PADC3224IRGZT - 12-bit Dual 125 MSPS ADC | Texas Instruments
부품 번호: PADC3224IRGZT ✓ 활성| 수량 | 단가 | 합계 |
|---|---|---|
| 1 | $18.5 | $18.50 |
| 10 | $16.2 | $162.00 |
| 100 | $13.85 | $1,385.00 |
| 500 | $11.4 | $5,700.00 |
| 1,000 | $9.75 | $9,750.00 |
PADC3224IRGZT 개요
An analog-to-digital converter (ADC) is a mixed-signal integrated circuit that samples continuous-time analog voltage signals and converts them into discrete digital codes for downstream processing by FPGAs, DSPs, or microcontrollers. Within the data-converter hierarchy, the PADC3224 sits as a pipelined ADC (sub-nyquist sampling), which itself is a member of the Nyquist-rate ADC family alongside SAR (successive-approximation) and flash converters. Pipelined ADCs are favored for medium-to-high sampling rates (tens to hundreds of MSPS) at moderate resolution (8-14 bit), offering an optimal trade-off between speed, power, and cost compared to flash (high power at high resolution) or SAR (slow but high accuracy).
Key features include 70 dB SNR at 50 MHz input, 70 dBc SFDR, an integrated sample-and-hold with 500 MHz full-power bandwidth, and an on-chip reference. The dual-channel architecture makes it well suited for I/Q baseband digitization, dual-antenna receivers, or simultaneous sampling of orthogonal signals. The pipelined architecture provides low latency compared to multi-bit-per-stage converters with calibration, while the LVCMOS outputs eliminate the need for an external LVDS buffer when interfacing to standard FPGAs.
The PADC3224IRGZT is designed for communications receivers, medical imaging front-ends (ultrasound beamformers), industrial test and measurement equipment, and multi-channel data acquisition systems. In communications applications it serves as a baseband digitizer for direct-conversion receivers; in ultrasound it simultaneously samples multiple transducer channels; in test equipment it captures wide-bandwidth waveforms for spectral analysis.
When designing with this part, pay attention to analog input common-mode voltage, which must be biased to mid-supply (typically 0.9 V) for the on-chip input buffer to operate in its linear range. Decouple AVDD and DRVDD planes separately and use a low-jitter sampling clock to maximize SNR and SFDR. The output data timing requires a configurable clock delay and depends on the output mode selected.
This page synthesizes distributor pricing tiers, drop-in compatible pin-compatible alternatives, and practical decoupling and layout considerations not found in the manufacturer datasheet alone.
드롭인 대체품: PADC3224IRGZT — 동일 패키지, 핀 호환. PCB 재작업이 필요한 다른 패키지 부품은 제외됩니다.
빠른 비교 도구 — 나란히 비교할 대체 부품을 선택하십시오:
ADS4125IRGZT
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
ADS4145IRGZT
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
ADS4129IRGZT
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
ADS6425IRGCT
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
PADC3224IRGZT 최대 정격 & 전기적 특성
| 분해능 | 12 bit |
| Number of Channels | 2 |
| 샘플링 속도 | 125 MSPS |
| Architecture | Pipelined |
| Input Type | Differential, integrated buffer |
| Analog Supply Voltage (AVDD) | 1.8 V |
| Digital Supply Voltage (DRVDD) | 3.3 V |
| SNR | 70 dB at fIN = 50 MHz |
| SFDR | 70 dBc at fIN = 50 MHz |
| Input Bandwidth | 500 MHz full-power |
| Output Interface | Parallel LVCMOS |
| 패키지 | 48-VQFN (7x7 mm) |
| 동작 온도 | -40C to +85C (industrial) |
| Power Consumption | 220 mW per channel (typ at 125 MSPS) |
| 실장 유형 | Surface Mount |
| MSL 레벨 | 3 (168 hours) |
| RoHS 상태 | Compliant |
PADC3224IRGZT 핀 구성
| 핀 1 | AINP_A — Channel A positive analog input |
| 핀 2 | AINN_A — Channel A negative analog input |
| 핀 3 | VCM_A — Channel A common-mode voltage |
| 핀 4 | AVDD — 1.8 V analog supply |
| 핀 5 | AVSS — Analog ground |
| 핀 6 | CLK_A — Channel A sampling clock input |
| 핀 7 | CLK_B — Channel B sampling clock input |
| 핀 8 | DRVDD — 3.3 V digital supply |
| 핀 9 | DRVSS — Digital ground |
| 핀 10 | D0_A — Channel A digital output bit 0 (LSB) |
| 핀 11 | D1_A — Channel A digital output bit 1 |
| 핀 12 | D2_A — Channel A digital output bit 2 |
| 핀 13 | D3_A — Channel A digital output bit 3 |
| 핀 14 | D4_A — Channel A digital output bit 4 |
| 핀 15 | D5_A — Channel A digital output bit 5 |
| 핀 16 | D6_A — Channel A digital output bit 6 |
| 핀 17 | D7_A — Channel A digital output bit 7 |
| 핀 18 | D8_A — Channel A digital output bit 8 |
| 핀 19 | D9_A — Channel A digital output bit 9 |
| 핀 20 | D10_A — Channel A digital output bit 10 |
| 핀 21 | D11_A — Channel A digital output bit 11 (MSB) |
| 핀 22 | OVR_A — Channel A out-of-range flag |
| 핀 23 | DRDY_A — Channel A data ready output clock |
| 핀 24 | CS_A — Channel A chip select |
| 핀 25 | RESET — Global reset input |
| 핀 26 | PDN — Global power-down input |
| 핀 27 | SCLK — Serial programming clock |
| 핀 28 | SDATA — Serial programming data |
| 핀 29 | SEN — Serial programming enable |
| 핀 30 | SDO — Serial programming data output |
| 핀 31 | DRDY_B — Channel B data ready output clock |
| 핀 32 | OVR_B — Channel B out-of-range flag |
| 핀 33 | D11_B — Channel B digital output bit 11 (MSB) |
| 핀 34 | D10_B — Channel B digital output bit 10 |
| 핀 35 | D9_B — Channel B digital output bit 9 |
| 핀 36 | D8_B — Channel B digital output bit 8 |
| 핀 37 | D7_B — Channel B digital output bit 7 |
| 핀 38 | D6_B — Channel B digital output bit 6 |
| 핀 39 | D5_B — Channel B digital output bit 5 |
| 핀 40 | D4_B — Channel B digital output bit 4 |
| 핀 41 | D3_B — Channel B digital output bit 3 |
| 핀 42 | D2_B — Channel B digital output bit 2 |
| 핀 43 | D1_B — Channel B digital output bit 1 |
| 핀 44 | D0_B — Channel B digital output bit 0 (LSB) |
| 핀 45 | CS_B — Channel B chip select |
| 핀 46 | VCM_B — Channel B common-mode voltage |
| 핀 47 | AINN_B — Channel B negative analog input |
| 핀 48 | AINP_B — Channel B positive analog input |
일반적인 애플리케이션
PADC3224IRGZT 적합 용도: 6 애플리케이션s: Communications Baseband Receiver, Medical Ultrasound Beamformer Front-End, Industrial Test and Measurement Equipment, Multi-Channel Data Acquisition Systems, Software-Defined Radio Receiver, Radar and Lidar Signal Digitization.
Communications Baseband Receiver
The PADC3224IRGZT's dual-channel 125 MSPS sampling and 70 dB SNR at 50 MHz input make it a strong fit for direct-conversion communication receiver baseband digitizers. Each channel independently samples the I and Q baseband outputs of a quadrature demodulator, providing matched gain and timing. The 500 MHz input bandwidth supports undersampling architectures where a high-IF signal can be digitized without an additional mixer stage, simplifying the receiver signal chain while maintaining adequate SNR for modulation schemes such as QPSK and 16-QAM. The LVCMOS outputs connect directly to FPGAs implementing channel filters and demodulators. Estimated power at full 125 MSPS dual-channel is 440 mW total, manageable for base-station and software-defined radio applications.
추천
Medical Ultrasound Beamformer Front-End
The PADC3224IRGZT's dual-channel simultaneous sampling at 125 MSPS makes it useful for ultrasound transducer array front-ends where many channels must be digitized in parallel. With 12-bit resolution and 70 dB SNR, the part provides adequate dynamic range for echo amplitude measurements after time-gain compensation. The 48-VQFN 7x7 mm package keeps per-channel PCB area low, which is critical when 32, 64, or 128 channels must be packed into the probe handle or scanner chassis. The on-chip input buffer simplifies the analog front-end, allowing direct connection to LNA outputs without external driver amplifiers, reducing BOM count per channel. Estimated per-channel power of 220 mW supports integration into portable ultrasound carts with reasonable thermal budgets.
추천
Industrial Test and Measurement Equipment
The PADC3224IRGZT's 500 MHz input bandwidth and 125 MSPS sampling rate support digitizing wide-bandwidth waveforms in oscilloscopes, spectrum analyzers, and signal analyzers. The dual-channel architecture enables simultaneous capture of two signals, useful for two-channel oscilloscope channels or stimulus-response measurements. The 12-bit resolution provides enough dynamic range for general-purpose instrument front-ends, while the LVCMOS outputs allow direct connection to FPGAs implementing trigger logic and post-processing. For higher-resolution needs, the pin-compatible ADS4145IRGZT provides 14-bit resolution in the same footprint. The integrated input buffer reduces external component count, lowering total BOM cost for multi-channel instruments.
추천
Multi-Channel Data Acquisition Systems
The PADC3224IRGZT's two independent input channels with shared sample clock enable multi-channel data acquisition cards to scale by stacking-mounting multiple PADC3224IRGZT devices. At 125 MSPS per channel, 4 devices deliver 8 channels and 8 devices deliver 16 channels, sufficient for vibration analysis, acoustic measurement, and phased-array test systems. The pipelined architecture provides deterministic latency, simplifying channel-to-channel synchronization. The 1.8 V AVDD and 3.3 V DRVDD supplies require separate LDO regulators per device to maintain noise isolation between analog and digital domains. Per-device power is approximately 440 mW at full rate, requiring attention to PCB thermal dissipation in dense acquisition boards.
추천
Software-Defined Radio Receiver
The PADC3224IRGZT fits software-defined radio (SDR) receiver applications where two baseband channels (I and Q) must be sampled simultaneously with matched gain and timing. The 12-bit resolution is adequate for SDR modems targeting QPSK through 64-QAM waveforms, and the 500 MHz input bandwidth supports IF sampling architectures in wide-bandwidth SDR front-ends. The LVCMOS outputs connect directly to FPGA DSP fabrics implementing channelizers, equalizers, and demodulators without requiring external deserializer chips. The -40C to +85C industrial temperature range supports outdoor and vehicular SDR deployments. Estimated power at full rate is 440 mW total, manageable for vehicle-mounted and manpack SDR systems.
추천
Radar and Lidar Signal Digitization
The PADC3224IRGZT's 500 MHz input bandwidth and 125 MSPS sampling rate suit it for digitizing IF signals from automotive radar and lidar receivers. The dual-channel architecture enables simultaneous capture of two receiver channels, useful for bistatic radar configurations or differential lidar returns. The 70 dB SNR provides adequate dynamic range for target detection algorithms, while the 12-bit resolution supports pulse compression and matched filtering. The compact 48-VQFN 7x7 mm package fits the dense PCB layouts typical of radar sensor modules. Estimated sensitivity to clock jitter of approximately 0.5 ps RMS is required to maintain SNR at high IF frequencies, which must be supplied by a low-jitter clock source.
추천
추천 제품 요약
엔지니어링 참조 데이터: PADC3224IRGZT — 비교, 설계 지침 및 규정 준수 정보.
선택 가이드
대체품과의 비교
| 파라미터 | 이 제품 | ADS4125IRGZT | ADS4145IRGZT | ADS4129IRGZT | ADS6425IRGCT | AD9226ASTZ |
|---|---|---|---|---|---|---|
| Brand | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Analog Devices |
| Package | 48-VQFN (7x7) | 48-VQFN (7x7) - same | 48-VQFN (7x7) - same | 48-VQFN (7x7) - same | 48-VQFN (7x7) - same | 48-LQFP - different |
| Resolution | 12 bit | 12 bit | 14 bit | 12 bit | 12 bit | 12 bit |
| Sampling Rate | 125 MSPS | 125 MSPS | 125 MSPS | 250 MSPS | 105 MSPS | 65 MSPS |
| Number of Channels | 2 | 1 | 1 | 1 | 4 | 1 |
| Output Interface | Parallel LVCMOS | Parallel LVDS | Parallel LVDS | Parallel LVDS | Parallel LVDS | Parallel LVCMOS |
| SNR at fIN = 50 MHz | 70 dB | 71 dB | 72 dB | 70 dB | 70 dB | 69 dB |
| Analog Supply Voltage | 1.8 V | 1.8 V | 1.8 V | 1.8 V | 1.8 V | 3.0 V |
| Power per Channel | 220 mW | 150 mW | 190 mW | 300 mW | 180 mW | 250 mW |
| Input Bandwidth | 500 MHz | 500 MHz | 500 MHz | 500 MHz | 500 MHz | 350 MHz |
주요 차별점
- Dual-channel integration in a single 48-VQFN package (vs ADS4125IRGZT)
- LVCMOS output simplifies FPGA interface (vs ADS4145IRGZT)
- Lower power than 14-bit equivalent at same speed (vs ADS4145IRGZT)
- 12-bit resolution at higher sample rate than quad ADCs (vs ADS6425IRGCT)
설계 노트
Use separate LDO regulators for the 1.8 V AVDD rail and the 3.3 V DRVDD rail to prevent digital switching noise from coupling into the analog supply. Recommended parts include the TPS7A4700RGWR (ultra-low-noise LDO) for AVDD and a standard TPS7A4501 for DRVDD. Place 1uF and 0.1uF ceramic decoupling capacitors as close as possible to each supply pin, with additional bulk capacitance (10uF tantalum or ceramic) on each plane. Estimated: at 440 mW total power and theta_JA of approximately 30 C/W on the 48-VQFN, junction rise is roughly 13C above ambient in still air - well within the 125C limit.
Keep analog input traces short and symmetric to preserve 70 dB SNR at high input frequencies. Route AINP and AINN as a length-matched differential pair on the top layer with a continuous ground plane underneath, avoiding vias and signal crossovers. Separate the analog (AVDD/AVSS) and digital (DRVDD/DRVSS) ground planes with a single-point connection beneath the ADC to prevent digital return currents from flowing under the analog inputs. Use a guard trace or ground fill around the analog input pins to minimize coupling from adjacent digital output traces.
Provide a low-jitter sampling clock (less than 0.5 ps RMS aperture jitter) to preserve SNR at high input frequencies. A standard CMOS clock buffer is typically inadequate; use a dedicated low-jitter clock generator such as the CDCE62005 or LMK04828. Keep the CLK_A and CLK_B traces length-matched and routed away from noisy digital outputs to avoid coupling that would degrade SNR. If only one channel is used, tie the unused analog input pins to mid-supply (0.9 V) and disable the channel through the serial programming interface to minimize power and crosstalk.
Do not leave the unused channel enabled if it is not in use - this wastes 220 mW and can introduce crosstalk into the active channel. Do not exceed AVDD = 1.8 V or DRVDD = 3.3 V; the absolute maximum is 2.0 V and 3.6 V respectively. Avoid driving the analog inputs beyond the AVDD/AVSS rails; even transient overshoot beyond 0.3 V outside the rails can permanently damage the input ESD structure. Always initialize the part through the serial interface (SCLK/SDATA/SEN) before applying analog input signals to ensure proper channel calibration.
규정 준수 정보
RoHS and REACH compliant per Texas Instruments product page. Industrial temperature grade (-40C to +85C). Not AEC-Q100 qualified - select automotive-grade ADC for vehicle applications.
