RTAX1000SL-CQ352PROTO vs RTAX1000SL-CQ352V 比較
詳細並排比較 RTAX1000SL-CQ352PROTO 由 Microchip Technology 與 RTAX1000SL-CQ352V 由 Microchip Technology. 比較關鍵規格、電氣參數、封裝、生命週期狀態、價格與供貨情況，以找出最符合您設計需求的元件。
Microchip Technology
RTAX1000SL-CQ352PROTO - 1M-Gate Rad-Tolerant FPGA | Microchip
RTAX1000SL-CQ352PROTO ✓ 啟用中Microchip Technology
RTAX1000SL-CQ352V - 1M-Gate Rad-Tolerant FPGA | Microchip
RTAX1000SL-CQ352V ✓ 啟用中規格比較
| 參數 | RTAX1000SL-CQ352PROTO | RTAX1000SL-CQ352V |
|---|---|---|
| 品牌 | Microchip Technology | Microchip Technology |
| 類別 | FPGA & CPLD | FPGA & CPLD |
| 生命週期狀態 | 啟用中 | 啟用中 |
| Family | RTAX-S/SL Radiation-Tolerant FPGAs | RTAX-SL (RTAX-S/SL Radiation-Tolerant FPGAs) |
| Equivalent System Gates | 1,000,000 | 1,000,000 |
| Logic Cells | 18144 | 18,144 |
| CLBs | 12096 | — |
| Core Supply Voltage | 1.5 V nominal (1.425 V to 1.575 V) | — |
| Process Technology | CMOS 0.15 um | 0.15 um CMOS |
| Configuration Technology | Antifuse (one-time programmable), live at power-up | — |
| 封裝 | 352-terminal ceramic metal-sealed cofired CQFP (CQ352) | 352-pin Ceramic CQFP (CQ352V) |
| 工作溫度 | -55C to +125C | [DATA_NEEDED: operating temperature range] |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Clock Architecture | Segmentable clocks, chip-wide highway routing | — |
| Carry Chains | Yes (arithmetic carry support) | — |
| Application Space | Space-flight systems, radiation-tolerant | — |
| Build Variant | PROTO (prototyping/engineering build) | — |
| 安裝類型 | Surface Mount | Surface Mount |
| RoHS 狀態 | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS compliance status] |
| Max Toggle Frequency | [DATA_NEEDED: maximum frequency] | — |
| CLBs (Logic Modules) | — | 12,096 |
| Maximum Toggle Frequency | — | 581 MHz |
| Core Voltage | — | 1.5 V |
| Programming Technology | — | Antifuse (one-time programmable) |
| Radiation Tolerance | — | Radiation-tolerant, space-flight qualified family |
| Power-Up Behavior | — | Live at power-up (non-volatile) |
| Configuration Upset Immunity | — | No SEU in configuration memory (antifuse) |
| I/O Voltage | — | [DATA_NEEDED: I/O bank voltage range] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID rating in krad (Si)] |
| MSL 等級 | — | [DATA_NEEDED: moisture sensitivity level] |
| Estimated Equivalent Gates per CLB | — | [DATA_NEEDED: gates-per-CLB ratio] |