EPM3064ATI44-10 vs EPM3064ATC44-7N Karşılaştırma
Ayrıntılı yan yana karşılaştırma EPM3064ATI44-10 tarafından Intel ve EPM3064ATC44-7N tarafından AlteraAnahtar özellikleri, elektriksel parametreleri, ambalajı, yaşam döngüsü durumu, fiyatlandırma ve mevcudiyeti karşılaştırarak tasarım gereksinimleriniz için en iyi bileşeni belirleyin.
Özellik Karşılaştırması
| Parametre | EPM3064ATI44-10 | EPM3064ATC44-7N |
|---|---|---|
| Marka | Intel | Altera |
| Kategori | FPGA & CPLD | FPGA & CPLD |
| Yaşam Döngüsü Durumu | NRND | Obsolete |
| Family | MAX 3000A | MAX 3000A |
| Product Type | CPLD (Complex Programmable Logic Device) | — |
| Programmable Type | In-System Programmable (ISP), EEPROM-based | — |
| Number of Macrocells | 64 | — |
| Number of Logic Array Blocks (LABs) | 4 | — |
| Number of Usable Gates | 1,250 | — |
| Number of User I/O Pins | 34 | — |
| Paket | TQFP-44 (10x10 mm, 0.8 mm pitch) | 44-pin TQFP |
| Pin-to-Pin Delay (tPD) | 10 ns | 7.5 ns |
| Maximum Counter Frequency | 227.3 MHz | 192.3 MHz (-7 grade) |
| Supply Voltage (VCCINT) | 3.3 V | — |
| I/O Voltage Tolerance | 5.0 V tolerant (MultiVolt I/O) | — |
| JTAG Interface | IEEE Std. 1149.1 compliant | IEEE Std. 1149.1 compliant |
| ISP Standard | IEEE Std. 1532 | IEEE Std. 1532 compliant |
| İşletim Sıcaklığı | -40C to +85C (Industrial) | 0°C to +85°C (commercial) |
| RoHS Durumu | Non-Compliant (contains lead, per DigiChip listing) | Compliant |
| Lead Free Status | Contains Lead | — |
| Montaj Türü | Surface Mount | Surface Mount |
| Process Technology | CMOS, EEPROM | — |
| Programming Cycles | [DATA_NEEDED: typical program/erase endurance] | — |
| Device Type | — | CPLD (Complex Programmable Logic Device) |
| Macro Cells | — | 64 |
| Logic Array Blocks | — | 2 |
| Usable Gates | — | 1,250 |
| User I/O Pins | — | 34 |
| Pin Sayısı | — | 44 |
| Speed Grade | — | -7 (7.5 ns pin-to-pin delay) |
| Supply Voltage (VCC) | — | 3.3 V |
| MultiVolt I/O | — | 1.8 V / 2.5 V / 3.3 V |
| Programmability | — | EEPROM, in-system programmable (ISP) |
| Boundary-Scan Test (BST) | — | Built-in, JTAG-driven |