RTAX250S-1LG624B vs RTAX2000SL-1CGS624V Ikinahambing

Detalyadong pagkakahiwalay na pagkakahambing ng RTAX250S-1LG624B sa pamamagitan ng Microchip Technology at RTAX2000SL-1CGS624V sa pamamagitan ng Microsemi. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.

Microchip Technology
RTAX250S-1LG624B RTAX250S-1LG624B - Rad-Tolerant FPGA 250K Gates | Microchip

RTAX250S-1LG624B - Rad-Tolerant FPGA 250K Gates | Microchip

RTAX250S-1LG624B ✓ Nakahanda
Microsemi
RTAX2000SL-1CGS624V RTAX2000SL-1CGS624V - 2M-Gate Rad-Tolerant FPGA | Actel/Microchip

RTAX2000SL-1CGS624V - 2M-Gate Rad-Tolerant FPGA | Actel/Microchip

RTAX2000SL-1CGS624V ✓ Nakahanda

Pagsanggunian na paghahambing

Parametro RTAX250S-1LG624B RTAX2000SL-1CGS624V
Brand Microchip Technology Microsemi
Kategorya FPGA & CPLD FPGA & CPLD
Katayuan ng Lifecycle Aktibo Aktibo
Family RTAX-S Radiation-Tolerant FPGA —
Equivalent System Gates 250000 gates 2000000
Logic Cells (Modules) 2816 cells —
Registers / Logic Cells Total 4224 logic cells —
User I/O 248 I/O —
Core Supply Voltage 1.5 V [DATA_NEEDED: core supply voltage]
Maximum System Frequency 649 MHz —
Process Technology 0.15 um CMOS —
Speed Grade -1 -1
Packhaging 624-Pin LGA (LG624), ceramic 624-ball ceramic CGA (CGS624)
Temperature na Operasyon -55C to +125C [DATA_NEEDED: operating temperature range]
Configuration Anti-fuse, live at power-up (single chip) One-time programmable (OTP), live at power-up, single chip
Embedded Memory Embedded SRAM with built-in FIFO control logic Up to 540 kbits with optional EDAC
Radiation Tolerance Radiation-tolerant (RTAX-S class, per Microchip RTAX-S datasheet) —
Uri ng Pagpapasok Surface Mount Surface Mount
Program Numbering B = Military program-level screening —
Tindminan RoHS [DATA_NEEDED: RoHS status] —
Level ng MSL [DATA_NEEDED: moisture sensitivity level] —
Logic Cells (CLBs) — 21504
User I/Os (max, package dependent) — Up to 684
Total Ionizing Dose (TID) — 300 krad (functional), 200 krad (parametric)
SEU Rate — Less than 1E-10 errors per bit-day
Technology — Digital CMOS, antifuse nonvolatile
Quality / Screening Suffix — S (space flow), V suffix qualification level
I/O Supply Voltage — [DATA_NEEDED: I/O supply voltage]
Embedded SRAM Features — Built-in FIFO control logic
Clocking — Segmentable clocks, chip-wide highway routing

Mga Datasheets at Resources

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