EPM3512AQC208-10N vs EPM3512AQC208-7 비교
다음의 상세 나란히 비교: EPM3512AQC208-10N 제조: Intel 및 EPM3512AQC208-7 제조: Intel. 주요 사양, 전기적 파라미터, 패키징, 수명 주기 상태, 가격 및 재고를 비교하여 설계 요구 사항에 가장 적합한 부품을 결정하십시오.
Intel
EPM3512AQC208-7 - MAX 3000A CPLD, 512 Macrocells, 7.5ns, 208-PQFP | Intel
EPM3512AQC208-7 Nrnd사양 비교
| 파라미터 | EPM3512AQC208-10N | EPM3512AQC208-7 |
|---|---|---|
| 브랜드 | Intel | Intel |
| 카테고리 | FPGA & CPLD | FPGA & CPLD |
| 수명 주기 상태 | Obsolete | NRND |
| 재고 상태 | In Stock | In Stock |
| 단가 (USD) | $42.80 | $41.72 |
| Family | MAX 3000A | MAX 3000A |
| Device Type | CPLD (Complex Programmable Logic Device) | CPLD (Complex Programmable Logic Device) |
| Macrocells | 512 | 512 |
| Usable Gates | Up to 10,000 | 10,000 |
| Logic Array Blocks (LABs) | 16 | — |
| User I/Os | 172 | 172 |
| 패키지 | 208-pin PQFP (Plastic Quad Flat Pack) | 208-Pin PQFP (FQFP, gull-wing) |
| 공급 전압 | 3.3 V | — |
| Pin-to-Pin Delay | 4.5 ns (-10 speed grade) | — |
| Maximum Internal Frequency | 227.3 MHz | — |
| Speed Grade | -10 | — |
| Process Technology | CMOS EEPROM | CMOS EEPROM, 0.30 um |
| In-System Programming | IEEE Std. 1149.1 JTAG, IEEE Std. 1532 | — |
| Boundary-Scan Test (BST) | Built-in, IEEE 1149.1 compliant | — |
| I/O Standards | MultiVolt (1.8V / 2.5V / 3.3V) | — |
| 동작 온도 | 0 C to 70 C (commercial) | 0 C to +70 C (commercial) |
| RoHS 상태 | [DATA_NEEDED: RoHS status not in verified web data] | Compliant |
| Propagation Delay (tPD) | — | 7.5 ns |
| Counter Frequency (fCNT) | — | 116.3 MHz |
| Logic Elements / LEs | — | N/A (CPLD macrocell architecture) |
| Supply Voltage (VCCINT) | — | 3.3 V |
| I/O Standards Supported | — | 5.0 V, 3.3 V, 2.5 V (MultiVolt I/O) |
| Programming | — | In-System Programmable via JTAG (IEEE Std. 1532) |
| Lead-Free | — | Yes |