RTAX1000S-LG624V vs RTAX1000SL-LG624E तुलना
विस्तृत दोनों ओर की तुलना RTAX1000S-LG624V द्वारा Microchip Technology और RTAX1000SL-LG624E द्वारा Microchip Technology. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Microchip Technology
RTAX1000S-LG624V - 1M-Gate Rad-Tolerant FPGA | Microchip
RTAX1000S-LG624V ✓ सक्रियMicrochip Technology
RTAX1000SL-LG624E - 1M-Gate Rad-Tolerant FPGA 624-LGA | Microchip
RTAX1000SL-LG624E ✓ सक्रियविशेषता तुलना
| पैरामीटर | RTAX1000S-LG624V | RTAX1000SL-LG624E |
|---|---|---|
| ब्रांड | Microchip Technology | Microchip Technology |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Family | RTAX-S/SL Radiation-Tolerant FPGA | RTAX-SL Radiation-Tolerant FPGA |
| Equivalent System Gates | 1,000,000 | 1,000,000 |
| Logic Cells | 18144 | — |
| Configurable Logic Blocks (CLBs) | 12096 | — |
| Technology | Digital CMOS, antifuse-based | — |
| Core Supply Voltage | 1.5 V (nominal) | 1.5 V |
| Configuration Type | One-Time Programmable (antifuse), live at power-up | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | — |
| पैकेज | CG624 (624-pin ceramic column grid array, LG624) | 624-Pin LGA (CBGA624), Ceramic |
| ऑपरेटिंग तापमान | -55C to +125C | [DATA_NEEDED: operating temperature range] |
| Application Domain | Space-flight systems, radiation-tolerant | — |
| Maximum Family Density | 4,000,000 equivalent system gates (family) | — |
| माउंटिंग प्रकार | Surface Mount | Surface Mount |
| Number of User I/O | [DATA_NEEDED: number of user I/O for LG624 package] | — |
| Block RAM Capacity | [DATA_NEEDED: embedded SRAM bit capacity] | — |
| RoHS स्थिति | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| ASIC Gates | — | 125,000 |
| Logic Cells (CLBs) | — | 12,096 |
| Maximum Combinatorial Delay per CLB | — | 0.93 ns |
| Maximum Frequency | — | 581 MHz |
| Process Technology | — | 0.15 um CMOS |
| Packaging | — | Box |
| Technology Base | — | CMOS, Antifuse |
| Configuration | — | Live-at-power-up (no external configuration device) |
| I/O Voltage Range | — | [DATA_NEEDED: I/O voltage range] |
| TID Rating | — | [DATA_NEEDED: total ionizing dose rating] |
| SEU Immunity | — | [DATA_NEEDED: single-event upset immunity figure] |