EPF8282ATI100-3N vs EPF8282ATC100-3 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPF8282ATI100-3N sa pamamagitan ng Altera at EPF8282ATC100-3 sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EPF8282ATI100-3N | EPF8282ATC100-3 |
|---|---|---|
| Brand | Altera | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Family | FLEX 8000 | FLEX 8000 |
| Logic Cells | 208 | — |
| Logic Array Blocks (LABs) | 26 | — |
| Usable Gates | 2,500 | 2,500 |
| User I/Os | 78 | — |
| Maximum Operating Frequency | 125 MHz | — |
| Process Technology | 0.42 um CMOS SRAM | 0.42 micron CMOS SRAM |
| Core Supply Voltage (VCCINT) | 5 V | — |
| I/O Supply Voltage (VCCIO) | 3.3 V or 5.0 V | — |
| Packhaging | 100-pin TQFP | 100-pin TQFP (100-TQFP) |
| Uri ng Pagpapasok | Surface Mount | — |
| Temperature na Operasyon | 0C to +70C | — |
| Configuration Memory | SRAM (volatile) | — |
| Configuration Devices Supported | EPC1, EPC1064, EPC1213, EPC1441 | — |
| In-Circuit Reconfigurability | Yes (ICR) | — |
| Boundary-Scan Support | IEEE 1149.1 JTAG | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS status] | — |
| Logic Cells (LEs) | — | 208 |
| Typical Gates Equivalent | — | 12,000 |
| Maximum User I/O | — | 78 |
| Number of Logic Array Blocks (LABs) | — | 26 |
| Embedded Array Blocks (EABs) | — | 6 |
| Total RAM Bits | — | 12 Kbits |
| Supply Voltage (Core) | — | 5 V |
| MultiVolt I/O Support | — | 3.3 V / 5 V |
| Maximum Frequency | — | 125 MHz |
| Speed Grade | — | -3 |
| Configuration Method | — | SRAM, EPC1/EPC1064/EPC1213/EPC1441, microprocessor |
| Operating Temperature (Commercial) | — | 0 C to +70 C |
| In-Circuit Reconfigurable | — | Yes (ICR) |
| Boundary Scan | — | JTAG IEEE 1149.1 |