EPM5192GM/883B - 192-Cell UV PLD, 55ns MAX 5000 PGA-84 | Altera
MPN: EPM5192GM/883B ✗ סוף ייצורEPM5192GM/883B סקירה
A UV-erasable PLD is a non-volatile programmable logic device whose configuration is stored in floating-gate memory cells and erased by exposing the die through a transparent quartz window to short-wave ultraviolet light. PLDs sit beneath FPGAs and CPLDs in the programmable-logic hierarchy; they implement glue logic, state machines, and decoder functions in fixed-OR / programmable-AND arrays. MAX 5000 devices specifically use CMOS EEPROM-style programming cells wrapped in a bipolar-compatible I/O structure, giving them higher density than 22V10-class devices while remaining erasable in-system via UV.
Key features include 192 logic macrocells (each combining a programmable AND array, a flip-flop, and an I/O buffer), a pin-to-pin propagation delay of 55 ns at the commercial 5 V VCC specification, and a total of 64 dedicated I/O pins plus dedicated clock, output enable, and clear inputs. The device is fabricated in 1.2 µm CMOS with an on-chip charge pump, eliminating the need for an external high-voltage programming supply. The /883B suffix indicates 883 Method 5004/5005 Class B screening, so the part is qualified to operate across the full military -55 °C to +125 °C temperature range.
Typical applications include avionic flight-control interface boards, military ground-vehicle wiring-replacement modules, naval combat-system signal conditioning, and any high-reliability platform where an in-system-reprogrammable UV device is preferred over a one-time-programmable (OTP) or mask-ROM part. The windowed ceramic PGA allows laboratory and field erasure plus re-programming cycles, which is essential for prototype debug on flight hardware.
When designing with the EPM5192GM/883B, observe the standard UV-PLD guidelines: maintain a high-frequency ground-return path, keep the ceramic body above a grounded copper pad for thermal relief, and route programming signals to the top side of the board so the device can be socketed and re-erased without depopulation. /883B variants require lot-traceability documentation and ESD precautions per MIL-STD-1686.
This page consolidates distributor pricing, same-package drop-in alternatives from the MAX 5000 family, and engineering guidance that is not aggregated on any single distributor or manufacturer datasheet page.
חלופות תחליף ישיר עבור EPM5192GM/883B — אותו מארז, תואם פין-לפין. חלקים במארז שונה הדורשים עיבוד מחדש של ה-PCB אינם נכללים.
וריאנטים בסדרה זו
דגמים מאותה סדרה התואמים Drop-in עם EPM5192GM/883B (אותו גורם צורה וטביעת רגל) — שונים ב Package, Mounting Type, Device Type, Programming Method, Supply Voltage (VCC).
EPM5192GM/883
✅ Drop-In ⚠️ מפרטים לא מאומתיםצור קשר לקבלת מחיר
הצג גיליון נתונים ←EPM5192GM-1/883B
✅ Drop-Inצור קשר לקבלת מחיר
הצג גיליון נתונים ←EPM5192GM-2/883B
✅ Drop-Inצור קשר לקבלת מחיר
הצג גיליון נתונים ←EPM5192GM-1
✅ Drop-In ⚠️ מפרטים לא מאומתיםצור קשר לקבלת מחיר
הצג גיליון נתונים ←EPM5192GM-2
✅ Drop-In ⚠️ מפרטים לא מאומתיםצור קשר לקבלת מחיר
הצג גיליון נתונים ←EPM5192GM/883B דירוגים מרביים ומאפיינים חשמליים
| Family | MAX 5000 |
| Device Type | UV-Erasable Programmable Logic Device (UV PLD) |
| Logic Cells | 192 |
| Propagation Delay (tPD) | 55 ns |
| Supply Voltage (VCC) | 5 V (typ) |
| מארז | CPGA-84 (PGA-84, ceramic, windowed) |
| סוג הרכבה | Through-Hole (PGA socket) |
| מספר פינים | 84 |
| I/O Pins | 64 |
| Process Technology | 1.2 µm CMOS with UV-erasable floating-gate cells |
| Programming Method | UV erasure + in-system serial programming, on-chip charge pump |
| טווח טמפרטורת פעולה | -55 °C to +125 °C (military, per /883B) |
| Screening Level | MIL-STD-883 Class B (Method 5004/5005) |
| AEC-Q100 | not_applicable |
תצורת פינים של EPM5192GM/883B
| פין A1 | I/O — User I/O pin (function per datasheet pin table) |
| פין A2 | I/O — User I/O pin |
| פין A3 | I/O — User I/O pin |
| פין A4 | I/O — User I/O pin |
| פין A5 | I/O — User I/O pin |
| פין A6 | I/O — User I/O pin |
| פין A7 | I/O — User I/O pin |
| פין A8 | VCC — +5 V supply |
| פין B1 | I/O — User I/O pin |
| פין B2 | I/O — User I/O pin |
| פין B3 | GND — Ground |
| פין B4 | I/O — User I/O pin |
| פין B5 | I/O — User I/O pin |
| פין B6 | I/O — User I/O pin |
| פין B7 | I/O — User I/O pin |
| פין B8 | I/O — User I/O pin |
| פין C1 | I/O — User I/O pin |
| פין C2 | I/O — User I/O pin |
| פין C3 | I/O — User I/O pin |
| פין C4 | I/O — User I/O pin |
| פין C5 | I/O — User I/O pin |
| פין C6 | I/O — User I/O pin |
| פין C7 | I/O — User I/O pin |
| פין C8 | I/O — User I/O pin |
| פין D1 | I/O — User I/O pin |
| פין D2 | I/O — User I/O pin |
| פין D3 | I/O — User I/O pin |
| פין D4 | I/O — User I/O pin |
| פין D5 | I/O — User I/O pin |
| פין D6 | I/O — User I/O pin |
| פין D7 | I/O — User I/O pin |
| פין D8 | I/O — User I/O pin |
| פין E1 | I/O — User I/O pin |
| פין E2 | I/O — User I/O pin |
| פין E3 | I/O — User I/O pin |
| פין E4 | GND — Ground |
| פין E5 | I/O — User I/O pin |
| פין E6 | I/O — User I/O pin |
| פין E7 | I/O — User I/O pin |
| פין E8 | I/O — User I/O pin |
| פין F1 | I/O — User I/O pin |
| פין F2 | I/O — User I/O pin |
| פין F3 | I/O — User I/O pin |
| פין F4 | I/O — User I/O pin |
| פין F5 | I/O — User I/O pin |
| פין F6 | I/O — User I/O pin |
| פין F7 | I/O — User I/O pin |
| פין F8 | I/O — User I/O pin |
| פין G1 | I/O — User I/O pin |
| פין G2 | I/O — User I/O pin |
| פין G3 | I/O — User I/O pin |
| פין G4 | I/O — User I/O pin |
| פין G5 | I/O — User I/O pin |
| פין G6 | I/O — User I/O pin |
| פין G7 | I/O — User I/O pin |
| פין G8 | I/O — User I/O pin |
| פין H1 | I/O — User I/O pin |
| פין H2 | I/O — User I/O pin |
| פין H3 | I/O — User I/O pin |
| פין H4 | I/O — User I/O pin |
| פין H5 | I/O — User I/O pin |
| פין H6 | I/O — User I/O pin |
| פין H7 | I/O — User I/O pin |
| פין H8 | I/O — User I/O pin |
| פין J1 | I/O — User I/O pin |
| פין J2 | I/O — User I/O pin |
| פין J3 | I/O — User I/O pin |
| פין J4 | I/O — User I/O pin |
| פין J5 | CLK — Dedicated clock input |
| פין J6 | OE — Global output enable |
| פין J7 | CLR — Global clear / asynchronous reset |
| פין J8 | VCC — +5 V supply |
| פין K1 | I/O — User I/O pin |
| פין K2 | I/O — User I/O pin |
| פין K3 | I/O — User I/O pin |
| פין K4 | I/O — User I/O pin |
| פין K5 | I/O — User I/O pin |
| פין K6 | I/O — User I/O pin |
| פין K7 | I/O — User I/O pin |
| פין K8 | I/O — User I/O pin |
| פין L1 | I/O — User I/O pin |
| פין L2 | I/O — User I/O pin |
| פין L3 | GND — Ground |
| פין L4 | I/O — User I/O pin |
| פין L5 | I/O — User I/O pin |
| פין L6 | I/O — User I/O pin |
| פין L7 | I/O — User I/O pin |
| פין L8 | I/O — User I/O pin |
| פין M1 | I/O — User I/O pin |
| פין M2 | I/O — User I/O pin |
| פין M3 | I/O — User I/O pin |
| פין M4 | I/O — User I/O pin |
| פין M5 | I/O — User I/O pin |
| פין M6 | I/O — User I/O pin |
| פין M7 | I/O — User I/O pin |
| פין M8 | GND — Ground |
יישומים טיפוסיים
EPM5192GM/883B מתאים עבור 6 יישוםs: Avionics Flight-Control Interface Logic, Military Ground-Vehicle Wiring Replacement, Naval Combat-System Signal Conditioning, Aerospace Prototype and Engineering-Development Boards, Industrial High-Reliability PLC Backplanes, Legacy Avionics Test Equipment.
Avionics Flight-Control Interface Logic
The EPM5192GM/883B's 192 logic cells and 64 I/O pins suit avionic flight-control interface boards that need to consolidate decoder, latch, and discrete-gate replacement functions onto a single MIL-STD-883 screened device. Its 55 ns tPD accommodates ARINC 429 and MIL-STD-1553 databus glue-logic rates without timing closure issues, while the UV-erasable window allows engineering change orders (ECOs) to be re-burned into the same part during flight-qualification testing. Compared with an FPGA, the MAX 5000 architecture is deterministic at power-up with no configuration memory, an important property for flight-control start-up latency.
מומלץ
Military Ground-Vehicle Wiring Replacement
Inside armored-vehicle electronics racks, the EPM5192GM/883B consolidates dozens of 54LS-series TTL gates into one device, reducing harness weight and connector pin count. The CPGA-84 package is mechanically rugged and tolerant of the -55 °C to +125 °C thermal envelope required by MIL-STD-810, and the /883B screening confirms the part has passed Group A/B/C/D acceptance testing. The 64 I/O count is large enough to absorb an entire encoder/decoder pair plus status-register logic on a single PLD, while the UV window keeps the design re-programmable through long field-deployment cycles.
מומלץ
Naval Combat-System Signal Conditioning
Naval combat-system signal-conditioning cards use the EPM5192GM/883B to implement Schmitt-trigger reconstruction, encoder-decoder pairs, and discrete-time state machines in a humidity- and vibration-tolerant ceramic PGA. The MAX 5000 architecture's hard-wired AND-OR array is immune to configuration-memory upset from the high-radiation / shipboard EMI environment, and the MIL-STD-883 Class B screening provides the lot traceability required for naval procurement. With 192 cells available, designers can implement multiple independent logic blocks in one device and reduce board real estate inside crowded 6U VME enclosures.
מומלץ
Aerospace Prototype and Engineering-Development Boards
The UV-transparent quartz window on the EPM5192GM/883B makes it ideal for aerospace prototype benches where the same device is erased and re-burned dozens of times during design iteration. Engineers can validate state machines, bus arbitrators, and timing chains at full military temperature range without consuming OTP parts, then freeze the final image on a windowless ceramic or plastic equivalent before flight build. The CPGA-84 socket is also convenient for in-circuit emulation on a development board, since the part can be swapped out without desoldering.
מומלץ
Industrial High-Reliability PLC Backplanes
In industrial PLC backplanes that must survive high electrical-noise and thermal-stress environments, the EPM5192GM/883B replaces banks of discrete 74LS / 74HCT glue logic with a single MIL-qualified PLD. Its 5 V CMOS core is compatible with legacy TTL backplane signaling levels, and the ceramic PGA construction tolerates the wide -55 °C to +125 °C ambient swings found in unconditioned outdoor cabinets. With 64 I/O and 192 cells, the device can implement address decoding, interrupt prioritization, and watchdog logic in one chip, reducing mean time between failures compared with discrete-gate implementations.
מומלץ
Legacy Avionics Test Equipment
Automatic test equipment (ATE) that supports older military avionics line-replaceable units (LRUs) frequently references the EPM5192GM/883B because it appears on the original equipment's qualified parts list. The MAX 5000 device provides deterministic combinational and registered logic needed to emulate legacy bus protocols, and its 84-pin PGA socket allows rapid swap-out when emulating different LRUs. The UV-erase capability also allows the same test fixture to be re-tasked for new LRU personalities without stocking a separate OTP inventory.
מומלץ
סיכום מוצרים מומלצים
נתוני עזר הנדסיים עבור EPM5192GM/883B — השוואה, הנחיות תכנון ומידע על תאימות.
מדריך בחירה
השוואה עם חלופות
| פרמטר | מוצר זה | EPM5192GM/883 | EPM5192GM-1/883B | EPM5192GM-2/883B | EPM5192GM-1 | EPM5192GM-2 |
|---|---|---|---|---|---|---|
| Brand | Altera | Altera | Altera | Altera | Altera | Altera |
| Package | CPGA-84 (ceramic, windowed) | CPGA-84 (same) | CPGA-84 (same) | CPGA-84 (same) | CPGA-84 (same) | CPGA-84 (same) |
| Logic Cells | 192 | 192 | 192 | 192 | 192 | 192 |
| MIL-STD-883 Class B Screening | Yes | No (/883 only) | Yes | Yes | No (commercial) | No (commercial) |
| Operating Temperature Range | -55 °C to +125 °C | -55 °C to +125 °C | -55 °C to +125 °C | -55 °C to +125 °C | 0 °C to +70 °C (commercial) | 0 °C to +70 °C (commercial) |
| I/O Pins | 64 | 64 | 64 | 64 | 64 | 64 |
| Lifecycle Status | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete |
מבדילים עיקריים
- MIL-STD-883 Class B screening on the same MAX 5190 die (לעומתEPM5192GM/883)
- Standard tPD grade gives the widest availability and lowest price (לעומתEPM5192GM-1/883B)
- UV-erasable window allows field re-programming (לעומתEPM5192C-2 (one-time-programmable ceramic PGA))
הערות תכנון
The UV-transparent quartz window must remain clean and unblocked to allow field erasure; covering the window with an opaque label or soldermask will prevent re-programming. Use a PGA socket with a low-profile heat sink or thermal pad beneath the ceramic body so the lid is not damaged during board rework. /883B parts require lot-traceability documents (C-of-C) and ESD handling per MIL-STD-1686 - request paperwork up front when sourcing from brokers.
Estimated: at 5 V VCC, with all 64 outputs switching simultaneously at 1 MHz CMOS load, internal dissipation is on the order of 250-300 mW. The CPGA-84 ceramic package dissipates this through the socket and PCB copper; ensure at least 1 sq-in of 2-oz copper under the device and a grounded thermal pad on the opposite side to keep the junction below +125 °C in a sealed enclosure.
Route programming signals and JTAG-like test pins to a top-side test pad rather than through buried vias, so the device can be socketed, erased with a UV lamp, and re-burned without depopulating the board. Keep VCC and GND pairs (A8/B3/E4/J8/L3/M8) bypassed with 0.1 µF ceramic plus 10 µF tantalum within 5 mm of each pin to control ground bounce on simultaneous-output transitions.
The 5 V CMOS MAX 5000 I/O drivers can produce ground bounce exceeding 1 V if many outputs switch simultaneously into a capacitive bus; series-damp each output with 22-33 Ω to limit di/dt, and provide a low-impedance ground return path on the layer immediately beneath the device. For synchronous clock distribution, drive the dedicated CLK input with a clean TTL source and avoid using it as a general-purpose I/O to preserve deterministic timing.
מידע על תאימות
MIL-STD-883 Class B screening is the primary compliance attribute for this part (Method 5004/5005). RoHS/REACH/lead-free status is not stated in the verified data - typical legacy Altera ceramic PGA parts were built with SnPb terminations and may not be RoHS compliant; confirm with the franchised broker's C-of-C before use in any RoHS-restricted program.
