ADS4129IRGZ25 - 12-Bit 250MSPS Ultra-Low-Power ADC | Texas Instruments
부품 번호: ADS4129IRGZ25 ✓ 활성| 수량 | 단가 | 합계 |
|---|---|---|
| 1 | $32.5 | $32.50 |
| 10 | $29.25 | $292.50 |
| 100 | $26.1 | $2,610.00 |
| 500 | $22.8 | $11,400.00 |
| 1,000 | $19.45 | $19,450.00 |
ADS4129IRGZ25 개요
An analog-to-digital converter (ADC) is a semiconductor device that converts continuous-time analog signals into discrete digital codes for downstream processing by FPGAs, DSPs, microcontrollers, or ASICs. The pipelined ADC architecture the ADS4129IRGZ25 uses breaks the conversion into multiple low-resolution stages, each driving a residue that is amplified and quantized by the next stage. Pipelined ADCs sit in the hierarchy: pipelined ADC -> successive-approximation (SAR) and flash alternatives -> data converter -> signal chain IC -> semiconductor. They are the dominant architecture for sample rates from 50 MSPS to 500 MSPS, where SAR converters are too slow and flash converters consume excessive power.
Key features of the ADS4129IRGZ25 include 12-bit resolution, 250 MSPS maximum sampling rate, LVDS-based DDR (double data rate) or CMOS digital output interfaces, integrated internal reference (with the option to drive an external reference), programmable analog input full-scale range, and a serial control interface (SPI) for register configuration. The device supports both single-ended and differential analog inputs, with input bandwidth typically exceeding 700 MHz. Power consumption scales with sample rate, allowing designers to trade speed for power in the same hardware.
Typical applications include high-speed instrumentation, communications test equipment, cable-headend downstream receivers, software-defined radio (SDR), radar signal processing front ends, medical imaging front ends (ultrasound beamforming), and industrial high-speed data acquisition. The combination of 250 MSPS, 12 bits, low power, and small 7x7 mm package makes it well suited to size-constrained, thermally limited designs.
When designing with the ADS4129IRGZ25, ensure the analog input network uses a properly terminated, bandwidth-matched differential transformer or differential amplifier - poor input matching will directly degrade SNR. Decouple AVDD and DRVDD with a 1 uF plus 0.1 uF capacitor pair placed within 2 mm of each supply pin, and provide an isolated ground plane for the digital return currents to avoid coupling switching noise back into the analog front end.
This page synthesizes distributor pricing, drop-in alternatives from the same TI family and pin-compatible cross-brand parts, application companion chips, and practical design notes that go beyond what the manufacturer datasheet alone provides.
드롭인 대체품: ADS4129IRGZ25 — 동일 패키지, 핀 호환. PCB 재작업이 필요한 다른 패키지 부품은 제외됩니다.
이 시리즈의 변형
다음과 드롭인 호환되는 동일 시리즈 모델: ADS4129IRGZ25 (동일 폼 팩터 및 풋프린트) — 차이점: Operating Temperature Range, Analog Supply Voltage, Input Type, Package, Resolution.
빠른 비교 도구 — 나란히 비교할 대체 부품을 선택하십시오:
ADS4128IRGZR
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
ADS4149IRGZ25
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
ADS4142IRGZ25
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
ADS6129IRGZ25
✅ 드롭인✓ 재고 있음
$23.1 / 개
데이터시트 보기 →ADS6149IRGZ25
✅ 드롭인✓ 재고 있음
$20.85 / 개
데이터시트 보기 →ADS4148IRGZR
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
ADS4129IRGZ25 최대 정격 & 전기적 특성
| 분해능 | 12 bit |
| Number of Channels | 1 |
| Architecture | Pipelined |
| Sample Rate (max) | 250 MSPS |
| Analog Supply Voltage | 1.8 V |
| Digital Supply Voltage | 1.8 V to 3.3 V |
| Input Type | Differential / Single-ended |
| Digital Output Interface | LVDS DDR / Parallel CMOS |
| Reference Type | Internal (external optional) |
| 동작 온도 범위 | -40 C to +85 C (Industrial) |
| 패키지 | 48-VQFN (RGZ) 7x7 mm |
| 실장 유형 | Surface Mount |
| RoHS 상태 | Compliant |
ADS4129IRGZ25 핀 구성
| 핀 1 | AVDD — Analog supply, 1.8 V |
| 핀 2 | AVDD — Analog supply, 1.8 V |
| 핀 3 | INP — Differential analog input positive |
| 핀 4 | INM — Differential analog input negative |
| 핀 5 | AVDD — Analog supply, 1.8 V |
| 핀 6 | VCM — Common-mode voltage output for input biasing |
| 핀 7 | REXT — External resistor for internal reference current setting |
| 핀 8 | REFP — Internal reference voltage positive decoupling |
| 핀 9 | REFM — Internal reference voltage negative decoupling |
| 핀 10 | AVDD — Analog supply, 1.8 V |
| 핀 11 | AVSS — Analog ground |
| 핀 12 | AVSS — Analog ground |
| 핀 13 | CLKP — Differential sampling clock input positive |
| 핀 14 | CLKM — Differential sampling clock input negative |
| 핀 15 | AVDD — Analog supply, 1.8 V |
| 핀 16 | AVSS — Analog ground |
| 핀 17 | SCLK — SPI serial clock for register access |
| 핀 18 | SDATA — SPI serial data input |
| 핀 19 | SEN — SPI enable, active low |
| 핀 20 | RESET — Hardware reset, active low |
| 핀 21 | PDN — Power-down mode, active high |
| 핀 22 | AVDD — Analog supply, 1.8 V |
| 핀 23 | DRVDD — Digital output supply, 1.8 V to 3.3 V |
| 핀 24 | DRVDD — Digital output supply, 1.8 V to 3.3 V |
| 핀 25 | DRVSS — Digital ground |
| 핀 26 | D0_P — LVDS data output bit 0 positive |
| 핀 27 | D0_M — LVDS data output bit 0 negative |
| 핀 28 | D1_P — LVDS data output bit 1 positive |
| 핀 29 | D1_M — LVDS data output bit 1 negative |
| 핀 30 | D2_P — LVDS data output bit 2 positive |
| 핀 31 | D2_M — LVDS data output bit 2 negative |
| 핀 32 | D3_P — LVDS data output bit 3 positive |
| 핀 33 | D3_M — LVDS data output bit 3 negative |
| 핀 34 | D4_P — LVDS data output bit 4 positive |
| 핀 35 | D4_M — LVDS data output bit 4 negative |
| 핀 36 | D5_P — LVDS data output bit 5 positive |
| 핀 37 | D5_M — LVDS data output bit 5 negative |
| 핀 38 | D6_P — LVDS data output bit 6 positive |
| 핀 39 | D6_M — LVDS data output bit 6 negative |
| 핀 40 | D7_P — LVDS data output bit 7 positive |
| 핀 41 | D7_M — LVDS data output bit 7 negative |
| 핀 42 | D8_P — LVDS data output bit 8 positive |
| 핀 43 | D8_M — LVDS data output bit 8 negative |
| 핀 44 | D9_P — LVDS data output bit 9 positive |
| 핀 45 | D9_M — LVDS data output bit 9 negative |
| 핀 46 | D10_P — LVDS data output bit 10 positive |
| 핀 47 | D10_M — LVDS data output bit 10 negative |
| 핀 48 | DCLK_P — LVDS data clock output positive |
| 핀 EP | EP — Exposed thermal pad - connect to analog ground plane |
일반적인 애플리케이션
ADS4129IRGZ25 적합 용도: 6 애플리케이션s: Wideband Communications Test Equipment, Software Defined Radio (SDR) Receiver, Medical Ultrasound Beamforming Front End, Cable Headend Downstream Receiver, Radar Signal Processing Front End, Industrial High-Speed Data Acquisition.
Wideband Communications Test Equipment
The ADS4129IRGZ25's 12-bit, 250 MSPS performance makes it well suited for wideband communications test equipment that digitizes IF signals from cable, wireless, and backhaul systems. With LVDS DDR outputs, it can stream 12-bit samples at 250 MSPS into an FPGA for real-time FFT analysis, modulation analysis, and bit-error-rate testing without data loss. The 1.8 V analog supply reduces thermal load in dense multi-channel test rigs, while the VQFN-48 footprint allows tight placement of multiple ADCs on a single board. Designers can pair it with a low-noise LDO such as TPS7A4701 for the analog rail and an LMK04803 clock jitter cleaner for the sampling clock. Compared with general-purpose oscilloscope ADCs, the ADS4129IRGZ25's pipelined architecture provides the throughput needed for production-line tester throughput.
추천
Software Defined Radio (SDR) Receiver
In software-defined radio receivers, the ADS4129IRGZ25 digitizes IF signals up to 250 MSPS, allowing downstream FPGAs to perform channelization, demodulation, and channel filtering in software rather than analog hardware. Its wide analog input bandwidth supports direct IF sampling of signals in the 70-200 MHz range, eliminating an analog downconversion stage and reducing BOM. The LVDS DDR interface streamlines capture into FPGAs such as Xilinx Kintex or Artix, while the small 7x7 mm VQFN package simplifies dense multi-channel SDR designs like MIMO or phased-array front ends. Pair the ADS4129IRGZ25 with a wideband transformer like the Mini-Circuits ADT1-1WT and an LNA such as MGA-62563 for a complete receive chain.
추천
Medical Ultrasound Beamforming Front End
The ADS4129IRGZ25 is frequently used in portable and mid-tier ultrasound systems where each channel of a phased-array transducer must be digitized at high speed. At 250 MSPS with 12-bit resolution, it captures RF echoes across the full ultrasound band (typically 1-15 MHz), while the small VQFN-48 package supports dense 32, 64, or 128-channel arrays required for real-time imaging. Its low power consumption keeps total system heat within portable-cart thermal budgets, and the LVDS outputs cleanly fan into downstream FPGAs that perform beamforming and envelope detection. Designers commonly pair it with an LMH6624 low-noise front-end amplifier and an LMK04031 clock distribution IC. Compared with older 10-bit ultrasound ADCs, the ADS4129IRGZ25's extra 2 bits directly improve dynamic range and penetration depth in B-mode imaging.
추천
Cable Headend Downstream Receiver
In DOCSIS 3.1 cable headend equipment, the ADS4129IRGZ25 digitizes downstream IF signals from the QAM demodulator path, providing the high SNR needed for high-order modulation. Its 250 MSPS throughput captures multi-channel bonded downstream blocks without aliasing, while the LVDS DDR interface streams data into demodulation ASICs or FPGAs. The 1.8 V analog supply simplifies thermal design in sealed headend chassis, and the small 7x7 mm package supports dense multi-channel receiver cards. Pair it with a Ti DOCSIS tuner front end and a TPS7A4701 LDO for clean analog rail. The 12-bit resolution comfortably meets DOCSIS 3.1 SNR margin requirements at downstream carrier frequencies up to 1 GHz.
추천
Radar Signal Processing Front End
In short-range radar and automotive driver-assistance (ADAS) front ends, the ADS4129IRGZ25 digitizes IF outputs from radar mixers operating at 40-77 GHz carrier, then downconverted to baseband or low-IF. Its 250 MSPS throughput supports the wide instantaneous bandwidth needed for high-range-resolution radar, while the LVDS outputs simplify interface to radar signal processing FPGAs. The 7x7 mm VQFN-48 package is small enough to fit multiple ADC channels in a tight radar module, and the industrial -40 to +85 C temperature grade suits automotive under-hood environments. Pair with a low-noise amplifier and an AWR1642 radar transceiver SoC for a complete FMCW radar front end.
추천
Industrial High-Speed Data Acquisition
The ADS4129IRGZ25 is well suited to industrial data acquisition systems that need to digitize multiple high-speed analog sensors such as vibration, acoustic emission, or partial-discharge signals. Its 250 MSPS sample rate allows simultaneous capture of multiple sensors through a multiplexer, or single-channel capture at very high time resolution for transient analysis. The LVDS DDR interface enables reliable transfer over longer board traces to a host FPGA or processor, which is critical in electrically noisy industrial environments. Designers commonly pair it with an ISO224 isolation amplifier on the front end and a TMS320C6678 DSP for downstream signal processing. Compared with integrating dual-slope ADCs, the ADS4129IRGZ25 provides 4-5 orders of magnitude higher throughput for time-domain analysis.
추천
추천 제품 요약
엔지니어링 참조 데이터: ADS4129IRGZ25 — 비교, 설계 지침 및 규정 준수 정보.
선택 가이드
대체품과의 비교
| 파라미터 | 이 제품 | ADS4128IRGZR | ADS4149IRGZ25 | ADS4142IRGZ25 | ADS6129IRGZ25 | ADS6149IRGZ25 | ADS4148IRGZR |
|---|---|---|---|---|---|---|---|
| Brand | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments |
| Package | 48-VQFN (RGZ) 7x7 mm | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same |
| Resolution | 12 bit | 12 bit | 14 bit | 14 bit | 12 bit | 14 bit | 14 bit |
| Max Sample Rate | 250 MSPS | 200 MSPS | 250 MSPS | 160 MSPS | 105 MSPS | 105 MSPS | 200 MSPS |
| Analog Supply | 1.8 V | 1.8 V | 1.8 V | 1.8 V | 3.3 V | 3.3 V | 1.8 V |
| Digital Output | LVDS DDR / CMOS | LVDS DDR / CMOS | LVDS DDR / CMOS | LVDS DDR / CMOS | LVDS DDR / CMOS | LVDS DDR / CMOS | LVDS DDR / CMOS |
| Pinout Compatible | Yes (baseline) | Yes - drop-in | Yes - drop-in | Yes - drop-in | Yes - drop-in (different supply) | Yes - drop-in (different supply) | Yes - drop-in |
| Operating Temperature | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C |
주요 차별점
- Balanced combination of speed, resolution, and low power (vs ADS4128IRGZR)
- Lower power consumption than 14-bit same-speed ADCs (vs ADS4149IRGZ25)
- Smaller and lower-cost than higher-end JEDEC ADC families (vs AD9629 (ADI))
설계 노트
Place a 1 uF X7R ceramic plus a 0.1 uF X7R ceramic within 2 mm of every AVDD and DRVDD pin pair, with vias to the dedicated ground plane. Keep the analog input traces a controlled-impedance differential pair (typically 100 ohms differential) and route them with continuous reference ground on the layer below. The exposed thermal pad must be soldered to a contiguous ground copper pour with multiple thermal vias to keep junction temperature within the industrial range.
Drive the sampling clock with a low-jitter differential source such as the LMK04803 or LMX2491. Jitter on CLKP/CLKM directly translates to SNR degradation: estimated SNR limit = 20*log10(1 / (2*pi*fIN*TJ)), so at 170 MHz IF a 1 ps RMS jitter degrades SNR by ~10 dB compared to the datasheet figure. Route the clock differential pair with 100 ohm controlled impedance, length-matched to within 1 mm, and keep clock traces away from LVDS data outputs.
Do not leave the PDN pin floating - tie it low through a 10 kohm resistor, or the ADC may enter power-down mode unpredictably. The RESET pin also requires a defined logic level at power-up; a 10 kohm pull-up to DRVDD is recommended. Avoid driving the analog input as a single-ended signal; the ADC is designed for differential drive and single-ended input will substantially reduce SNR and may damage the input ESD structure. Finally, ensure the SPI SDATA, SCLK, and SEN traces do not cross or run parallel to LVDS data outputs.
규정 준수 정보
RoHS and REACH compliance per Texas Instruments product page; lead-free (Pb-free) reflow profile per JEDEC J-STD-020. AEC-Q100 qualification not applicable - the part is not marketed as automotive grade. Halogen-free status not explicitly stated in verified data.
