EP1K30QC208-1N vs EP1K30QC208-1 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K30QC208-1N sa pamamagitan ng Altera at EP1K30QC208-1 sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K30QC208-1N | EP1K30QC208-1 |
|---|---|---|
| Brand | Altera | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Device Family | ACEX 1K | ACEX-1K |
| Product Type | FPGA (Field Programmable Gate Array) | — |
| Number of Typical Gates | 30000 | — |
| Number of Logic Elements / Cells | 1728 | — |
| Number of LABs / CLBs | 216 | — |
| Total RAM Bits | 24576 | — |
| Number of User I/O | 147 | — |
| Volte ng Pagbibigay | 2.5 V | — |
| Process Technology | 0.22 um | 2.5 V CMOS |
| Maximum Internal Frequency | 250 MHz | — |
| Package Type | 208-BFQFP (208-pin PQFP) | — |
| Package Code | FQFP, square | — |
| Terminal Form | Gull wing | — |
| Number of Terminals | 208 | — |
| Temperature Grade | Commercial | — |
| Lead-Free Finish (N-Suffix) | Yes | — |
| Uri ng Pagpapasok | Surface Mount | Surface Mount (gull-wing leads) |
| Tindminan RoHS | [DATA_NEEDED: RoHS compliance status] | Compliant (lead-free) |
| REACH Status | [DATA_NEEDED: REACH compliance status] | — |
| Hanay ng Temperature na Operasyon | [DATA_NEEDED: exact operating temperature range] | — |
| Moisture Sensitivity Level | [DATA_NEEDED: MSL] | — |
| Logic Elements (LEs) | — | 1,728 |
| Equivalent Gates | — | 30,000 |
| Logic Array Blocks (LABs) | — | 216 |
| Embedded Memory (EAB) | — | 24,576 bits |
| Maximum User I/O | — | 147 |
| Core Supply Voltage (VCCINT) | — | 2.5 V (2.375 V to 2.625 V) |
| Packhaging | — | 208-BFQFP (Plastic Quad Flat Pack, PQFP208) |
| Terminal Pitch | — | 0.500 mm |
| Temperature na Operasyon | — | 0 °C to +70 °C (commercial) |
| Maximum Operating Frequency | — | up to 250 MHz (family typical) |
| Configuration Method | — | SRAM, in-system reconfigurable (volatile) |
| Boundary-Scan Test | — | JTAG IEEE 1149.1 |
| I/O Voltage Support | — | 2.5 V / 3.3 V (multi-volt I/O) |
| Configuration Device Support | — | EPC2, EPC4, EPC8 Enhanced Configuration Devices |