MT29F1G08ABAEAWP-IT:E vs MX30LF1GE8AB-TI-TR 比較

詳細並排比較 MT29F1G08ABAEAWP-IT:E 由 Micron Technology 與 MX30LF1GE8AB-TI-TR 由 Macronix. 比較關鍵規格、電氣參數、封裝、生命週期狀態、價格與供貨情況,以找出最符合您設計需求的元件。

Micron Technology
MT29F1G08ABAEAWP-IT:E MT29F1G08ABAEAWP-IT:E - 1Gbit SLC NAND Flash | Micron

MT29F1G08ABAEAWP-IT:E - 1Gbit SLC NAND Flash | Micron

MT29F1G08ABAEAWP-IT:E ✓ 啟用中

規格比較

參數 MT29F1G08ABAEAWP-IT:E MX30LF1GE8AB-TI-TR
品牌 Micron Technology Macronix
類別 Memory ICs Memory ICs
生命週期狀態 啟用中 啟用中
記憶體容量 1 Gbit (128 MB) —
組織 128M x 8 —
介面 Parallel —
供應電壓 3.3 V —
Access Time 25 ns —
Page Size 2048 bytes + 64 bytes spare 2112 bytes (2048 data + 64 spare)
Block Size 128 KB 64 pages (128 KB + 4 KB spare)
Program Time 200 us (typical) —
Erase Time 2 ms (typical) —
Endurance 100K program/erase cycles —
Data Retention 10 years 10 years (typical)
工作溫度 -40C to +85C -40 C to +85 C (industrial)
封裝 TSOP-48 48-pin TSOP-I (Type I)
安裝類型 Surface Mount Surface Mount
RoHS 狀態 Compliant Compliant
記憶體類型 — Non-Volatile NAND Flash (SLC)
Memory Organization — 128 M x 8
Density — 1 Gbit (1024 Mbit)
介面類型 — Parallel Asynchronous (ONFI 1.0)
Cell Technology — Single-Level Cell (SLC)
Number of Blocks — 1024
Access Time (tR) — 20 ns / 25 ns (grade dependent)
Supply Voltage (VCC) — 2.7 V to 3.6 V
Active Read Current (ICC1) — 15 mA typical
Program / Erase Current (ICC2) — 15 mA typical
Program / Erase Endurance — 100 K cycles per block (typical)
ECC Architecture — ECC-Free (external host ECC required)
Compliance Standard — ONFI 1.0
Bad Block Mark — 00h on 1st and 2nd page (per datasheet v1.3)
Bad Block Indicator — Marked at 1st and 2nd page (00h) per datasheet v1.3
R/B# Power-On Delay — 100 us (per datasheet v1.3)

資料表與資源

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