ADC1412D065HN-C1 - Dual 14-bit 65 Msps ADC, 64-HVQFN | Renesas
MPN: ADC1412D065HN-C1 ✓ Active| Qty | Unit Price | Extended |
|---|---|---|
| 1 | $38.5 | $38.50 |
| 10 | $34.2 | $342.00 |
| 100 | $28.95 | $2,895.00 |
| 500 | $24.1 | $12,050.00 |
| 1,000 | $21.45 | $21,450.00 |
ADC1412D065HN-C1 Overview
What is a dual-channel pipelined ADC? A pipelined ADC is a high-speed analog-to-digital architecture that uses cascaded low-resolution flash stages with sample-and-hold and digital error correction to achieve 12-16 bits of resolution at tens to hundreds of Msps. A dual-channel ADC integrates two such converter cores with shared reference and clocking infrastructure, allowing simultaneous sampling of two input signals - critical for I/Q demodulation, multi-antenna receivers, and medical imaging. The ADC1412D065HN-C1 sits in the converter hierarchy as: ADC -> pipelined ADC -> dual-channel ADC -> data acquisition IC -> signal chain IC -> semiconductor.
Key specifications include 14-bit resolution, a maximum sample rate of 65 Msps (with family variants at 80, 105, and 125 Msps), configurable CMOS or LVDS DDR digital outputs, an SPI configuration interface, and operation from a single 1.8V supply. The device accepts differential analog inputs and provides a serial SPI port for register access. The architecture targets communications infrastructure such as LTE base stations, multi-standard software-defined radios, and industrial ultrasound beamformers where two coherent channels must be captured at once.
Design considerations include the need for a low-jitter differential clock source, a clean analog supply plane decoupled close to the AVDD pin, and a stable external reference. The LVDS DDR output mode (Double Data Rate, i.e., one sample per clock edge) reduces the number of required output lanes for glueless connection to an FPGA. Unlike consumer-tier single-channel ADCs such as the ADC12048, the dual-channel integration reduces board area and channel-matching error in I/Q paths. Ensure thermal pad soldering follows JEDEC J-STD-020 reflow profiles and that the exposed pad is soldered to the PCB ground plane for rated thermal performance.
Drop-in alternatives for ADC1412D065HN-C1 — same package, pin-to-pin compatible. Different-package parts requiring PCB rework are excluded.
Variants in this series
Same-series models that are drop-in compatible with ADC1412D065HN-C1 (same form factor and footprint) — differing in Package, Number of Channels, Operating Temperature, Input Type, Configuration Interface.
Quick Comparison Tool — Select alternative parts for side-by-side comparison:
ADC1412D080HN-C1
✅ Drop-In ⚠️ Specs Unverified✓ In Stock
$31.9 / Unit
View Datasheet →ADC1412D125HN-C1
✅ Drop-In ⚠️ Specs Unverified📋 Reference alternative (not in catalog)
ADC1412D105HN-C1
✅ Drop-In ⚠️ Specs Unverified✓ In Stock
$16.2 / Unit
View Datasheet →ADC1412D065HN/C1:5
✅ Drop-In📋 Reference alternative (not in catalog)
ADC1412D065HN-C18
✅ Drop-In ⚠️ Specs Unverified✓ In Stock
$23.1 / Unit
View Datasheet →ADC1412D065HN-C1 Maximum Ratings & Electrical Characteristics
| Number of Bits | 14 |
| Number of Inputs | 2 (dual channel) |
| Sampling Rate | 65 Msps |
| Architecture | Pipelined |
| Input Type | Differential |
| Data Interface | CMOS or LVDS DDR (SPI configuration) |
| Configuration | Serial, SPI |
| Package | 64-VFQFPN (HVQFN-40, 9x9 mm) exposed pad |
| Package Code | MO-220 / SOT618-6 |
| Operating Temperature | -40 C to +85 C |
| Supply Voltage | 1.8 V (typical - per family datasheet) |
| Mounting Type | Surface Mount |
| Number of Pins | 64 |
| Screening Level | Industrial |
| RoHS Status | Compliant |
ADC1412D065HN-C1 Pin Configuration
| Pin 1 | AVDD — Analog supply 1.8V |
| Pin 2 | AGND — Analog ground |
| Pin 3 | AIN_A+ — Channel A differential positive input |
| Pin 4 | AIN_A- — Channel A differential negative input |
| Pin 5 | AGND — Analog ground |
| Pin 6 | AVDD — Analog supply 1.8V |
| Pin 7 | VCM_A — Channel A common-mode voltage output |
| Pin 8 | AGND — Analog ground |
| Pin 9 | VREF_IN — External reference voltage input |
| Pin 10 | VREF_OUT — Internal reference output (decouple to AGND) |
| Pin 11 | AGND — Analog ground |
| Pin 12 | AVDD — Analog supply 1.8V |
| Pin 13 | AIN_B+ — Channel B differential positive input |
| Pin 14 | AIN_B- — Channel B differential negative input |
| Pin 15 | AGND — Analog ground |
| Pin 16 | AVDD — Analog supply 1.8V |
| Pin 17 | VCM_B — Channel B common-mode voltage output |
| Pin 18 | AGND — Analog ground |
| Pin 19 | CLK+ — Differential clock positive input |
| Pin 20 | CLK- — Differential clock negative input |
| Pin 21 | AGND — Analog ground |
| Pin 22 | DGND — Digital ground |
| Pin 23 | DVDD — Digital supply 1.8V |
| Pin 24 | DRVDD — Output driver supply 1.8V |
| Pin 25 | DGND — Digital ground |
| Pin 26 | DOUT_A0P — Channel A LVDS/CMOS data output pair 0P |
| Pin 27 | DOUT_A0N — Channel A LVDS/CMOS data output pair 0N |
| Pin 28 | DOUT_A1P — Channel A LVDS/CMOS data output pair 1P |
| Pin 29 | DOUT_A1N — Channel A LVDS/CMOS data output pair 1N |
| Pin 30 | DGND — Digital ground |
| Pin 31 | DRVDD — Output driver supply 1.8V |
| Pin 32 | DGND — Digital ground |
| Pin 33 | DOUT_B0P — Channel B LVDS/CMOS data output pair 0P |
| Pin 34 | DOUT_B0N — Channel B LVDS/CMOS data output pair 0N |
| Pin 35 | DOUT_B1P — Channel B LVDS/CMOS data output pair 1P |
| Pin 36 | DOUT_B1N — Channel B LVDS/CMOS data output pair 1N |
| Pin 37 | DGND — Digital ground |
| Pin 38 | DRVDD — Output driver supply 1.8V |
| Pin 39 | DCLK_P — DDR data clock positive output |
| Pin 40 | DCLK_N — DDR data clock negative output |
| Pin 41 | DGND — Digital ground |
| Pin 42 | OF_A — Channel A out-of-flag indicator |
| Pin 43 | OF_B — Channel B out-of-flag indicator |
| Pin 44 | DRVDD — Output driver supply 1.8V |
| Pin 45 | DGND — Digital ground |
| Pin 46 | CSN — SPI chip-select (active low) |
| Pin 47 | SCLK — SPI serial clock |
| Pin 48 | SDATA — SPI serial data input |
| Pin 49 | SDOUT — SPI serial data output |
| Pin 50 | RESETN — Hardware reset (active low) |
| Pin 51 | PDN — Power-down mode (active high) |
| Pin 52 | MODE0 — Operating mode select 0 |
| Pin 53 | MODE1 — Operating mode select 1 |
| Pin 54 | MODE2 — Operating mode select 2 |
| Pin 55 | MODE3 — Operating mode select 3 |
| Pin 56 | NC — Not connected (per datasheet) |
| Pin 57 | NC — Not connected (per datasheet) |
| Pin 58 | AGND — Analog ground |
| Pin 59 | AVDD — Analog supply 1.8V |
| Pin 60 | AGND — Analog ground |
| Pin 61 | AVDD — Analog supply 1.8V |
| Pin 62 | AGND — Analog ground |
| Pin 63 | TEST — Factory test pin - leave floating or ground |
| Pin 64 | AGND — Analog ground |
Typical Applications
ADC1412D065HN-C1 is suitable for 6 applications: Software-Defined Radio (SDR) Receivers, LTE / Wireless Base Station Receivers, Multi-Channel Ultrasound Beamforming, Test & Measurement Instrumentation, Industrial Process Control DAQs, Phased-Array Radar / Beamsteering.
Software-Defined Radio (SDR) Receivers
The ADC1412D065HN-C1's dual 14-bit channels sampling at 65 Msps are tailored for I/Q demodulation in SDR front-ends. Placed after the mixer/LPF, the two ADC cores simultaneously digitize I and Q paths with shared clocking, which guarantees channel-to-channel gain and phase matching better than what two discrete ADCs achieve. The LVDS DDR output mode reduces pin-count to the FPGA and simplifies PCB routing, while 1.8V operation matches modern Zynq and Stratix FPGA I/O banks. Compared to single-channel 65 Msps ADCs, the dual integration halves board area for handheld and benchtop SDR products. Power dissipation at 65 Msps is much lower than the 125 Msps speed-grade sibling when the system does not need the extra bandwidth.
Recommended
LTE / Wireless Base Station Receivers
In small-cell and pre-5G base-station receivers, the ADC1412D065HN-C1 captures two diversity antenna streams at 65 Msps, comfortably covering 20 MHz LTE-A and many sub-6 GHz 5G NR channel allocations. Sharing one device across two antenna paths keeps channel tracking tight across temperature and lifecycle, which is critical for MIMO decoding. The 14-bit dynamic range supports the 78 dB PAR typically required by LTE uplink signal chains. For wider 100 MHz+ 5G channels the faster ADC1412D125HN-C1 sibling would be preferred. The HVQFN-9x9 exposed pad provides the thermal headroom required for continuous 24/7 base-station operation.
Recommended
Multi-Channel Ultrasound Beamforming
Industrial and medical ultrasound beamformers require many simultaneous analog channels at moderate sample rates; the ADC1412D065HN-C1 supplies two 14-bit channels at 65 Msps, which aligns with typical 30-40 MHz near-baseband ultrasound IFs. Cascading multiple devices behind a low-noise TIA front-end captures 32-, 64-, or 128-element transducer arrays with deterministic channel-to-channel delay. Pipelined architecture provides the low latency needed for real-time delay-and-sum beamforming. Operating temperature of -40 C to +85 C supports both portable clinical carts and wall-mounted industrial flaw detectors. A stable external voltage reference is recommended to preserve image SNR across the beamformer.
Recommended
Test & Measurement Instrumentation
Automated test equipment, oscilloscopes, and arbitrary waveform digitizers require two tightly matched channels for cross-domain analysis. The ADC1412D065HN-C1's dual cores allow simultaneous sampling of two test points at 65 Msps with shared clocking, eliminating skew between the channels. The LVDS DDR output interfaces directly to FPGA-based DSP blocks for FFT, timebase interpolation, and protocol decoding. A single 1.8V supply and small 64-HVQFN footprint support dense channel-count cards (16+ channels) used in modular PXI/LXI instruments. Industrial operating temperature ensures reliable operation in factory-floor ATE racks with elevated ambient.
Recommended
Industrial Process Control DAQs
In multi-axis motor control, vibration monitoring, and precision data-acquisition systems, the ADC1412D065HN-C1 captures two current or vibration sensors at 65 Msps per channel. The 14-bit resolution is sufficient for closed-loop motor current sensing and predictive-maintenance vibration band analysis. The HVQFN exposed pad provides thermal dissipation suitable for integration into DIN-rail mounted industrial controllers with ambient temperatures up to 70 C. The SPI configuration interface allows the host MCU or FPGA to apply per-channel gain and offset correction during factory calibration. Using dual channel ADCs reduces component count versus discrete single-channel alternatives.
Recommended
Phased-Array Radar / Beamsteering
Phased-array radar receivers require each antenna element to be sampled synchronously and digitized on its own ADC channel. The ADC1412D065HN-C1 packs two channels of 14-bit 65 Msps into a single 64-HVQFN footprint, easing the dense antenna lattice routing of a 64-element array which would otherwise need 64 separate single-channel ADCs. Synchronized sample clocks across the array preserve beam-steering phase accuracy, and the LVDS DDR interface lets the FPGA compute beamformed output in real time. For wide-bandwidth radar the ADC1412D125HN-C1 is suggested; for CW or FMCW radar at moderate IF the 65 Msps ADC1412D065HN-C1 is sufficient.
Recommended
Recommended Products Summary
Engineering reference data for ADC1412D065HN-C1 — comparison, design guidance, and compliance information.
Selection Guide
Comparison with Alternatives
| Parameter | This Product | ADC1412D080HN-C1 | ADC1412D105HN-C1 | ADC1412D125HN-C1 | ADC1412D065HN/C1:5 | ADC1412D065HN-C18 |
|---|---|---|---|---|---|---|
| Package | 64-HVQFN (9x9 mm) exposed pad | 64-HVQFN (9x9 mm) - same | 64-HVQFN (9x9 mm) - same | 64-HVQFN (9x9 mm) - same | 64-HVQFN (9x9 mm) - same | 64-HVQFN (9x9 mm) - same |
| Brand | Renesas Electronics | Renesas Electronics | Renesas Electronics | Renesas Electronics | Renesas Electronics | Renesas Electronics |
| Resolution | 14-bit | 14-bit | 14-bit | 14-bit | 14-bit | 14-bit |
| Number of Channels | 2 (dual) | 2 (dual) | 2 (dual) | 2 (dual) | 2 (dual) | 2 (dual) |
| Maximum Sample Rate | 65 Msps | 80 Msps | 105 Msps | 125 Msps | 65 Msps | 65 Msps |
| Architecture | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined |
| Output Format | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR |
| Configuration Interface | SPI | SPI | SPI | SPI | SPI | SPI |
| Operating Temperature | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C |
| RoHS Status | Compliant | Compliant | Compliant | Compliant | Compliant | Compliant |
Key Differentiators
- Dual 14-bit channels integrated in a single 9x9 mm HVQFN (vs AD9268XCPZ-125)
- Speed-grade portfolio (65/80/105/125 Msps) share a single footprint (vs ADC1412D125HN-C1)
- 1.8V single-supply operation (vs Older 3.3V ADCs in the same family)
- Industrial-grade temperature rating and Renesas catalog longevity (vs ADC12J4000NKE10)
Design Notes
Estimate: separate AVDD, DVDD, and DRVDD rails, each fed by an LDO upstream. Place 10uF + 0.1uF ceramic capacitors within 5 mm of each supply pin and stitch the analog and digital grounds with a single point tie under the exposed thermal pad. A noisy switcher on DRVDD will degrade LVDS eye quality; use a ferrite bead if a common rail is unavoidable.
Source the clock with a low-jitter differential buffer (typically <300 fs RMS); SNR degrades roughly proportional to clock jitter, so for a 65 Msps IF stage budget jitter carefully. Maintain 100 ohm differential trace impedance on the LVDS output pairs and route DCLK as a length-matched 100 ohm pair within +/- 5 ps of the DOUT edges.
Solder the exposed thermal pad (EP) to a grounded copper area of at least 1 square inch on the top layer with stitched thermal vias to the inner ground plane. The HVQFN-64 rises roughly 30-35 C/W theta-JA for a JEDEC four-layer board - derate continuous DRVDD switching load so junction stays below 125 C.
Keep the analog input traces short and routed as 100 ohm differential pairs guarded by ground. Avoid routing digital LVDS traces underneath the analog input section. Place the external reference decoupling on VREF_OUT as close to the pin as possible (typically 22 nF + 100 nF) for stable conversion gain across temperature.
Do not leave the MODE pins floating - configure explicitly to the desired CMOS vs LVDS and DDR vs SDR mode at boot. Apply the SPI reset sequence via RESETN before configuring the sample clock or risk lockup. Always supply a stable differential clock before releasing PDN; otherwise the digital logic may enter an undefined state that requires a full power cycle.
Compliance Information
Industrial-grade screening -40 to +85 C. Not AEC-Q100 qualified; for automotive AEC-Q100 ADC signal chains see Renesas Automotive-grade catalog.
