MMA7340LR1 vs MMA7330LR1 비교
다음의 상세 나란히 비교: MMA7340LR1 제조: NXP Semiconductors 및 MMA7330LR1 제조: NXP Semiconductors. 주요 사양, 전기적 파라미터, 패키징, 수명 주기 상태, 가격 및 재고를 비교하여 설계 요구 사항에 가장 적합한 부품을 결정하십시오.
사양 비교
| 파라미터 | MMA7340LR1 | MMA7330LR1 |
|---|---|---|
| 브랜드 | NXP Semiconductors | NXP Semiconductors |
| 카테고리 | Motion Sensors | Motion Sensors |
| 수명 주기 상태 | 활성 | Obsolete |
| 재고 상태 | In Stock | In Stock |
| 단가 (USD) | $3.85 | $3.76 |
| 센서 유형 | 3-Axis Capacitive MEMS Accelerometer | Accelerometer, 3-axis |
| Acceleration Range | ±3g, ±11g (selectable via g-Select) | ±4g (g-Select low), ±12g (g-Select high) |
| 출력 유형 | Analog voltage (one VOUT per axis) | Analog voltage (ratiometric) |
| Sensitivity (3g mode) | [DATA_NEEDED: 3g mode sensitivity mV/g] | — |
| Sensitivity (11g mode) | [DATA_NEEDED: 11g mode sensitivity mV/g] | — |
| Zero-g Offset (factory trimmed) | [DATA_NEEDED: zero-g offset V] | — |
| Bandwidth (X, Y axes) | 400 Hz | — |
| Bandwidth (Z axis) | 300 Hz | — |
| Filter | 1-pole low-pass | 1-pole low-pass on-chip |
| Self-Test | Yes (logic-level input) | Yes (active high) |
| Sleep Mode | Yes (logic-level input) | — |
| 공급 전압 | 2.2 V to 3.6 V (typical 3.3 V) | — |
| Supply Current (active) | [DATA_NEEDED: active supply current mA] | — |
| Supply Current (sleep) | [DATA_NEEDED: sleep supply current uA] | — |
| 동작 온도 | -40 C to +85 C | -40 °C to +85 °C |
| 패키지 | 14-LGA (3 x 5 mm) | 14-LGA (3 mm x 5 mm x 1 mm) |
| 실장 유형 | Surface Mount | Surface Mount |
| RoHS 상태 | Compliant | [DATA_NEEDED: RoHS status] |
| Lead-Free Status | Lead Free | — |
| Axes Measured | — | X, Y, Z |
| Sensitivity (±4g mode) | — | 800 mV/g (typical at Vdd=3.3 V) |
| Sensitivity (±12g mode) | — | 200 mV/g (typical at Vdd=3.3 V) |
| Bandwidth (X, Y) | — | 400 Hz |
| Bandwidth (Z) | — | 300 Hz |
| Supply Voltage (Vdd) | — | 2.2 V to 3.5 V |
| Supply Voltage (VddIO) | — | 1.71 V to 3.5 V |
| 공급 전류 | — | 400 µA typical |
| 노이즈 밀도 | — | 1.5 mg/√Hz typical |
| Zero-g Offset (factory trim) | — | Pre-trimmed, no external components required |
| Shock Survival | — | 10,000 g (per NXP test methodology) |