EPM3064ATC44-10 vs EPM3064ATC44-10NAF Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPM3064ATC44-10 sa pamamagitan ng Altera at EPM3064ATC44-10NAF sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Altera
EPM3064ATC44-10NAF - 64-Macrocell MAX 3000A CPLD, 10ns TQFP-44 | Intel
EPM3064ATC44-10NAF NrndPagsanggunian na paghahambing
| Parametro | EPM3064ATC44-10 | EPM3064ATC44-10NAF |
|---|---|---|
| Brand | Altera | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | NRND |
| Family | MAX 3000A | — |
| Logic Elements / Macrocells | 64 macrocells | — |
| Usable Gates | 1,250 | 1250 |
| Number of Logic Blocks / LABs | 4 LABs | — |
| Propagation Delay (tPD) | 10 ns | — |
| Maximum Internal Frequency | 227.3 MHz (counter speed) | — |
| Programmable I/Os | 34 | — |
| Supply Voltage (VCCINT) | 3.0 V to 3.6 V (3.3 V typical) | 3.0 V to 3.6 V |
| I/O Bank Voltage (VCCIO) | MultiVolt 1.5 V / 1.8 V / 2.5 V / 3.3 V | — |
| Technology | CMOS EEPROM, 5 V tolerant I/O | — |
| In-System Programming | IEEE Std. 1532 (JTAG) | — |
| Boundary-Scan Support | IEEE 1149.1 (JTAG) | — |
| Packhaging | TQFP-44, 10 x 10 mm, 0.8 mm pitch | TQFP-44 (10x10 mm) |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Hanay ng Temperature na Operasyon | 0C to +70C (commercial) | — |
| Tindminan RoHS | Non-compliant (legacy Altera, Pb-bearing) | Compliant |
| Series | — | MAX 3000A |
| Device Type | — | CPLD (Complex Programmable Logic Device) |
| Macro Cells | — | 64 |
| Logic Elements / LABs | — | 4 LABs (16 macrocells per LAB) |
| Number of I/O Pins | — | 34 |
| Propagation Delay (tPD, max) | — | 10 ns |
| I/O Voltage Tolerance | — | Multi-voltage (3.3 V / 2.5 V / 1.8 V capable) |
| Programmable Technology | — | EEPROM (non-volatile) |
| In-System Programmable | — | Yes (IEEE Std. 1532 compliant) |
| Boundary-Scan Test | — | Yes (IEEE Std. 1149.1 JTAG) |
| Pin-Locking | — | Yes |
| Temperature na Operasyon | — | [DATA_NEEDED: industrial/commercial grade] |
| Lead Finish | — | Lead-free (NiPdAu, AF suffix) |
| Configuration Memory Cycles | — | 100 erase/program cycles |