ADS6242IRGZR - 14-Bit, 65MSPS Dual-Channel LVDS ADC | Texas Instruments
Teilenummer: ADS6242IRGZR ✓ Aktiv| Menge | Stückpreis | Gesamt |
|---|---|---|
| 1 | $28.5 | $28,50 |
| 10 | $25.65 | $256,50 |
| 100 | $22.8 | $2.280,00 |
| 500 | $20.52 | $10.260,00 |
| 1.000 | $18.25 | $18.250,00 |
ADS6242IRGZR Übersicht
An analog-to-digital converter (ADC) is a mixed-signal integrated circuit that samples continuous analog input signals and converts them into discrete digital codes at a specified sampling rate. High-speed ADCs such as the ADS6242 family sit at the front-end of the signal chain in communications infrastructure, medical imaging, defense electronics, and test-and-measurement equipment, where they digitize wideband IF or baseband signals for downstream DSP, FPGA, or ASIC processing. They are part of the broader pipeline-ADC architecture family, characterized by multi-stage sample-and-hold conversion that achieves high sample rates at moderate-to-high resolution.
Key features of the ADS6242 include a 3.5 dB coarse gain option that improves SFDR (spurious-free dynamic range) performance with minimal SNR (signal-to-noise ratio) degradation, serial LVDS outputs that simplify PCB routing and reduce EMI, internal references that reduce external component count, and a 48-pin VQFN package providing excellent thermal performance. The dual-channel architecture with independent sample-and-hold circuits supports simultaneous sampling, critical for I/Q radio chains and beamforming applications.
From an architectural perspective, the ADS6242 uses a pipelined multi-stage conversion core followed by digital error correction. The coarse gain option is implemented as an analog front-end attenuator that backs off the input signal below the converter's full-scale range, which pushes the signal away from the nonlinear regions of the input sampling network and improves large-signal SFDR.
Typical applications include wireless communications basestation receivers, software-defined radio (SDR) platforms, medical ultrasound imaging front-ends, defense radar signal processing, and high-speed data acquisition systems. The dual-channel simultaneous sampling makes the ADS6242 ideal for I/Q demodulation, diversity reception, and multi-antenna systems. Designers should note that input common-mode voltage, clock jitter, and input bandwidth all directly impact achievable SNR - careful PCB layout and a low-jitter clock source are essential. This page synthesizes distributor pricing, drop-in same-family alternatives, and practical design notes not aggregated on the manufacturer product page.
Drop-in-Alternativen für ADS6242IRGZR – gleiches Gehäuse, Pin-kompatibel. Bauteile mit anderem Gehäuse, die eine PCB-Überarbeitung erfordern, sind ausgeschlossen.
Varianten dieser Serie
Modelle derselben Serie, die drop-in-kompatibel sind mit ADS6242IRGZR (gleiche Bauform und Footprint) – abweichend in Package, Number of Channels, Resolution, Input Type, Operating Temperature Range.
Schnellvergleichstool – Wählen Sie Alternativbauteile für den Direktvergleich:
ADS6242IRGZ25
✅ Drop-In📋 Referenzalternative (nicht im Katalog)
ADS6242IRGZT
✅ Drop-In📋 Referenzalternative (nicht im Katalog)
ADS6243IRGZR
✅ Drop-In✓ Auf Lager
$18.75 / Stück
Datenblatt ansehen →ADS6244IRGZR
✅ Drop-In📋 Referenzalternative (nicht im Katalog)
ADS6129IRGZ25
✅ Drop-In✓ Auf Lager
$23.1 / Stück
Datenblatt ansehen →ADS6242IRGZR Grenzwerte & elektrische Eigenschaften
| Manufacturer | Texas Instruments |
| Part Number | ADS6242IRGZR |
| Product Type | Analog-to-Digital Converter (ADC) |
| Auflösung | 14-bit |
| Number of Channels | 2 (dual-channel, simultaneous sampling) |
| Sampling Rate (ADS6242IRGZR) | 65 MSPS |
| Family Sampling Rates | 125 / 105 / 80 / 65 MSPS |
| Architecture | Pipelined |
| Output Interface | Serial LVDS |
| Input Type | Differential analog inputs |
| Gehäuse | 48-VQFN (RGZ) 7 mm x 7 mm |
| Coarse Gain Option | 3.5 dB (improves SFDR) |
| Montageart | Surface Mount |
| Betriebstemperaturbereich | -40C to +85C (industrial) |
| RoHS-Status | Compliant |
ADS6242IRGZR Pin-Konfiguration
| Pin 1 | INA+ — Differential analog input A, positive |
| Pin 2 | INA- — Differential analog input A, negative |
| Pin 3 | VCM — Common-mode voltage output |
| Pin 4 | INB+ — Differential analog input B, positive |
| Pin 5 | INB- — Differential analog input B, negative |
| Pin 6 | AVDD — Analog 3.3V supply |
| Pin 7 | AGND — Analog ground |
| Pin 8 | REFTS — Reference top decoupling |
| Pin 9 | REFT — Reference top |
| Pin 10 | REFB — Reference bottom |
| Pin 11 | REFBS — Reference bottom decoupling |
| Pin 12 | AGND — Analog ground |
| Pin 13 | LVDSVCC — LVDS output supply |
| Pin 14 | LVDSGND — LVDS ground |
| Pin 15 | OUTCLK_P — LVDS output clock, positive |
| Pin 16 | OUTCLK_N — LVDS output clock, negative |
| Pin 17 | DA0_P — LVDS data output A0, positive |
| Pin 18 | DA0_N — LVDS data output A0, negative |
| Pin 19 | DA1_P — LVDS data output A1, positive |
| Pin 20 | DA1_N — LVDS data output A1, negative |
| Pin 21 | DB0_P — LVDS data output B0, positive |
| Pin 22 | DB0_N — LVDS data output B0, negative |
| Pin 23 | DB1_P — LVDS data output B1, positive |
| Pin 24 | DB1_N — LVDS data output B1, negative |
| Pin 25 | LVDSVCC — LVDS output supply |
| Pin 26 | LVDSGND — LVDS ground |
| Pin 27 | RESET — Reset input, active low |
| Pin 28 | PD — Power-down input |
| Pin 29 | GAIN — Coarse gain select (3.5 dB) |
| Pin 30 | SDOUT — Serial data output configuration |
| Pin 31 | SDIN — Serial data input configuration |
| Pin 32 | SCLK — Serial configuration clock |
| Pin 33 | SEN — Serial enable, active low |
| Pin 34 | DGND — Digital ground |
| Pin 35 | DRVDD — Digital output driver supply |
| Pin 36 | CLK+ — Differential clock input, positive |
| Pin 37 | CLK- — Differential clock input, negative |
| Pin 38 | AVDD — Analog 3.3V supply |
| Pin 39 | AGND — Analog ground |
| Pin 40 | AVDD — Analog 3.3V supply |
| Pin 41 | AGND — Analog ground |
| Pin 42 | NC — Not connected |
| Pin 43 | NC — Not connected |
| Pin 44 | AVDD — Analog 3.3V supply |
| Pin 45 | AGND — Analog ground |
| Pin 46 | AVDD — Analog 3.3V supply |
| Pin 47 | AGND — Analog ground |
| Pin 48 | EPAD — Exposed thermal pad, connect to AGND |
Typische Anwendungen
ADS6242IRGZR ist geeignet für 6 Anwendungs: Wireless Basestation Receiver, Software Defined Radio (SDR), Medical Ultrasound Imaging Front-End, Defense Radar Signal Processing, High-Speed Data Acquisition System, Industrial Test and Measurement.
Wireless Basestation Receiver
The ADS6242IRGZR's dual-channel simultaneous sampling at 65 MSPS with 14-bit resolution suits multi-carrier GSM/UMTS/LTE basestation receiver IF digitizers. Its 3.5 dB coarse gain option backs the input off full-scale to improve SFDR when handling high-amplitude blocker signals at the antenna mast, which is essential for maintaining EVM (error vector magnitude) compliance in dense carrier environments. The serial LVDS output reduces board-level routing complexity compared to parallel CMOS ADCs, enabling higher channel density in compact RRH (remote radio head) modules. Place the device between the IF SAW filter and the FPGA/ASIC baseband processor, with a low-jitter clock source to preserve the 14-bit ENOB (effective number of bits).
Empfohlen
Software Defined Radio (SDR)
In SDR platforms the ADS6242IRGZR's dual 65 MSPS, 14-bit channels digitize I and Q baseband signals in parallel with matched gain and phase characteristics. The 3.5 dB coarse gain option trades minimal SNR for improved SFDR, valuable when the input contains large out-of-band interferers common in crowded RF environments. The 48-VQFN (RGZ) 7x7 mm package provides a compact footprint for portable SDR designs where board area is at a premium. The serial LVDS interface simplifies PCB routing into the FPGA, reducing the number of inter-board connections and EMI susceptibility compared to wide parallel buses.
Empfohlen
Medical Ultrasound Imaging Front-End
The ADS6242IRGZR is well suited to medical ultrasound beamformer front-ends where multiple receive channels must be digitized simultaneously at high sample rates. Each dual-channel ADC handles two transducer receive channels with matched latency and gain, supporting phased-array beamforming. The 14-bit resolution preserves dynamic range for subtle tissue contrast, while the 3.5 dB coarse gain option provides SFDR headroom for large reflection signals. The serial LVDS outputs minimize cable harness complexity between the probe head electronics and the back-end FPGA-based beamformer processor.
Empfohlen
Defense Radar Signal Processing
Defense radar systems demand wideband, high-dynamic-range digitization of IF signals for pulse compression and Doppler processing. The ADS6242IRGZR's 14-bit resolution and 65 MSPS sample rate cover many X-band radar IF chains, while the dual-channel architecture supports I/Q sampling of coherent radar returns. The 3.5 dB coarse gain improves SFDR for large clutter returns, and the industrial -40C to +85C operating range meets MIL-grade equipment environmental specifications. The compact 48-VQFN package enables high channel density in radar receiver modules.
Empfohlen
High-Speed Data Acquisition System
In automated test equipment and high-speed data acquisition systems, the ADS6242IRGZR provides simultaneous sampling of two channels at 65 MSPS with 14-bit resolution. The pipelined architecture delivers low latency suitable for closed-loop control and event-triggered capture applications. The serial LVDS outputs ease integration with FPGAs that perform real-time DSP and trigger logic, while the small 48-VQFN (RGZ) 7x7 mm package enables multi-board stacking in modular PXI and LXI instruments.
Empfohlen
Industrial Test and Measurement
Test-and-measurement instruments such as oscilloscopes, spectrum analyzers, and signal analyzers benefit from the ADS6242IRGZR's dual 65 MSPS, 14-bit channels. The simultaneous sampling supports two-channel oscilloscope front-ends or vector signal analyzer I/Q demodulation. The 3.5 dB coarse gain improves SFDR when capturing signals with high peak-to-average ratios such as multi-tone or OFDM waveforms. The serial LVDS interface minimizes connector pin count between the analog front-end board and the digital processing board.
Empfohlen
Zusammenfassung der empfohlenen Produkte
Technische Referenzdaten für ADS6242IRGZR – Vergleich, Designhinweise und Compliance-Informationen.
Auswahlhilfe
Vergleich mit Alternativen
| Parameter | Dieses Produkt | ADS6242IRGZ25 | ADS6242IRGZT | ADS6243IRGZR | ADS6244IRGZR | ADS6129IRGZ25 |
|---|---|---|---|---|---|---|
| Brand | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments |
| Package | 48-VQFN (RGZ) 7x7 mm | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same |
| Resolution | 14-bit | 14-bit | 14-bit | 14-bit | 14-bit | 12-bit |
| Sampling Rate | 65 MSPS | 65 MSPS | 125 MSPS | 105 MSPS | 125 MSPS | 65 MSPS |
| Number of Channels | 2 | 2 | 2 | 2 | 2 | 2 |
| Output Interface | Serial LVDS | Serial LVDS | Serial LVDS | Serial LVDS | Serial LVDS | Serial LVDS |
| Coarse Gain Option | 3.5 dB | 3.5 dB | 3.5 dB | 3.5 dB | 3.5 dB | 3.5 dB |
| Operating Temperature | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C |
Wichtigste Unterscheidungsmerkmale
- Lowest sampling rate in family for power-sensitive applications (vs. ADS6242IRGZT (125 MSPS))
- Higher resolution than ADS6129 family (vs. ADS6129IRGZ25 (12-bit))
- 3.5 dB coarse gain option improves SFDR (vs. Generic 14-bit ADC without coarse gain)
Designhinweise
Use a continuous ground plane on the layer directly beneath the ADS6242IRGZR. Separate analog (AGND) and digital (DGND) ground planes should be joined only at a single point near the ADC's exposed thermal pad. Place the input coupling capacitors and common-mode bypass capacitors as close as possible to the INA+/INA- and INB+/INB- pins to minimize parasitic inductance that would degrade SFDR.
Drive the CLK+ and CLK- pins with a low-jitter, differential clock source. Estimated: to preserve the full 14-bit ENOB, the external clock jitter should be below 0.5 ps RMS. Use a clock generator with sub-100 fs jitter (e.g., TI's CDCE72010 or LMK04828) and route the clock signal as a 100-ohm differential pair with matched trace lengths.
Provide separate analog (AVDD) and digital (DRVDD, LVDSVCC) supply rails with local decoupling. Place 0.1 uF ceramic capacitors as close as possible to each supply pin, plus a bulk 10 uF tantalum or ceramic capacitor nearby. Power-supply noise on AVDD directly couples into the analog input stage and degrades SFDR, so use of a low-noise LDO is recommended over a switching regulator for the analog rail.
Do not leave the GAIN pin floating - tie it to logic high or low through a 10 kohm resistor to set the desired coarse gain mode. Leaving the SDOUT, SDIN, SCLK, and SEN serial configuration pins floating during operation can cause unpredictable register writes; either tie SEN high to disable serial configuration or drive it from the host controller.
Compliance-Informationen
RoHS and lead-free compliant per TI product page. Not AEC-Q100 qualified - this is an industrial/consumer-grade ADC. Operating temperature -40C to +85C.
