EPF8282ATC100-3 vs EPF8282ATC100-2 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPF8282ATC100-3 sa pamamagitan ng Intel at EPF8282ATC100-2 sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EPF8282ATC100-3 | EPF8282ATC100-2 |
|---|---|---|
| Brand | Intel | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Aktibo |
| Family | FLEX 8000 | FLEX 8000 |
| Logic Cells (LEs) | 208 | — |
| Usable Gates | 2,500 | 2,500 |
| Typical Gates Equivalent | 12,000 | — |
| Maximum User I/O | 78 | — |
| Number of Logic Array Blocks (LABs) | 26 | — |
| Embedded Array Blocks (EABs) | 6 | — |
| Total RAM Bits | 12 Kbits | — |
| Process Technology | 0.42 micron CMOS SRAM | 0.42 µm CMOS |
| Supply Voltage (Core) | 5 V | — |
| MultiVolt I/O Support | 3.3 V / 5 V | — |
| Maximum Frequency | 125 MHz | — |
| Speed Grade | -3 | -2 |
| Packhaging | 100-pin TQFP (100-TQFP) | 100-pin TQFP |
| Configuration Method | SRAM, EPC1/EPC1064/EPC1213/EPC1441, microprocessor | — |
| Operating Temperature (Commercial) | 0 C to +70 C | — |
| In-Circuit Reconfigurable | Yes (ICR) | — |
| Boundary Scan | JTAG IEEE 1149.1 | — |
| Logic Cells | — | 208 |
| Logic Array Blocks (LABs) | — | 26 |
| User I/Os | — | 78 |
| Flip-Flops | — | 282 |
| Volte ng Pagbibigay | — | 5 V |
| Temperature na Operasyon | — | 0 °C to 70 °C (Commercial) |
| Uri ng Pagpapasok | — | Surface Mount |
| Configuration Memory | — | SRAM (volatile, requires external boot) |
| Development Tool | — | Altera MAX+PLUS II |
| Tindminan RoHS | — | [DATA_NEEDED: RoHS status] |