-EVB is designed for the NAFExx388 family and connects to an NXP LPC54628 MCU board, allowing easy configuration and reading of measurement data through a dedicated PC GUI, per the NXP product page. This shortens the path from lab evaluation to production design.
The underlying NAFE13388 provides 1 Gohm high input impedance and input leakage below 5 nA at 105 C, which, combined with its low-noise, low-offset-drift PGA, makes it well suited for precision temperature measurement with RTD and thermocouple sensors, according to the NXP datasheet (Rev. 4, 2 April 2024). The eight HV analog inputs can be configured from eight single-ended to four differential channels with AICOM or AGND reference.
Typical evaluation scenarios include industrial sensor acquisition modules, battery test equipment, and building automation analog inputs. The integrated excitation sources support direct RTD and current-loop sensor evaluation.
When evaluating, note that the AFE integrates diagnostics; the GUI exposes configuration registers, so review the datasheet register map before scripting automated tests.
This page synthesizes distributor availability data, datasheet highlights, and practical evaluation guidance not consolidated in the manufacturer datasheet.
ドロップイン代替品: NAFE13388-EVB — 同一パッケージでピン互換。PCBの作り直しが必要な異なるパッケージの部品は除外されています。
クイック比較ツール — 並列比較する代替部品を選択:
NAFE13388B-EVB
✅ ドロップイン ⚠️ 仕様未検証📋 参考代替品（カタログ未掲載）
NAFE53388B-EVB
✅ ドロップイン ⚠️ 仕様未検証📋 参考代替品（カタログ未掲載）
NAFE13398-EVB
✅ ドロップイン ⚠️ 仕様未検証📋 参考代替品（カタログ未掲載）
NAFE13388-UADFLIP
✅ ドロップイン ⚠️ 仕様未検証📋 参考代替品（カタログ未掲載）
NAFE13388-EVB 仕様（メーカー公開）
| Product Type | Evaluation board (EVB) |
| Target Device | NAFE13388 universal analog front-end (AFE) |
| Analog Input Channels | 8 (configurable to 4 differential) |
| ADC Resolution | 24 bits |
| 入力電圧範囲 | +/-25 V (HV analog inputs) |
| PGA Gain Range | 0.2 V/V to 16 V/V (8 selectable settings) |
| Input Impedance | 1 Gohm |
| Input Leakage Current | < 5 nA at 105 C |
| Excitation Sources | Integrated (for RTD/sensor excitation) |
| Host Interface | Connects to NXP LPC54628 MCU board |
| Software Support | Dedicated PC GUI for configuration and data readout |
| Application Focus | Precision temperature measurement (RTD, TC), industrial DAQ |
| Manufacturer | NXP Semiconductors |
| Chip Datasheet Revision | Rev. 4, 2 April 2024 |
NAFE13388-EVB インターフェースとコネクタ
NAFE13388-EVB は、メーカーが公開している以下のインターフェースとコネクタを備えています: 拡張 / バス, 電力入力。拡張ヘッダーのピン配置、コネクタのピン番号、電気的制限はメーカーのドキュメントで定義されています。
| 拡張 / バス | 24 bits |
| 電力入力 | +/-25 V (HV analog inputs) |
詳細は メーカー資料 をご参照ください（拡張ヘッダーのピン配置とコネクタのピン番号の詳細）。
電力・熱特性
| 電力入力 | +/-25 V (HV analog inputs) |
メーカーが公開している NAFE13388-EVB の電力入力および熱パラメータ。
主な用途
NAFE13388-EVB の用途: 6 件s: Industrial Sensor Data Acquisition, Precision Temperature Measurement (RTD), Thermocouple Input Modules, Battery Test and Monitoring Systems, Building Automation Analog Inputs, Process Control and Diagnostics.
Industrial Sensor Data Acquisition
The NAFE13388-EVB lets engineers prototype universal-input industrial DAQ channels using the NAFE13388's eight +/-25 V HV inputs, configurable from eight single-ended to four differential channels. The 24-bit ADC and PGA gains from 0.2 V/V to 16 V/V accommodate millivolt-level thermocouple signals through the +/-25 V tolerance typical of harsh industrial environments. With 1 Gohm input impedance and under 5 nA leakage at 105 C, loading errors on high-impedance sensors stay negligible. Evaluating via the LPC54628 board and NXP GUI lets designers validate register configurations and diagnostics before committing to a production schematic, cutting sensor-front-end development time substantially.
おすすめ
Precision Temperature Measurement (RTD)
RTD evaluation benefits directly from the EVB's integrated excitation sources: the NAFE13388 can source excitation current to 3-wire or 4-wire RTDs and measure the resulting voltage differentially, eliminating long wire runs of external circuitry. Per the NXP datasheet, the low-noise, low-offset-drift PGA paired with under 5 nA input leakage minimizes excitation-induced errors, supporting sub-degree accuracy designs. The 24-bit converter provides ample resolution over the 100-400 ohm span of a Pt100 or Pt1000 sensor. Using the EVB, engineers can compare gain settings (0.2 to 16 V/V) and verify ratiometric measurement performance before designing the final analog front end.
おすすめ
Thermocouple Input Modules
Thermocouple front ends demand high input tolerance and microvolt resolution. The NAFE13388's +/-25 V HV inputs survive miswiring and common-mode transients common in thermocouple installations, while the 24-bit ADC with high PGA gains resolves microvolt-level Seebeck signals. The AICOM common-input reference allows many thermocouple channels to share a reference, simplifying multichannel module design. The NAFE13388-EVB with the NXP GUI lets engineers measure noise floor and offset drift at each of the eight gain settings, quantify cold-junction channel requirements, and validate the integrated diagnostic features such as open-sensor detection before productization.
おすすめ
Battery Test and Monitoring Systems
Battery cell evaluation requires measuring many cells spanning a wide total voltage while each cell stays within a few volts. The NAFE13388's universal inputs tolerate +/-25 V, letting one AFE monitor stacks or individual cells with a shared AICOM reference. Its 1 Gohm inputs prevent cell drain during measurement, important for long-duration characterization. The EVB enables engineers to test differential configurations (up to four differential channels) against cell-voltage tolerances and to exercise the on-chip diagnostics used for open-wire detection in battery packs. The LPC54628 host plus GUI accelerates setup compared to building a custom DAQ harness.
おすすめ
Building Automation Analog Inputs
Building automation controllers mix universal analog inputs (0-10 V, resistive, thermistor, current loop) that historically required separate conditioning per type. The NAFE13388's universal +/-25 V inputs, programmable 0.2-16 V/V PGA, and integrated excitation sources let a single front-end cover all these modes, reducing BOM complexity. The EVB lets developers verify each input mode with the NXP GUI, from high-voltage 0-10 V signals to NTC thermistor ratiometric readings, and to calibrate channel-to-channel matching. Low 5 nA leakage protects accuracy on high-resistance sensor runs typical in HVAC installations across large buildings.
おすすめ
Process Control and Diagnostics
Process instrumentation requires both measurement precision and health monitoring. The NAFE13388 integrates various diagnostic features, according to NXP documentation, including sensor and wiring fault detection that the NAFE13388-EVB exposes through the PC GUI. Engineers can inject fault conditions (open sensor, shorted input, out-of-range +/-25 V signals) and observe diagnostic flag behavior at 24-bit resolution, validating alarm thresholds before deploying field hardware. The 8-channel universal architecture maps directly onto multi-loop process transmitters, and the low-power operation suits loop-powered 4-20 mA designs where the AFE's power budget is constrained.
おすすめ
おすすめ製品の概要
エンジニアリング参考データ: NAFE13388-EVB — 比較、設計ガイダンス、コンプライアンス情報。
選定ガイド
代替品との比較
| パラメータ | この製品 | NAFE13388B-EVB | NAFE53388B-EVB | NAFE13398-EVB |
|---|---|---|---|---|
| Board Type | NAFExx388 evaluation board | NAFExx388 evaluation board (calibrated variant) | NAFExx388 evaluation board (high-speed variant) | NAFExx388 evaluation board (no excitation) |
| Package | Evaluation board (EVB form factor) | Evaluation board - same form factor | Evaluation board - same form factor | Evaluation board - same form factor |
| Brand | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors |
| Target ADC Resolution | 24 bits | 24 bits | 24 bits | 24 bits |
| Analog Input Range | +/-25 V universal | +/-25 V universal | +/-25 V universal | +/-25 V universal |
| Channels | 8 (to 4 differential) | 8 (to 4 differential) | 8 (to 4 differential) | 8 (to 4 differential) |
| Excitation Sources | Integrated | Integrated | Integrated | Not integrated |
| Speed Class | Low-power | Low-power | High-speed | Low-power |
主な差別化要因
- Universal +/-25 V inputs with integrated excitation （vs NAFE13398-EVB)
- Factory-calibrated evaluation option （vs NAFE13388B-EVB)
- High-speed evaluation path （vs NAFE53388B-EVB)
設計ノート
The NAFE13388-EVB requires the NXP LPC54628 MCU board as its host; it is not standalone. Order the LPC54628 board together with the EVB to avoid evaluation downtime. The dedicated PC GUI handles register configuration, but reviewing the NAFE13388 datasheet (Rev. 4, April 2024) register map is strongly recommended before running automated tests, since diagnostic features and excitation sources are register-controlled.
When evaluating at 24-bit resolution, keep the HV analog input leads short and use differential configuration for low-level signals such as thermocouples. The 1 Gohm input impedance makes the inputs susceptible to pickup; shielded cable and a solid AICOM or AGND reference connection prevent noise from dominating the low-noise PGA performance.
The NAFE13388 is a low-power AFE, but the integrated excitation sources add current draw when driving RTDs. During evaluation, budget excitation current separately from AFE quiescent consumption so measured supply behavior reflects production conditions. Estimated: a Pt100 excitation of 1 mA dominates a sub-mA AFE quiescent current, per typical RTD practice.
コンプライアンス情報
Compliance data not present in the verified web data for this evaluation board as of 2026-09-13; consult the NXP product page for the latest environmental declarations.