EPM3128ATC100-10N vs EPM3128ATC144-10 Comparação
Comparação detalhada lado a lado de EPM3128ATC100-10N por Altera e EPM3128ATC144-10 por Altera. Compare especificações principais, parâmetros elétricos, encapsulamento, status do ciclo de vida, preços e disponibilidade para determinar o melhor componente para os requisitos do seu projeto.
Altera
EPM3128ATC100-10N - 128-Macrocell MAX 3000A CPLD, 10ns, TQFP-100 | Intel
EPM3128ATC100-10N Nrnd
Comparação de especificações
| Parâmetro | EPM3128ATC100-10N | EPM3128ATC144-10 |
|---|---|---|
| Marca | Altera | Altera |
| Categoria | FPGA & CPLD | FPGA & CPLD |
| Status do ciclo de vida | NRND | Ativo |
| Status do estoque | In Stock | In Stock |
| Preço unitário (USD) | $5,20 | $6,20 |
| Family | MAX 3000A | MAX 3000A |
| Product Type | CPLD (Complex Programmable Logic Device) | — |
| Macro Cells | 128 | 128 |
| Usable Gates | 2500 | 2,500 (typical) |
| Number of I/O | 80 | — |
| Logic Elements / Blocks | 8 LABs (16 macrocells each) | — |
| Propagation Delay (tPD) | 10 ns | 10 ns (speed grade -10) |
| Maximum Internal Frequency (fMAX) | 98 MHz | — |
| Supply Voltage VCCINT | 3.3 V | — |
| I/O Bank Voltage VCCIO | 3.3 V or 2.5 V (selectable) | — |
| Configuration Memory | CMOS EEPROM (non-volatile, instant-on) | EEPROM (non-volatile, instant-on) |
| In-System Programming | IEEE Std. 1532-compliant ISP via JTAG | — |
| Encapsulamento | 100-pin TQFP (14 x 14 x 1.0 mm) | 144-pin TQFP (TQ144) |
| Temperatura de operação | 0 °C to +70 °C (commercial) | 0C to +70C (commercial) |
| Tipo de montagem | Surface Mount | Surface Mount |
| Status RoHS | Compliant | Compliant |
| Lead-Free | Yes | Yes |
| Nível MSL | 3 (per JEDEC J-STD-020) | — |
| Device Type | — | CPLD (Complex Programmable Logic Device) |
| User I/Os | — | 96 |
| Logic Elements / LABs | — | 4 Logic Array Blocks |
| Counter Frequency (fCNT) | — | Up to 227.3 MHz |
| Supply Voltage (VCCINT) | — | 3.3 V |
| MultiVolt I/O Interface | — | 1.5V / 1.8V / 2.5V / 3.3V |
| In-System Programmability | — | IEEE Std. 1532 compliant |
| Boundary-Scan Test | — | IEEE Std. 1149.1 (JTAG) |