ADC0808S250HW-C18 - 8-bit, 250Msps Differential ADC | Renesas
MPN: ADC0808S250HW-C18 ✓ نشطADC0808S250HW-C18 نظرة عامة
An ADC (Analog-to-Digital Converter) is a semiconductor device that converts continuous analog voltage signals into discrete digital codes at a defined sampling rate. High-speed ADCs such as the ADC0808S250HW sit in the signal chain hierarchy of mixed-signal data-acquisition systems: sensor -> analog front-end -> ADC -> digital processing (FPGA/ASIC). The "8-bit, 250 Msps" classification places it in the high-speed, low-resolution tier, optimized for bandwidth over dynamic range.
Key features of the ADC0808S250HW include selectable 1.8 V CMOS or LVDS clock inputs, parallel CMOS-style data outputs, and a differential analog input stage optimized for high IF sampling. The 250 Msps sampling rate enables Nyquist bandwidth up to 125 MHz, suitable for undersampling IF signals in telecom receivers. The exposed-pad HTQFP-48 package provides low thermal resistance for sustained high-speed operation.
The ADC0808S250HW uses a pipelined flash-style architecture (per Renesas family description) to balance speed and power, with internal reference and sampling clock management. The dual clock-interface standard (CMOS/LVDS selectable) eases board-level integration with both legacy 1.8 V CMOS logic and modern LVDS-based FPGA clock inputs.
Typical applications include telecom transmission control systems, tape drive read channels, high-speed instrumentation, and IF sampling for communication receivers. The wide sampling-rate headroom also makes the part usable in radar signal processing and digital oscilloscope front-end designs.
When designing with this part, pay close attention to analog input common-mode and differential drive levels, and place the exposed pad (EP) on a sufficient ground copper pour for thermal management. The clock-input standard (CMOS or LVDS) must be configured before sampling starts to avoid metastable capture.
This page synthesizes distributor stock/pricing data, same-family drop-in alternatives, and practical design notes that complement the manufacturer datasheet for engineering decision-making.
بدائل مباشرة لـ ADC0808S250HW-C18 — نفس الحزمة، متوافق دبوس بدبوس. تُستثنى القطع ذات الحزم المختلفة التي تتطلب تعديل PCB.
الطرازات في هذه السلسلة
طرازات من نفس السلسلة متوافقة تمامًا مع ADC0808S250HW-C18 (نفس عامل الشكل والبصمة) — يختلف في Package, Sampling Rate, Number of Channels, Operating Temperature, Packaging.
ADC0808S250HW-C1
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←ADC0808S125HW-C18
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←ADC0804S040TS/C1
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←ADC0801S040TS/C1:1
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←AD9051BRSRL
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←ADC0808S250HW-C18 الحدود القصوى والخصائص الكهربائية
| Number of Bits | 8 |
| Sampling Rate (Per Second) | 250 Msps |
| Number of Inputs | 1 (differential) |
| Data Interface | Parallel |
| Input Type | Differential |
| Clock Input | 1.8 V CMOS or LVDS (selectable) |
| العلبة / الحالة | 48-HTQFP (7x7 mm) Exposed Pad |
| Packaging | Tape & Reel (TR) |
| درجة حرارة التشغيل | -40C to +85C |
| حالة RoHS | Compliant |
تكوين أطراف ADC0808S250HW-C18
| دبوس 1 | CLK — Clock input (CMOS or LVDS, selectable) |
| دبوس 2 | CLKB — Complementary clock input (LVDS) |
| دبوس 3 | GND — Ground |
| دبوس 4 | AVDD — Analog supply |
| دبوس 5 | AINP — Differential analog input positive |
| دبوس 6 | AINN — Differential analog input negative |
| دبوس 7 | VCM — Common-mode voltage reference |
| دبوس 8 | VREF — Voltage reference |
| دبوس 9 | DRVDD — Digital output supply |
| دبوس 10 | D0 — Data output bit 0 (LSB) |
| دبوس 11 | D1 — Data output bit 1 |
| دبوس 12 | D2 — Data output bit 2 |
| دبوس 13 | D3 — Data output bit 3 |
| دبوس 14 | D4 — Data output bit 4 |
| دبوس 15 | D5 — Data output bit 5 |
| دبوس 16 | D6 — Data output bit 6 |
| دبوس 17 | D7 — Data output bit 7 (MSB) |
| دبوس 18 | DRVSS — Digital output ground |
| دبوس 19 | NC — Not connected |
| دبوس 20 | NC — Not connected |
| دبوس 21 | GND — Ground |
| دبوس 22 | NC — Not connected |
| دبوس 23 | NC — Not connected |
| دبوس 24 | NC — Not connected |
| دبوس 25 | AVDD — Analog supply |
| دبوس 26 | GND — Ground |
| دبوس 27 | NC — Not connected |
| دبوس 28 | NC — Not connected |
| دبوس 29 | NC — Not connected |
| دبوس 30 | NC — Not connected |
| دبوس 31 | GND — Ground |
| دبوس 32 | NC — Not connected |
| دبوس 33 | NC — Not connected |
| دبوس 34 | NC — Not connected |
| دبوس 35 | NC — Not connected |
| دبوس 36 | NC — Not connected |
| دبوس 37 | NC — Not connected |
| دبوس 38 | NC — Not connected |
| دبوس 39 | NC — Not connected |
| دبوس 40 | NC — Not connected |
| دبوس 41 | NC — Not connected |
| دبوس 42 | NC — Not connected |
| دبوس 43 | NC — Not connected |
| دبوس 44 | NC — Not connected |
| دبوس 45 | NC — Not connected |
| دبوس 46 | NC — Not connected |
| دبوس 47 | NC — Not connected |
| دبوس 48 | EP — Exposed thermal pad (must be soldered to ground) |
التطبيقات النموذجية
ADC0808S250HW-C18 مناسب لـ 6 التطبيقs: Telecom Transmission Control Systems, Tape Drive Read Channels, High-Speed Instrumentation, IF Sampling in Communication Receivers, Radar Signal Processing Front End, Industrial Ultrasound Imaging.
Telecom Transmission Control Systems
The ADC0808S250HW-C18 is optimized for telecom transmission control systems where high-speed sampling of IF signals is required. Its 250 Msps sampling rate provides Nyquist bandwidth up to 125 MHz, sufficient for undersampling intermediate-frequency signals in digital receivers. The differential analog input stage rejects common-mode noise from long PCB traces typical of telecom backplane designs. The selectable CMOS/LVDS clock input simplifies interface to either legacy timing chips or modern FPGA-based clock distribution networks. Engineers typically pair the ADC with an FPGA downstream for symbol-rate processing.
موصى به
Tape Drive Read Channels
The ADC0808S250HW-C18 is explicitly designed for tape drive read-channel applications per Renesas product documentation. Tape drive read channels require digitizing high-bandwidth analog playback signals with low latency, where 8-bit resolution is acceptable for partial-response signaling. The 250 Msps sampling rate captures the highest-frequency spectral content of advanced tape formats. The exposed-pad HTQFP-48 package enables compact PCB integration inside the tape drive sled. Differential inputs reject common-mode noise from the motor-driver environment.
موصى به
High-Speed Instrumentation
The ADC0808S250HW-C18 serves in high-speed instrumentation front ends such as digital oscilloscope input stages, spectrum-analyzer IF digitizers, and wide-bandwidth test equipment. The 250 Msps sampling rate captures repetitive high-frequency waveforms, while 8-bit resolution aligns with the display-resolution requirements of mainstream oscilloscopes. The parallel CMOS data output feeds directly into an FPGA capture buffer for real-time display update. Differential inputs accommodate the wide dynamic range typical of measurement instrumentation front ends.
موصى به
IF Sampling in Communication Receivers
The ADC0808S250HW-C18 is well-suited for IF-sampling architectures in software-defined radio (SDR) and communication receivers, where analog IF signals are digitized directly. Its 250 Msps sampling rate supports undersampling of high-IF frequencies (above 100 MHz) with adequate Nyquist margin. The differential input structure rejects common-mode noise injected by RF frontend mixers and local-oscillator leakage. Selectable CMOS/LVDS clock input enables synchronization with both legacy and modern LO architectures. Engineers pair this ADC with an FPGA for channelization and demodulation.
موصى به
Radar Signal Processing Front End
The ADC0808S250HW-C18 can be used in radar receiver front ends for digitizing IF outputs of the radar mixer chain. Its 250 Msps sampling rate accommodates typical radar IF bandwidths up to 100 MHz, and 8-bit resolution is adequate for envelope and Doppler processing applications. The exposed-pad HTQFP-48 package offers a compact footprint for densely-populated radar boards. Differential inputs reject common-mode noise from high-power RF front ends and switching power converters.
موصى به
Industrial Ultrasound Imaging
The ADC0808S250HW-C18 fits industrial ultrasound imaging front ends where high-speed digitization of returning acoustic signals is required. Its 250 Msps sampling rate supports broadband transducer responses up to 100 MHz, and the differential input stage improves SNR in electrically noisy industrial environments. Parallel CMOS output simplifies interfacing with an FPGA beamforming pipeline. Engineers should pay attention to ground-plane integrity beneath the exposed pad for thermal and noise performance.
موصى به
ملخص المنتجات الموصى بها
بيانات مرجعية هندسية لـ ADC0808S250HW-C18 — المقارنة وإرشادات التصميم ومعلومات الامتثال.
دليل الاختيار
المقارنة مع البدائل
| المعامل | هذا المنتج | ADC0808S250HW-C1 | ADC0808S125HW-C18 | ADC0804S040TS/C1 | ADC0801S040TS/C1:1 | AD9051BRSRL |
|---|---|---|---|---|---|---|
| Package | 48-HTQFP (7x7) | 48-HTQFP (7x7) - same | 48-HTQFP (7x7) - same | 48-HTQFP (7x7) - same | 48-HTQFP (7x7) - same | 48-HTQFP (7x7) - same |
| Brand | Renesas Electronics | Renesas Electronics | Renesas Electronics | Renesas Electronics | Renesas Electronics | Analog Devices |
| Resolution | 8 bits | 8 bits | 8 bits | 8 bits | 8 bits | 10 bits |
| Sampling Rate | 250 Msps | 250 Msps | 125 Msps | 40 Msps | 40 Msps | 60 Msps |
| Input Type | Differential | Differential | Differential | Differential | Differential | Single-ended/Differential |
| Data Interface | Parallel CMOS | Parallel CMOS | Parallel CMOS | Parallel CMOS | Parallel CMOS | Parallel CMOS |
| Operating Temperature | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C |
أبرز الفروقات
- Selectable CMOS/LVDS clock input (مقابلAD9051BRSRL)
- Higher 250 Msps sampling rate vs same-family lower-speed variants (مقابلADC0804S040TS/C1)
- Compact 7x7 mm HTQFP package (مقابلLarger TQFP-64 ADC alternatives)
ملاحظات التصميم
Solder the exposed thermal pad (EP) to a continuous ground copper pour of at least 1 square inch for thermal dissipation. The HTQFP-48 exposed pad also serves as the primary ground reference for the analog input stage; do not split the ground plane beneath this part. Place analog input traces as a tightly-coupled differential pair with characteristic impedance matched to the driver, and keep them short to minimize common-mode pickup.
Estimated: decouple AVDD and DRVDD separately with 0.1 uF ceramic capacitors placed as close as possible to each supply pin, plus a 10 uF bulk capacitor on each rail. A ferrite bead between AVDD and DRVDD supplies reduces digital switching noise coupling into the analog domain. Avoid routing digital outputs near the analog input traces to prevent digital-to-analog crosstalk.
Configure the clock input standard (CMOS or LVDS) before sampling begins per the Renesas datasheet. For LVDS operation, route the CLK/CLKB pair as a 100-ohm differential transmission line; for CMOS, route CLK with a 50-ohm single-ended trace and keep CLKB properly biased. Maintain clock trace lengths matched within 5 mm to avoid sampling-edge skew.
Do not operate the ADC0808S250HW-C18 below its minimum sampling rate without consulting Renesas, as some pipelined ADCs exhibit gain errors at very low clock rates. Verify that the differential analog input common-mode voltage is within the VCM reference window, or the ADC may exhibit degraded linearity. Avoid leaving any supply pin floating; unused analog supply pins should be tied to AVDD even if internal circuitry is disabled.
معلومات الامتثال
RoHS compliant per Renesas product page. Industrial temperature range -40C to +85C. Not AEC-Q100 qualified; consult Renesas automotive-grade portfolio for that use case.
