EP1K30QI208-2 vs EP1K30QC208-1 비교
다음의 상세 나란히 비교: EP1K30QI208-2 제조: Altera 및 EP1K30QC208-1 제조: Intel. 주요 사양, 전기적 파라미터, 패키징, 수명 주기 상태, 가격 및 재고를 비교하여 설계 요구 사항에 가장 적합한 부품을 결정하십시오.
사양 비교
| 파라미터 | EP1K30QI208-2 | EP1K30QC208-1 |
|---|---|---|
| 브랜드 | Altera | Intel |
| 카테고리 | FPGA & CPLD | FPGA & CPLD |
| 수명 주기 상태 | Obsolete | Obsolete |
| 재고 상태 | In Stock | In Stock |
| 단가 (USD) | $0.00 | $10.85 |
| Product Category | FPGA - Field Programmable Gate Array | — |
| Series | ACEX-1K | — |
| Number of Logic Elements/Cells | 1,728 | — |
| Total RAM Bits | 24,576 | — |
| Number of User I/Os | 147 | — |
| Number of Typical Gates | 30,000 | — |
| Core Supply Voltage | 2.5 V | — |
| 최대 클록 주파수 | 200 MHz | — |
| Speed Grade | -2 | — |
| 패키지 / 케이스 | 208-BFQFP (PQFP-208) | — |
| Package Code | FQFP | — |
| Package Shape | SQUARE | — |
| Terminal Form | GULL WING | — |
| Number of Terminals | 208 | — |
| Temperature Grade | Industrial (I) | — |
| 실장 유형 | Surface Mount | Surface Mount (gull-wing leads) |
| 동작 온도 범위 | [DATA_NEEDED: exact operating temperature range in degrees C] | — |
| Propagation Delay | 0.4 ns (per AiPCBA programming manual summary) | — |
| Memory Features | Enhanced embedded array with dual-port SRAM support | — |
| Supported I/O Standards | [DATA_NEEDED: supported I/O standards] | — |
| Configuration Device | [DATA_NEEDED: required configuration device] | — |
| RoHS 상태 | [DATA_NEEDED: RoHS status for non-N variant] | Compliant (lead-free) |
| Device Family | — | ACEX-1K |
| Logic Elements (LEs) | — | 1,728 |
| Equivalent Gates | — | 30,000 |
| Logic Array Blocks (LABs) | — | 216 |
| Embedded Memory (EAB) | — | 24,576 bits |
| Maximum User I/O | — | 147 |
| Core Supply Voltage (VCCINT) | — | 2.5 V (2.375 V to 2.625 V) |
| 패키지 | — | 208-BFQFP (Plastic Quad Flat Pack, PQFP208) |
| Terminal Pitch | — | 0.500 mm |
| 동작 온도 | — | 0 °C to +70 °C (commercial) |
| Maximum Operating Frequency | — | up to 250 MHz (family typical) |
| Process Technology | — | 2.5 V CMOS |
| Configuration Method | — | SRAM, in-system reconfigurable (volatile) |
| Boundary-Scan Test | — | JTAG IEEE 1149.1 |
| I/O Voltage Support | — | 2.5 V / 3.3 V (multi-volt I/O) |
| Configuration Device Support | — | EPC2, EPC4, EPC8 Enhanced Configuration Devices |