EP610ILI-12 vs EP610IDC-10 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP610ILI-12 sa pamamagitan ng Altera at EP610IDC-10 sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP610ILI-12 | EP610IDC-10 |
|---|---|---|
| Brand | Altera | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | NRND | Obsolete |
| Family | Classic EPLD (EP610) | — |
| Usable Gates | 300 | — |
| Macro Cells | 16 | — |
| Speed Grade (tpd) | 12 ns | — |
| Supply Voltage (Vcc) | 5 V (4.75 V to 5.25 V) | — |
| Supply Voltage (Vpp) | [DATA_NEEDED: Vpp programming voltage] | — |
| Operating Frequency (max) | 83.3 MHz | — |
| Logic Elements | [DATA_NEEDED: exact LE count] | — |
| User I/O Pins | [DATA_NEEDED: I/O pin count] | — |
| Dedicated Inputs | 4 | 4 |
| Technology | CMOS EPROM | CMOS, UV-erasable (windowed ceramic) |
| Temperature na Operasyon | -40C to +85C (industrial grade) | — |
| Packhaging | 28-pin PLCC (J-Lead) | — |
| Uri ng Pagpapasok | Surface Mount | Through-hole |
| Programmable Security Bit | Yes | — |
| TTL Compatibility | 100 TTL emulation | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status of CDIP-10 variant] |
| Level ng MSL | [DATA_NEEDED: MSL rating] | — |
| Device Family | — | Altera Classic EPLD |
| Logic Capacity | — | 300 usable gates |
| Macrocell Count | — | 16 macrocells |
| Pin-to-Pin Logic Delay (tpd) | — | 10 ns |
| Maximum Counter Frequency (fCNT) | — | 100 MHz |
| Supply Voltage (VCC) | — | 5 V (nominal) |
| I/O Logic Compatibility | — | 100% TTL emulation |
| Package Type | — | 24-pin Ceramic DIP (CDIP) |
| I/O Pins | — | 20 |
| Hanay ng Temperature na Operasyon | — | 0 °C to +70 °C (commercial) |
| Programmable Interconnect | — | Yes (on-chip) |
| In-System Programmability | — | Yes (via MAX+PLUS II) |
| Boundary-Scan Test | — | Yes (per device documentation) |