RTAX250SL-CG624E vs RTAX250S-CG624E Сравнение
Подробное сравнение бок о бок RTAX250SL-CG624E от Microchip Technology и RTAX250S-CG624E от Microchip Technology. Сравните ключевые характеристики, электрические параметры, упаковку, статус жизненного цикла, цены и наличие, чтобы выбрать лучший компонент для ваших требований.
Microchip Technology
RTAX250SL-CG624E - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250SL-CG624E ✓ АктивенMicrochip Technology
RTAX250S-CG624E - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250S-CG624E ✓ АктивенСравнение характеристик
| Параметр | RTAX250SL-CG624E | RTAX250S-CG624E |
|---|---|---|
| Бренд | Microchip Technology | Microchip Technology |
| Категория | FPGA & CPLD | FPGA & CPLD |
| Статус жизненного цикла | Активен | Активен |
| Наличие | In Stock | In Stock |
| Цена за единицу (USD) | $1.375,00 | $0,00 |
| Family | RTAX-S/SL Radiation-Tolerant FPGA | RTAX-S radiation-tolerant FPGA |
| System Gates | 250000 | 250000 gates |
| Logic Cells (CLBs) | 2816 | 2816 |
| Maximum Frequency | 649 MHz | — |
| Process Technology | 0.15 um CMOS | 0.15 um CMOS |
| Core Supply Voltage | 1.5 V | 1.5 V |
| Supply Voltage Tolerance | +/-0.15 V | — |
| Maximum Combinatorial Delay | 0.93 ns | — |
| Корпус | 624-Pin CCGA (Ceramic Column Grid Array) | — |
| Рабочая температура | -55C to +125C | -55C to +125C |
| Logic Family | CMOS | CMOS |
| Radiation Tolerance | SEU-hardened registers; SEU rate < 10-10 errors/bit-day | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | — |
| Clocking | Segmentable clocks, chip-wide highway routing | — |
| Тип монтажа | Surface Mount | Surface Mount |
| Статус RoHS | [DATA_NEEDED: RoHS status] | — |
| Programmability | Live at power-up, true single-chip | — |
| Maximum Toggle Frequency | — | 649 MHz |
| CLB Combinatorial Delay (max) | — | 0.930 ns |
| Package Type | — | CCGA-624 (ceramic column grid array, 624 pins) |
| Programming Technology | — | Antifuse (one-time programmable) |
| SEU Hardening | — | SEU-hardened registers, no external TMR required |
| SEU Immunity | — | Immune to single-event upsets to specified LET threshold; SEU rate < 10-10 errors/bit-day |
| Power-Up Behavior | — | Live at power-up (true single-chip) |
| Target Application | — | Space-flight systems |