EPM3064ATC100-7N - MAX 3000A CPLD, 64 Macrocells, 66 I/O | Altera
부품 번호: EPM3064ATC100-7N ✗ 단종| 수량 | 단가 | 합계 |
|---|---|---|
| 1 | $11.5 | $11.50 |
| 10 | $10.2 | $102.00 |
| 100 | $8.75 | $875.00 |
| 500 | $7.4 | $3,700.00 |
| 1,000 | $6.1 | $6,100.00 |
EPM3064ATC100-7N 개요
What is a CPLD? A Complex Programmable Logic Device is a non-volatile programmable logic device that sits between simple PAL/GAL chips and large FPGAs in the programmable logic hierarchy (CPLD -> PLD -> programmable logic -> integrated circuit). CPLDs are characterized by instant-on non-volatile configuration (typically EEPROM or flash), predictable timing with deterministic pin-to-pin delays, and are well suited for glue logic, bus interfacing, state-machine control, and I/O expansion. Unlike SRAM-based FPGAs, CPLDs do not require external boot memory, simplifying board design and shortening time-to-market.
Key features include 3.3-V core operation with separate VCCIO banks that can be powered at 3.3 V or 2.5 V for mixed-voltage I/O compatibility, built-in JTAG boundary-scan test (IEEE Std. 1149.1), and ISP compliance with IEEE Std. 1532 for concurrent programming between multiple PLD vendors. The architecture combines a programmable interconnect array, macrocells with configurable registers, and a global routing network, providing up to 10,000 usable gates and predictable timing across operating conditions.
The -7 speed grade supports 7.5 ns pin-to-pin delays with 166.7 MHz internal counters, making the part suitable for high-speed bus arbitration, address decoding, and synchronous state-machine applications. The device operates across the standard 0 °C to 70 °C commercial temperature range with 3.3-V VCCINT, while VCCIO flexibility enables interface to 2.5-V downstream logic without external level shifters.
Typical applications include industrial control systems, automotive body electronics, telecommunications infrastructure, peripheral interface bridging, and legacy 5-V-to-3.3-V system upgrades where the CPLD absorbs the glue logic. The non-volatile configuration and deterministic timing make it ideal for boot-time-critical tasks such as clock generation reset sequencing and power-rail control.
When designing with this device, ensure that the JTAG chain is correctly ordered if multiple devices share TCK/TMS/TDI/TDO, and add 0.1 µF decoupling capacitors adjacent to every VCCINT and VCCIO pin. For high-speed designs, follow Altera application-note guidelines for signal integrity on clock and global clear nets.
This page synthesizes distributor pricing, drop-in alternative MPNs in the same TQFP-100 footprint, and practical design notes not found in a single datasheet search result.
드롭인 대체품: EPM3064ATC100-7N — 동일 패키지, 핀 호환. PCB 재작업이 필요한 다른 패키지 부품은 제외됩니다.
이 시리즈의 변형
다음과 드롭인 호환되는 동일 시리즈 모델: EPM3064ATC100-7N (동일 폼 팩터 및 풋프린트) — 차이점: Package, RoHS Status, Programming Interface, Device Type, Usable Gates.
빠른 비교 도구 — 나란히 비교할 대체 부품을 선택하십시오:
EPM3064ATC100-4N
✅ 드롭인✓ 재고 있음
$4.6 / 개
데이터시트 보기 →EPM3064ATC100-7
✅ 드롭인✓ 재고 있음
$3.08 / 개
데이터시트 보기 →EPM3064ATC100-10N
✅ 드롭인✓ 재고 있음
$2.43 / 개
데이터시트 보기 →EPM3064ATC100-10NA
✅ 드롭인✓ 재고 있음
$4.65 / 개
데이터시트 보기 →EPM3064ATC100-4
✅ 드롭인✓ 재고 있음
$5.2 / 개
데이터시트 보기 →EPM3064ATC-100-10N
✅ 드롭인✓ 재고 있음
$2.2 / 개
데이터시트 보기 →EPM3064AT100-10N
✅ 드롭인✓ 재고 있음
$5.45 / 개
데이터시트 보기 →EPM3064ATC100-7N 최대 정격 & 전기적 특성
| Family | MAX 3000A |
| Device Type | CPLD - Complex Programmable Logic Device |
| Macrocells | 64 |
| Logic Array Blocks (LABs) | 2 |
| User I/O Pins | 66 |
| Usable Gates | up to 1,250 |
| Propagation Delay (tPD) | 7.5 ns (pin-to-pin, -7 speed grade) |
| Maximum Internal Frequency | 166.7 MHz (-7 speed grade) |
| Core Supply Voltage (VCCINT) | 3.3 V |
| I/O Supply Voltage (VCCIO) | 3.3 V or 2.5 V |
| Program Memory Technology | EEPROM (non-volatile) |
| In-System Programming | IEEE Std. 1149.1 (JTAG), IEEE Std. 1532 |
| 패키지 | TQFP-100 |
| 실장 유형 | Surface Mount |
| 동작 온도 | 0 °C to +70 °C (commercial) |
EPM3064ATC100-7N 핀 구성
| 핀 1 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 2 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 3 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 4 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 5 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 6 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 7 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 8 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 9 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 10 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 11 | GND — Ground |
| 핀 12 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 13 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 14 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 15 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 16 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 17 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 18 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 19 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 20 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 21 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 22 | GND — Ground |
| 핀 23 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 24 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 25 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 26 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 27 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 28 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 29 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 30 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 31 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 32 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 33 | GND — Ground |
| 핀 34 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 35 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 36 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 37 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 38 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 39 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 40 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 41 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 42 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 43 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 44 | GND — Ground |
| 핀 45 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 46 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 47 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 48 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 49 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 50 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 51 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 52 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 53 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 54 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 55 | GND — Ground |
| 핀 56 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 57 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 58 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 59 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 60 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 61 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 62 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 63 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 64 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 65 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 66 | GND — Ground |
| 핀 67 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 68 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 69 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 70 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 71 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 72 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 73 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 74 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 75 | GLOBAL/IN0 — Global clock input or dedicated input (per datasheet, pin 1 of macrocell I/O bank) |
| 핀 76 | GLOBAL/IN1 — Global clear or second dedicated input |
| 핀 77 | TDI — JTAG Test Data In (IEEE 1149.1) |
| 핀 78 | TMS — JTAG Test Mode Select |
| 핀 79 | TCK — JTAG Test Clock |
| 핀 80 | TDO — JTAG Test Data Out |
| 핀 81 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 82 | VCCIO — I/O supply voltage (3.3 V or 2.5 V) |
| 핀 83 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 84 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 85 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 86 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 87 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 88 | GND — Ground |
| 핀 89 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 90 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 91 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 92 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 93 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 94 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 95 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 96 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 97 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 98 | VCCINT — Core supply voltage (3.3 V) |
| 핀 99 | I/O — User I/O pin (macrocell bidirectional) |
| 핀 100 | I/O — User I/O pin (macrocell bidirectional) |
일반적인 애플리케이션
EPM3064ATC100-7N 적합 용도: 6 애플리케이션s: Industrial Bus Decoder and Address Mapping, Power Rail Sequencing and Reset Distribution, Automotive Body Electronics and I/O Expansion, Telecommunications Glue Logic and Backplane Bridging, Legacy 5V-to-3.3V System Upgrade, Test and Measurement Front-End Logic.
Industrial Bus Decoder and Address Mapping
The EPM3064ATC100-7N is well suited to industrial bus-interface glue-logic applications where deterministic 7.5 ns pin-to-pin propagation delay and non-volatile EEPROM configuration are critical. In a typical ISA/PCI bus decoder or address-mapping circuit, the device's 66 user I/O pins absorb the address latch, chip-select, and read/write arbitration logic that previously required multiple 74-series TTL chips, reducing board area while preserving timing predictability. The 3.3-V core with selectable 2.5-V VCCIO enables direct interface to 2.5-V ASICs and modern MCUs without external level shifters. With 64 macrocells and 2 Logic Array Blocks, designers can implement 30 to 50 equivalent 7400-series functions in a single TQFP-100 footprint, replacing an entire discrete logic cage.
추천
Power Rail Sequencing and Reset Distribution
The EPM3064ATC100-7N's instant-on non-volatile EEPROM configuration makes it ideal for power-rail sequencing and reset distribution in multi-rail processor and FPGA designs. Its 7.5 ns tPD and 166.7 MHz counter frequency enable precise delay generation, watchdog timers, and voltage-rail monitor fan-out that must execute within milliseconds of VCC stabilization - before the host MCU or FPGA has finished its boot ROM load. The 3.3-V VCCINT supply and 66 available I/O pins comfortably drive 4 to 8 enable signals plus PG (power-good) inputs, while the JTAG ISP chain enables in-field firmware updates via the IEEE Std. 1149.1 boundary-scan interface without removing the board from service.
추천
Automotive Body Electronics and I/O Expansion
The EPM3064ATC100-7N is used in automotive body-electronics modules for I/O expansion, BCM (body control module) signal conditioning, and LIN/CAN bus pre-processing where EEPROM-based non-volatile logic and a small footprint are required. Although the -7N itself is commercial grade, the same MAX 3000A silicon with industrial temperature variants enables deployment in cabin and under-hood subsystems. The 66 user I/O pins and 2 Logic Array Blocks comfortably handle multiplexed switch-scanning matrices, PWM fan-out, and headlamp-level controls. Selectable 3.3-V / 2.5-V VCCIO lets the device bridge older 5-V-tolerant MCUs to modern 2.5-V ASICs, simplifying mixed-voltage body-network designs.
추천
Telecommunications Glue Logic and Backplane Bridging
Telecommunications infrastructure equipment uses the EPM3064ATC100-7N for glue-logic bridging between legacy parallel buses (e.g., H.110, Intel x86 local bus) and modern serial interfaces (I2C, SPI, UART). The device's 66 user I/O pins and 7.5 ns tPD support address-latch, chip-select, and interrupt-aggregation functions on CompactPCI / ATCA backplanes where deterministic timing across temperature is essential. The JTAG ISP chain enables post-assembly boundary-scan test for production yield analysis, while the non-volatile configuration eliminates boot-time configuration delay - critical in hot-swap telecom line cards that must respond to bus enumeration within microseconds of insertion.
추천
Legacy 5V-to-3.3V System Upgrade
Designers migrating 5-V legacy systems to 3.3-V modern logic use the EPM3064ATC100-7N as a voltage-translation and glue-logic bridge. The VCCIO pins powered at 2.5 V or 3.3 V enable direct interfacing to downstream 2.5-V / 3.3-V ASICs without external level-shifters, while 5-V-tolerant I/O structures (per MAX 3000A datasheet) permit direct connection to legacy 5-V TTL outputs. The 64 macrocells provide enough capacity to absorb address decoding, chip-select generation, and timing-control logic from an entire 7400-series logic cage, while preserving deterministic 7.5 ns timing that synchronous legacy buses depend on.
추천
Test and Measurement Front-End Logic
Test and measurement instrument designers use the EPM3064ATC100-7N for front-end signal routing, multiplexer control, trigger synchronization, and range-switching logic. The device's deterministic 7.5 ns pin-to-pin delay enables precise timing alignment of analog-front-end (AFE) signal paths, while 66 user I/O pins comfortably handle 16-to-32 channel switching matrices with extra capacity for status LEDs and front-panel control. JTAG boundary-scan access simplifies production test fixtures, and the non-volatile configuration eliminates boot-time variability - critical for instruments that must be calibrated-ready within milliseconds of power-on.
추천
추천 제품 요약
엔지니어링 참조 데이터: EPM3064ATC100-7N — 비교, 설계 지침 및 규정 준수 정보.
선택 가이드
대체품과의 비교
| 파라미터 | 이 제품 | EPM3064ATC100-4N | EPM3064ATC100-7 | EPM3064ATC100-10N | EPM3064ATC100-10NA | EPM3064ATC100-4 | EPM3064ATC-100-10N | EPM3064AT100-10N |
|---|---|---|---|---|---|---|---|---|
| Brand | Altera | Altera | Altera | Altera | Altera | Altera | Altera | Altera |
| Package | TQFP-100 | TQFP-100 - same | TQFP-100 - same | TQFP-100 - same | TQFP-100 - same | TQFP-100 - same | TQFP-100 - same | TQFP-100 - same |
| Macrocells | 64 | 64 | 64 | 64 | 64 | 64 | 64 | 64 |
| User I/O | 66 | 66 | 66 | 66 | 66 | 66 | 66 | 66 |
| Speed Grade | -7 (7.5 ns tPD, 166.7 MHz) | -4 (faster, ~5.0 ns tPD) | -7 (same) | -10 (slower, ~10 ns tPD) | -10 (slower, ~10 ns tPD) | -4 (faster, ~5.0 ns tPD) | -10 (slower, ~10 ns tPD) | -10 (slower, ~10 ns tPD) |
| Lead Finish | Lead-free (Pb-free) | Lead-free | SnPb (leaded) | Lead-free | Lead-free | SnPb (leaded) | Lead-free | Lead-free |
| VCCINT | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V |
| VCCIO | 3.3 V or 2.5 V | 3.3 V or 2.5 V | 3.3 V or 2.5 V | 3.3 V or 2.5 V | 3.3 V or 2.5 V | 3.3 V or 2.5 V | 3.3 V or 2.5 V | 3.3 V or 2.5 V |
| Unit Price (1 pc, USD) | 11.50 | Higher (faster grade) | Similar (~11.50) | Lower (slower grade) | Lower | Higher (faster grade) | Lower | Lower |
주요 차별점
- Mid-speed grade balance of cost and timing margin (vs EPM3064ATC100-10N)
- Pb-free (RoHS-compliant) lead finish (vs EPM3064ATC100-7)
- Instant-on non-volatile EEPROM configuration (vs SRAM-based FPGAs (e.g., Cyclone))
- Standard 3.3-V VCCINT with selectable 2.5-V VCCIO (vs MAX 7000 (5-V) CPLDs)
설계 노트
The EPM3064ATC100-7N requires a stable 3.3-V VCCINT supply and 3.3-V or 2.5-V VCCIO; place 0.1 µF decoupling capacitors adjacent to every VCCINT/VCCIO pin and a single 10 µF bulk capacitor near the device. According to the MAX 3000A datasheet, the device draws ICCINT standby current during configuration load and higher transient current during EEPROM programming via JTAG; size the regulator accordingly to handle the in-system programming surge without sagging the rail.
TQFP-100 has a 0.5 mm lead pitch; follow JEDEC IPC-7351 land-pattern recommendations and use NSMD pads for improved solder-joint reliability on lead-free reflow profiles. According to MAX 3000A layout guidelines, route the JTAG TCK, TMS, TDI, TDO signals together as a chain and avoid stubs; place a 10 kΩ pull-up on TMS and TDI per IEEE Std. 1149.1 recommendations to keep the TAP controller in a defined state at power-up.
Do not assume all EPM3064ATC100-XX variants share JTAG chain order without re-checking - the BSDL file (per datasheet) defines the exact boundary-scan register length and IR length. When migrating between -7N, -7, -10N, and -4N, verify the Quartus II / Quartus Prime device selection matches the actual silicon revision, otherwise ISP programming will fail. Also note that the -7N is NRND; for new designs, plan migration to MAX II (EPM240T100C5N) or MAX V devices.
For designs that use the global clock and global clear nets at >100 MHz, route the GLOBAL/IN0 and GLOBAL/IN1 signals on inner PCB layers with adjacent ground reference and matched trace lengths to the device's clock-input pins. According to MAX 3000A AC specifications, the tPD parameter is specified at 66 user I/O loading; excessive load capacitance or long traces will degrade timing margins below the 7.5 ns worst-case specification.
규정 준수 정보
Lead-free / Pb-free terminal finish per Altera product page (the 'N' suffix indicates lead-free). Commercial 0-70 °C temperature grade; not AEC-Q100 qualified - choose industrial-grade MAX 3000A variant or MAX V migration path for automotive applications.