MMA7340LR1 vs MMA7330LR1 比較
詳細な並列比較: MMA7340LR1 メーカー: NXP Semiconductors および MMA7330LR1 メーカー: NXP Semiconductors。主要仕様、電気的特性、パッケージ、ライフサイクルステータス、価格、在庫状況を比較して、設計要件に最適な部品を判断してください。
仕様比較
| パラメータ | MMA7340LR1 | MMA7330LR1 |
|---|---|---|
| ブランド | NXP Semiconductors | NXP Semiconductors |
| カテゴリ | Motion Sensors | Motion Sensors |
| ライフサイクル状態 | 有効 | Obsolete |
| 在庫状況 | In Stock | In Stock |
| 単価（USD） | $3.85 | $3.76 |
| センサタイプ | 3-Axis Capacitive MEMS Accelerometer | Accelerometer, 3-axis |
| Acceleration Range | ±3g, ±11g (selectable via g-Select) | ±4g (g-Select low), ±12g (g-Select high) |
| 出力タイプ | Analog voltage (one VOUT per axis) | Analog voltage (ratiometric) |
| Sensitivity (3g mode) | [DATA_NEEDED: 3g mode sensitivity mV/g] | — |
| Sensitivity (11g mode) | [DATA_NEEDED: 11g mode sensitivity mV/g] | — |
| Zero-g Offset (factory trimmed) | [DATA_NEEDED: zero-g offset V] | — |
| Bandwidth (X, Y axes) | 400 Hz | — |
| Bandwidth (Z axis) | 300 Hz | — |
| Filter | 1-pole low-pass | 1-pole low-pass on-chip |
| Self-Test | Yes (logic-level input) | Yes (active high) |
| Sleep Mode | Yes (logic-level input) | — |
| 電源電圧 | 2.2 V to 3.6 V (typical 3.3 V) | — |
| Supply Current (active) | [DATA_NEEDED: active supply current mA] | — |
| Supply Current (sleep) | [DATA_NEEDED: sleep supply current uA] | — |
| 動作温度 | -40 C to +85 C | -40 °C to +85 °C |
| パッケージ | 14-LGA (3 x 5 mm) | 14-LGA (3 mm x 5 mm x 1 mm) |
| 実装タイプ | Surface Mount | Surface Mount |
| RoHS ステータス | Compliant | [DATA_NEEDED: RoHS status] |
| Lead-Free Status | Lead Free | — |
| Axes Measured | — | X, Y, Z |
| Sensitivity (±4g mode) | — | 800 mV/g (typical at Vdd=3.3 V) |
| Sensitivity (±12g mode) | — | 200 mV/g (typical at Vdd=3.3 V) |
| Bandwidth (X, Y) | — | 400 Hz |
| Bandwidth (Z) | — | 300 Hz |
| Supply Voltage (Vdd) | — | 2.2 V to 3.5 V |
| Supply Voltage (VddIO) | — | 1.71 V to 3.5 V |
| 電源電流 | — | 400 µA typical |
| ノイズ密度 | — | 1.5 mg/√Hz typical |
| Zero-g Offset (factory trim) | — | Pre-trimmed, no external components required |
| Shock Survival | — | 10,000 g (per NXP test methodology) |