EPF10K200SRC240-1 vs EPF10K200SRC240-3N Ikinahambing

Detalyadong pagkakahiwalay na pagkakahambing ng EPF10K200SRC240-1 sa pamamagitan ng Intel at EPF10K200SRC240-3N sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.

Pagsanggunian na paghahambing

Parametro EPF10K200SRC240-1 EPF10K200SRC240-3N
Brand Intel Intel
Kategorya FPGA & CPLD FPGA & CPLD
Katayuan ng Lifecycle NRND Obsolete
Manufacturer Intel (formerly Altera) —
Series FLEX-10KS —
Family FLEX 10K Embedded Programmable Logic FLEX 10KE
Device Type FPGA - Field Programmable Gate Array —
Number of Logic Elements 9984 —
Number of LABs (Logic Array Blocks) 1248 —
Number of EABs (Embedded Array Blocks) 24 —
Total EAB RAM Bits 40960 —
Total SRAM Bits 98304 —
Typical System Gates 200000 200,000
Maximum System Gates 513000 —
Number of I/O Pins 182 —
Supply Voltage - Core 5.0 V —
Supply Voltage - I/O 3.3 V / 5.0 V (multiVolt) —
Uri ng Pagpapasok Surface Mount Surface Mount
Temperature na Operasyon -40C to +85C (industrial) 0 °C to +70 °C (Commercial)
Packhaging / Kaso 240-BFQFP Exposed Pad (RQFP-240) —
Supplier Device Package 240-RQFP (32x32 mm) —
Speed Grade -1 (fastest) -3 (commercial)
Programmability SRAM-based, in-system via JTAG —
JTAG (IEEE 1149.1) Yes —
Tindminan RoHS [DATA_NEEDED: rohs status] [DATA_NEEDED: RoHS status]
Lead-Free [DATA_NEEDED: lead-free status] —
Logic Elements (LEs) — 9,984
Maximum Logic Elements — 9,984
Embedded Array Blocks (EABs) — 24
Maximum User RAM Bits — 98,304
Logic Array Blocks (LABs) — 1,248
User I/Os — 470 (effective); 182 user pins per RQFP-240 with the rest assigned to dedicated functions
Propagation Delay (tPD) — 0.40 ns
Internal Operating Frequency — 166.67 MHz
Process Technology — 0.22 µm CMOS SRAM
Core Supply Voltage — 2.5 V
MultiVolt I/O Support — 2.5 V and 3.3 V interfaces
Packhaging — 240-pin RQFP (Power QFP) with exposed pad, 34.6 x 34.6 mm, 0.5 mm pitch
JTAG Support — IEEE Std 1149.1 Boundary-Scan (contributes up to 31,250 gates of test logic)
Configuration Method — SRAM-based; requires external configuration device (e.g., EPC2) for power-up loading

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