EP1K100FC484-3N vs EP1K100FI484-2N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K100FC484-3N sa pamamagitan ng Intel at EP1K100FI484-2N sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K100FC484-3N | EP1K100FI484-2N |
|---|---|---|
| Brand | Intel | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Huling Pagbili | Obsolete |
| Presyo ng Yunit (USD) | $65.10 | — |
| Family | ACEX 1K | — |
| Logic Elements | 4,992 | — |
| Typical Gate Count | 100,000 gates | — |
| Logic Array Blocks (LABs) | 624 | — |
| Embedded Array Blocks (EABs) | 12 | — |
| Total RAM Bits | 49,152 | 49,152 |
| User I/Os | 333 | — |
| Operating Voltage (VCCINT) | 2.5 V | — |
| Process Technology | 0.22 µm CMOS | — |
| Internal Operating Frequency | up to 200 MHz | — |
| Speed Grade | -3 | -2 |
| Packhaging | 484-ball FBGA | — |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Configuration Method | Passive Serial, JTAG, PPA | SRAM - Serial / JTAG |
| I/O Standards Supported | LVTTL, LVCMOS, PCI, 2.5V/3.3V/5V multiVolt I/O | — |
| Operating Temperature (Commercial) | 0 °C to +70 °C | — |
| Boundary-Scan Test | IEEE 1149.1 (JTAG) | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS status] | non_compliant (contains lead, BGA) |
| Series | — | ACEX-1K |
| Manufacturer | — | Intel (formerly Altera) |
| Logic Elements / Cells | — | 4,992 |
| Number of Gates | — | 257,000 (typical 100,000) |
| Number of Logic Array Blocks (LABs) | — | 624 |
| Number of I/O | — | 333 |
| Number of Embedded Array Blocks (EABs) | — | 12 |
| Supply Voltage - Core (VCCINT) | — | 2.375 V to 2.625 V (2.5 V nominal) |
| Temperature na Operasyon | — | -40C to +85C (Industrial) |
| Packhaging / Kaso | — | 484-FBGA (FineLine BGA, 23 mm x 23 mm) |
| Supplier Device Package | — | 484-FBGA |