EP1K30QC208-1 vs EP1K30QC208-2N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K30QC208-1 sa pamamagitan ng Intel at EP1K30QC208-2N sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K30QC208-1 | EP1K30QC208-2N |
|---|---|---|
| Brand | Intel | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Device Family | ACEX-1K | — |
| Logic Elements (LEs) | 1,728 | — |
| Equivalent Gates | 30,000 | — |
| Logic Array Blocks (LABs) | 216 | — |
| Embedded Memory (EAB) | 24,576 bits | — |
| Maximum User I/O | 147 | — |
| Core Supply Voltage (VCCINT) | 2.5 V (2.375 V to 2.625 V) | 2.5 V |
| Packhaging | 208-BFQFP (Plastic Quad Flat Pack, PQFP208) | — |
| Terminal Pitch | 0.500 mm | — |
| Uri ng Pagpapasok | Surface Mount (gull-wing leads) | Surface Mount |
| Temperature na Operasyon | 0 °C to +70 °C (commercial) | 0°C to +70°C (commercial) |
| Maximum Operating Frequency | up to 250 MHz (family typical) | — |
| Process Technology | 2.5 V CMOS | — |
| Configuration Method | SRAM, in-system reconfigurable (volatile) | SRAM (volatile) - serial/parallel/JTAG |
| Boundary-Scan Test | JTAG IEEE 1149.1 | — |
| I/O Voltage Support | 2.5 V / 3.3 V (multi-volt I/O) | — |
| Configuration Device Support | EPC2, EPC4, EPC8 Enhanced Configuration Devices | — |
| Tindminan RoHS | Compliant (lead-free) | unknown (legacy part, pre-RoHS-era design) |
| Series | — | ACEX 1K |
| Family | — | ACEX 1K |
| Logic Elements / Cells | — | 1,728 |
| Typical Gates | — | 30,000 |
| Total RAM Bits | — | 24,576 (24 Kbit embedded memory) |
| Number of LABs/CLBs | — | 216 |
| Number of I/O | — | 147 |
| Number of Gates | — | 30,000 |
| Technology Node | — | 0.22 µm CMOS |
| Operating Frequency (max) | — | 200 MHz |
| Packhaging / Kaso | — | 208-BFQFP (PQFP) |