RTAX2000SL-1LG624V vs RTAX2000SL-1CGS624V Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng RTAX2000SL-1LG624V sa pamamagitan ng Microchip Technology at RTAX2000SL-1CGS624V sa pamamagitan ng Microsemi. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Microchip Technology
RTAX2000SL-1LG624V - 2M-Gate Rad-Tolerant FPGA | Microchip
RTAX2000SL-1LG624V ✓ NakahandaMicrosemi
RTAX2000SL-1CGS624V - 2M-Gate Rad-Tolerant FPGA | Actel/Microchip
RTAX2000SL-1CGS624V ✓ NakahandaPagsanggunian na paghahambing
| Parametro | RTAX2000SL-1LG624V | RTAX2000SL-1CGS624V |
|---|---|---|
| Brand | Microchip Technology | Microsemi |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Aktibo | Aktibo |
| Logic Cells | 32256 | — |
| CLBs (Configurable Logic Blocks) | 21504 | — |
| Equivalent Gates | 2000000 (approx.) | — |
| Family | RTAX-S/SL (radiation-tolerant FPGA) | — |
| Process Variant | SL (super low-power) CMOS | — |
| Core Supply Voltage | 1.5 V (nominal) | [DATA_NEEDED: core supply voltage] |
| Temperature na Operasyon | -55C to +125C | [DATA_NEEDED: operating temperature range] |
| Packhaging | 624-terminal ceramic CGA (CG624) | 624-ball ceramic CGA (CGS624) |
| Uri ng Pagpapasok | Surface Mount (column grid array) | Surface Mount |
| Programming Technology | Anti-fuse, one-time programmable | — |
| Configuration | Live at power-up, single-chip (no external config storage) | One-time programmable (OTP), live at power-up, single chip |
| Radiation Tolerance | Radiation-tolerant for space flight systems | — |
| Speed Grade | -1 | -1 |
| Application Class | Space flight / aerospace | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS status] | — |
| Embedded Memory | [DATA_NEEDED: embedded SRAM bits] | Up to 540 kbits with optional EDAC |
| Equivalent System Gates | — | 2000000 |
| Logic Cells (CLBs) | — | 21504 |
| User I/Os (max, package dependent) | — | Up to 684 |
| Total Ionizing Dose (TID) | — | 300 krad (functional), 200 krad (parametric) |
| SEU Rate | — | Less than 1E-10 errors per bit-day |
| Technology | — | Digital CMOS, antifuse nonvolatile |
| Quality / Screening Suffix | — | S (space flow), V suffix qualification level |
| I/O Supply Voltage | — | [DATA_NEEDED: I/O supply voltage] |
| Embedded SRAM Features | — | Built-in FIFO control logic |
| Clocking | — | Segmentable clocks, chip-wide highway routing |