ADC1412D065HN-C1 - Dual 14-bit 65 Msps ADC, 64-HVQFN | Renesas
部品番号: ADC1412D065HN-C1 ✓ 生産中| 数量 | 単価 | 小計 |
|---|---|---|
| 1 | $38.5 | $38.50 |
| 10 | $34.2 | $342.00 |
| 100 | $28.95 | $2,895.00 |
| 500 | $24.1 | $12,050.00 |
| 1,000 | $21.45 | $21,450.00 |
ADC1412D065HN-C1 概要
What is a dual-channel pipelined ADC? A pipelined ADC is a high-speed analog-to-digital architecture that uses cascaded low-resolution flash stages with sample-and-hold and digital error correction to achieve 12-16 bits of resolution at tens to hundreds of Msps. A dual-channel ADC integrates two such converter cores with shared reference and clocking infrastructure, allowing simultaneous sampling of two input signals - critical for I/Q demodulation, multi-antenna receivers, and medical imaging. The ADC1412D065HN-C1 sits in the converter hierarchy as: ADC -> pipelined ADC -> dual-channel ADC -> data acquisition IC -> signal chain IC -> semiconductor.
Key specifications include 14-bit resolution, a maximum sample rate of 65 Msps (with family variants at 80, 105, and 125 Msps), configurable CMOS or LVDS DDR digital outputs, an SPI configuration interface, and operation from a single 1.8V supply. The device accepts differential analog inputs and provides a serial SPI port for register access. The architecture targets communications infrastructure such as LTE base stations, multi-standard software-defined radios, and industrial ultrasound beamformers where two coherent channels must be captured at once.
Design considerations include the need for a low-jitter differential clock source, a clean analog supply plane decoupled close to the AVDD pin, and a stable external reference. The LVDS DDR output mode (Double Data Rate, i.e., one sample per clock edge) reduces the number of required output lanes for glueless connection to an FPGA. Unlike consumer-tier single-channel ADCs such as the ADC12048, the dual-channel integration reduces board area and channel-matching error in I/Q paths. Ensure thermal pad soldering follows JEDEC J-STD-020 reflow profiles and that the exposed pad is soldered to the PCB ground plane for rated thermal performance.
ドロップイン代替品: ADC1412D065HN-C1 — 同一パッケージでピン互換。PCBの作り直しが必要な異なるパッケージの部品は除外されています。
このシリーズのバリエーション
同一シリーズでドロップイン互換のモデル: ADC1412D065HN-C1 （同一形状・フットプリント） — 相違点: Package, Number of Channels, Operating Temperature, Input Type, Configuration Interface.
クイック比較ツール — 並列比較する代替部品を選択:
ADC1412D080HN-C1
✅ ドロップイン ⚠️ 仕様未検証✓ 在庫あり
$31.9 / 個
データシートを見る →ADC1412D125HN-C1
✅ ドロップイン ⚠️ 仕様未検証📋 参考代替品（カタログ未掲載）
ADC1412D105HN-C1
✅ ドロップイン ⚠️ 仕様未検証✓ 在庫あり
$16.2 / 個
データシートを見る →ADC1412D065HN/C1:5
✅ ドロップイン📋 参考代替品（カタログ未掲載）
ADC1412D065HN-C18
✅ ドロップイン ⚠️ 仕様未検証✓ 在庫あり
$23.1 / 個
データシートを見る →ADC1412D065HN-C1 最大定格＆電気的特性
| Number of Bits | 14 |
| Number of Inputs | 2 (dual channel) |
| サンプリングレート | 65 Msps |
| Architecture | Pipelined |
| Input Type | Differential |
| Data Interface | CMOS or LVDS DDR (SPI configuration) |
| Configuration | Serial, SPI |
| パッケージ | 64-VFQFPN (HVQFN-40, 9x9 mm) exposed pad |
| Package Code | MO-220 / SOT618-6 |
| 動作温度 | -40 C to +85 C |
| 電源電圧 | 1.8 V (typical - per family datasheet) |
| 実装タイプ | Surface Mount |
| ピン数 | 64 |
| Screening Level | Industrial |
| RoHS ステータス | Compliant |
ADC1412D065HN-C1 ピン構成
| ピン 1 | AVDD — Analog supply 1.8V |
| ピン 2 | AGND — Analog ground |
| ピン 3 | AIN_A+ — Channel A differential positive input |
| ピン 4 | AIN_A- — Channel A differential negative input |
| ピン 5 | AGND — Analog ground |
| ピン 6 | AVDD — Analog supply 1.8V |
| ピン 7 | VCM_A — Channel A common-mode voltage output |
| ピン 8 | AGND — Analog ground |
| ピン 9 | VREF_IN — External reference voltage input |
| ピン 10 | VREF_OUT — Internal reference output (decouple to AGND) |
| ピン 11 | AGND — Analog ground |
| ピン 12 | AVDD — Analog supply 1.8V |
| ピン 13 | AIN_B+ — Channel B differential positive input |
| ピン 14 | AIN_B- — Channel B differential negative input |
| ピン 15 | AGND — Analog ground |
| ピン 16 | AVDD — Analog supply 1.8V |
| ピン 17 | VCM_B — Channel B common-mode voltage output |
| ピン 18 | AGND — Analog ground |
| ピン 19 | CLK+ — Differential clock positive input |
| ピン 20 | CLK- — Differential clock negative input |
| ピン 21 | AGND — Analog ground |
| ピン 22 | DGND — Digital ground |
| ピン 23 | DVDD — Digital supply 1.8V |
| ピン 24 | DRVDD — Output driver supply 1.8V |
| ピン 25 | DGND — Digital ground |
| ピン 26 | DOUT_A0P — Channel A LVDS/CMOS data output pair 0P |
| ピン 27 | DOUT_A0N — Channel A LVDS/CMOS data output pair 0N |
| ピン 28 | DOUT_A1P — Channel A LVDS/CMOS data output pair 1P |
| ピン 29 | DOUT_A1N — Channel A LVDS/CMOS data output pair 1N |
| ピン 30 | DGND — Digital ground |
| ピン 31 | DRVDD — Output driver supply 1.8V |
| ピン 32 | DGND — Digital ground |
| ピン 33 | DOUT_B0P — Channel B LVDS/CMOS data output pair 0P |
| ピン 34 | DOUT_B0N — Channel B LVDS/CMOS data output pair 0N |
| ピン 35 | DOUT_B1P — Channel B LVDS/CMOS data output pair 1P |
| ピン 36 | DOUT_B1N — Channel B LVDS/CMOS data output pair 1N |
| ピン 37 | DGND — Digital ground |
| ピン 38 | DRVDD — Output driver supply 1.8V |
| ピン 39 | DCLK_P — DDR data clock positive output |
| ピン 40 | DCLK_N — DDR data clock negative output |
| ピン 41 | DGND — Digital ground |
| ピン 42 | OF_A — Channel A out-of-flag indicator |
| ピン 43 | OF_B — Channel B out-of-flag indicator |
| ピン 44 | DRVDD — Output driver supply 1.8V |
| ピン 45 | DGND — Digital ground |
| ピン 46 | CSN — SPI chip-select (active low) |
| ピン 47 | SCLK — SPI serial clock |
| ピン 48 | SDATA — SPI serial data input |
| ピン 49 | SDOUT — SPI serial data output |
| ピン 50 | RESETN — Hardware reset (active low) |
| ピン 51 | PDN — Power-down mode (active high) |
| ピン 52 | MODE0 — Operating mode select 0 |
| ピン 53 | MODE1 — Operating mode select 1 |
| ピン 54 | MODE2 — Operating mode select 2 |
| ピン 55 | MODE3 — Operating mode select 3 |
| ピン 56 | NC — Not connected (per datasheet) |
| ピン 57 | NC — Not connected (per datasheet) |
| ピン 58 | AGND — Analog ground |
| ピン 59 | AVDD — Analog supply 1.8V |
| ピン 60 | AGND — Analog ground |
| ピン 61 | AVDD — Analog supply 1.8V |
| ピン 62 | AGND — Analog ground |
| ピン 63 | TEST — Factory test pin - leave floating or ground |
| ピン 64 | AGND — Analog ground |
主な用途
ADC1412D065HN-C1 の用途: 6 件s: Software-Defined Radio (SDR) Receivers, LTE / Wireless Base Station Receivers, Multi-Channel Ultrasound Beamforming, Test & Measurement Instrumentation, Industrial Process Control DAQs, Phased-Array Radar / Beamsteering.
Software-Defined Radio (SDR) Receivers
The ADC1412D065HN-C1's dual 14-bit channels sampling at 65 Msps are tailored for I/Q demodulation in SDR front-ends. Placed after the mixer/LPF, the two ADC cores simultaneously digitize I and Q paths with shared clocking, which guarantees channel-to-channel gain and phase matching better than what two discrete ADCs achieve. The LVDS DDR output mode reduces pin-count to the FPGA and simplifies PCB routing, while 1.8V operation matches modern Zynq and Stratix FPGA I/O banks. Compared to single-channel 65 Msps ADCs, the dual integration halves board area for handheld and benchtop SDR products. Power dissipation at 65 Msps is much lower than the 125 Msps speed-grade sibling when the system does not need the extra bandwidth.
おすすめ
LTE / Wireless Base Station Receivers
In small-cell and pre-5G base-station receivers, the ADC1412D065HN-C1 captures two diversity antenna streams at 65 Msps, comfortably covering 20 MHz LTE-A and many sub-6 GHz 5G NR channel allocations. Sharing one device across two antenna paths keeps channel tracking tight across temperature and lifecycle, which is critical for MIMO decoding. The 14-bit dynamic range supports the 78 dB PAR typically required by LTE uplink signal chains. For wider 100 MHz+ 5G channels the faster ADC1412D125HN-C1 sibling would be preferred. The HVQFN-9x9 exposed pad provides the thermal headroom required for continuous 24/7 base-station operation.
おすすめ
Multi-Channel Ultrasound Beamforming
Industrial and medical ultrasound beamformers require many simultaneous analog channels at moderate sample rates; the ADC1412D065HN-C1 supplies two 14-bit channels at 65 Msps, which aligns with typical 30-40 MHz near-baseband ultrasound IFs. Cascading multiple devices behind a low-noise TIA front-end captures 32-, 64-, or 128-element transducer arrays with deterministic channel-to-channel delay. Pipelined architecture provides the low latency needed for real-time delay-and-sum beamforming. Operating temperature of -40 C to +85 C supports both portable clinical carts and wall-mounted industrial flaw detectors. A stable external voltage reference is recommended to preserve image SNR across the beamformer.
おすすめ
Test & Measurement Instrumentation
Automated test equipment, oscilloscopes, and arbitrary waveform digitizers require two tightly matched channels for cross-domain analysis. The ADC1412D065HN-C1's dual cores allow simultaneous sampling of two test points at 65 Msps with shared clocking, eliminating skew between the channels. The LVDS DDR output interfaces directly to FPGA-based DSP blocks for FFT, timebase interpolation, and protocol decoding. A single 1.8V supply and small 64-HVQFN footprint support dense channel-count cards (16+ channels) used in modular PXI/LXI instruments. Industrial operating temperature ensures reliable operation in factory-floor ATE racks with elevated ambient.
おすすめ
Industrial Process Control DAQs
In multi-axis motor control, vibration monitoring, and precision data-acquisition systems, the ADC1412D065HN-C1 captures two current or vibration sensors at 65 Msps per channel. The 14-bit resolution is sufficient for closed-loop motor current sensing and predictive-maintenance vibration band analysis. The HVQFN exposed pad provides thermal dissipation suitable for integration into DIN-rail mounted industrial controllers with ambient temperatures up to 70 C. The SPI configuration interface allows the host MCU or FPGA to apply per-channel gain and offset correction during factory calibration. Using dual channel ADCs reduces component count versus discrete single-channel alternatives.
おすすめ
Phased-Array Radar / Beamsteering
Phased-array radar receivers require each antenna element to be sampled synchronously and digitized on its own ADC channel. The ADC1412D065HN-C1 packs two channels of 14-bit 65 Msps into a single 64-HVQFN footprint, easing the dense antenna lattice routing of a 64-element array which would otherwise need 64 separate single-channel ADCs. Synchronized sample clocks across the array preserve beam-steering phase accuracy, and the LVDS DDR interface lets the FPGA compute beamformed output in real time. For wide-bandwidth radar the ADC1412D125HN-C1 is suggested; for CW or FMCW radar at moderate IF the 65 Msps ADC1412D065HN-C1 is sufficient.
おすすめ
おすすめ製品の概要
エンジニアリング参考データ: ADC1412D065HN-C1 — 比較、設計ガイダンス、コンプライアンス情報。
選定ガイド
代替品との比較
| パラメータ | この製品 | ADC1412D080HN-C1 | ADC1412D105HN-C1 | ADC1412D125HN-C1 | ADC1412D065HN/C1:5 | ADC1412D065HN-C18 |
|---|---|---|---|---|---|---|
| Package | 64-HVQFN (9x9 mm) exposed pad | 64-HVQFN (9x9 mm) - same | 64-HVQFN (9x9 mm) - same | 64-HVQFN (9x9 mm) - same | 64-HVQFN (9x9 mm) - same | 64-HVQFN (9x9 mm) - same |
| Brand | Renesas Electronics | Renesas Electronics | Renesas Electronics | Renesas Electronics | Renesas Electronics | Renesas Electronics |
| Resolution | 14-bit | 14-bit | 14-bit | 14-bit | 14-bit | 14-bit |
| Number of Channels | 2 (dual) | 2 (dual) | 2 (dual) | 2 (dual) | 2 (dual) | 2 (dual) |
| Maximum Sample Rate | 65 Msps | 80 Msps | 105 Msps | 125 Msps | 65 Msps | 65 Msps |
| Architecture | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined |
| Output Format | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR |
| Configuration Interface | SPI | SPI | SPI | SPI | SPI | SPI |
| Operating Temperature | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C |
| RoHS Status | Compliant | Compliant | Compliant | Compliant | Compliant | Compliant |
主な差別化要因
- Dual 14-bit channels integrated in a single 9x9 mm HVQFN （vs AD9268XCPZ-125)
- Speed-grade portfolio (65/80/105/125 Msps) share a single footprint （vs ADC1412D125HN-C1)
- 1.8V single-supply operation （vs Older 3.3V ADCs in the same family)
- Industrial-grade temperature rating and Renesas catalog longevity （vs ADC12J4000NKE10)
設計ノート
Estimate: separate AVDD, DVDD, and DRVDD rails, each fed by an LDO upstream. Place 10uF + 0.1uF ceramic capacitors within 5 mm of each supply pin and stitch the analog and digital grounds with a single point tie under the exposed thermal pad. A noisy switcher on DRVDD will degrade LVDS eye quality; use a ferrite bead if a common rail is unavoidable.
Source the clock with a low-jitter differential buffer (typically <300 fs RMS); SNR degrades roughly proportional to clock jitter, so for a 65 Msps IF stage budget jitter carefully. Maintain 100 ohm differential trace impedance on the LVDS output pairs and route DCLK as a length-matched 100 ohm pair within +/- 5 ps of the DOUT edges.
Solder the exposed thermal pad (EP) to a grounded copper area of at least 1 square inch on the top layer with stitched thermal vias to the inner ground plane. The HVQFN-64 rises roughly 30-35 C/W theta-JA for a JEDEC four-layer board - derate continuous DRVDD switching load so junction stays below 125 C.
Keep the analog input traces short and routed as 100 ohm differential pairs guarded by ground. Avoid routing digital LVDS traces underneath the analog input section. Place the external reference decoupling on VREF_OUT as close to the pin as possible (typically 22 nF + 100 nF) for stable conversion gain across temperature.
Do not leave the MODE pins floating - configure explicitly to the desired CMOS vs LVDS and DDR vs SDR mode at boot. Apply the SPI reset sequence via RESETN before configuring the sample clock or risk lockup. Always supply a stable differential clock before releasing PDN; otherwise the digital logic may enter an undefined state that requires a full power cycle.
コンプライアンス情報
Industrial-grade screening -40 to +85 C. Not AEC-Q100 qualified; for automotive AEC-Q100 ADC signal chains see Renesas Automotive-grade catalog.
