EP1K50TC144-3N vs EPF10K50STC144-3 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K50TC144-3N sa pamamagitan ng Intel at EPF10K50STC144-3 sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K50TC144-3N | EPF10K50STC144-3 |
|---|---|---|
| Brand | Intel | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Series | ACEX-1K | FLEX 10KS |
| Family | ACEX 1K Programmable Logic Device Family | FLEX 10K |
| Logic Elements / Cells | 2880 | 2,880 |
| System Gates | 40960 (50K nominal) | — |
| Number of LABs/CLBs | 360 | — |
| Embedded Memory (EAB) | 40 kbit (12 EABs, dual-port) | — |
| User I/O Count | 102 | — |
| Number of Gates | 199000 (maximum) | — |
| Operating Frequency (Max) | 166.67 MHz | — |
| Core Voltage | 2.5 V | 2.5 V |
| I/O Voltage Support | 2.5 V / 3.3 V / 5.0 V (multiVolt) | — |
| Process Technology | 0.22 µm CMOS | 0.22 um CMOS, SRAM-based |
| Logic Delay (pin-to-pin) | 5.0 ns | — |
| Packhaging | 144-LQFP (TQFP-144), 22 x 22 mm, 0.5 mm pitch | 144-LQFP (also called LFQFP / TQFP) |
| Programming Interface | JTAG (IEEE 1149.1) / Altera serial | — |
| Operating Temperature Grade | Commercial (0 °C to +70 °C) — inferred from '-N' suffix | — |
| Uri ng Pagpapasok | Surface Mount | Surface Mount (Gull-wing leads) |
| Tindminan RoHS | Compliant | [DATA_NEEDED: RoHS status] |
| Typical Gates | — | 50,000 |
| Logic Array Blocks (LABs) | — | 360 |
| On-chip RAM Bits | — | 40,960 |
| Maximum User I/Os | — | 102 |
| Number of I/O Banks | — | [DATA_NEEDED: number of I/O banks] |
| Internal Operating Frequency | — | 166.67 MHz |
| Propagation Delay | — | 0.6 ns (typical) |
| Speed Grade | — | -3 |
| I/O Voltage | — | 5.0 V (3.3 V LVTTL/LVCMOS compatible) |
| Temperature na Operasyon | — | 0 C to 70 C (commercial) |
| Configuration | — | SRAM (volatile, requires external EPC) |
| JTAG Boundary Scan | — | Built-in, IEEE Std. 1149.1-1990 compliant |