EP610IDC-15 vs EP610IDC-10 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP610IDC-15 sa pamamagitan ng Intel at EP610IDC-10 sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP610IDC-15 | EP610IDC-10 |
|---|---|---|
| Brand | Intel | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Huling Pagbili | Obsolete |
| Device Family | Altera Classic EPLD | Altera Classic EPLD |
| Macrocells | 16 | — |
| Usable Gates | 300 | — |
| Propagation Delay (tPD) | 15 ns | — |
| Maximum Frequency | 66 MHz | — |
| Supply Voltage (VCC) | 4.75 V to 5.25 V (5 V nominal) | 5 V (nominal) |
| Temperature na Operasyon | 0C to +70C (commercial) | — |
| Process Technology | CMOS, UV-erasable / OTP | — |
| Packhaging | 24-pin CerDIP (ceramic DIP) | — |
| Uri ng Pagpapasok | Through-hole | Through-hole |
| I/O Pins | 24 (per package; macrocell-programmable) | 20 |
| Logic-Block Architecture | AND/OR macrocell array with programmable flip-flops | — |
| Program/Erase | UV-erasable, OTP-compatible | — |
| Development Tool | MAX+PLUS II | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS status of CerDIP variant] | [DATA_NEEDED: RoHS status of CDIP-10 variant] |
| Programming Current | 11.0 mA typical (per Classic family datasheet) | — |
| Logic Capacity | — | 300 usable gates |
| Macrocell Count | — | 16 macrocells |
| Pin-to-Pin Logic Delay (tpd) | — | 10 ns |
| Maximum Counter Frequency (fCNT) | — | 100 MHz |
| I/O Logic Compatibility | — | 100% TTL emulation |
| Technology | — | CMOS, UV-erasable (windowed ceramic) |
| Package Type | — | 24-pin Ceramic DIP (CDIP) |
| Dedicated Inputs | — | 4 |
| Hanay ng Temperature na Operasyon | — | 0 °C to +70 °C (commercial) |
| Programmable Interconnect | — | Yes (on-chip) |
| In-System Programmability | — | Yes (via MAX+PLUS II) |
| Boundary-Scan Test | — | Yes (per device documentation) |